ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
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| Titolo: |
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
|
| Pubblicazione: | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998 |
| Disciplina: | 621.3815/48 |
| Soggetto topico: | Integrated circuits - Congresses - Testing |
| Semiconductors - Congresses - Testing | |
| Electronic apparatus and appliances - Testing - Congresses | |
| Electrical & Computer Engineering | |
| Electrical Engineering | |
| Engineering & Applied Sciences | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910872859203321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |