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Latest Advances in Nanoplasmonics and Use of New Tools for Plasmonic Characterization
Latest Advances in Nanoplasmonics and Use of New Tools for Plasmonic Characterization
Autore Barbillon Grégory
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (210 p.)
Soggetto topico History of engineering and technology
Materials science
Technology: general issues
Soggetto non controllato agriculture
application
atomic force microscopy
back reflector
bandstop filter
catalysis
CLIO free electron laser
CMT
copper
copper ion
copper oxide
core-shell nanoparticles
dispersion sensor
electrochemistry
fabrication
FDTD
food safety
gold
high pressure
III-V semiconductor
inverse problem
localized surface plasmon resonance
n/a
nanocrystalline cellulose
nanoparticles
nanowires
near-field enhancement
nonlinear optics
optical characterization
optical properties
optical properties of ultra-thin dielectric films
photonic crystal D-shaped fiber
plasmonic
plasmonic material
plasmonics
poly(3,4-ethylenedioxythiophene)
refractive index sensor
second-order dispersion sensor
sensing
SERS
SHINERS
silicon
solar cells
spectroscopic ellipsometry
SPPs
structural properties
sum-frequency generation
Surface Enhanced Raman Scattering (SERS)
surface plasmon resonance
surface plasmon spectroscopy
thiophenol
titanium carbide MXene
two-dimensional material
UV-vis spectroscopy
waveguide
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910566484803321
Barbillon Grégory  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Autore Filipovic Lado
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2019
Descrizione fisica 1 electronic resource (202 p.)
Soggetto topico History of engineering and technology
Soggetto non controllato MOSFET
total ionizing dose (TID)
low power consumption
process simulation
two-dimensional material
negative-capacitance
power consumption
technology computer aided design (TCAD)
thin-film transistors (TFTs)
band-to-band tunneling (BTBT)
nanowires
inversion channel
metal oxide semiconductor field effect transistor (MOSFET)
spike-timing-dependent plasticity (STDP)
field effect transistor
segregation
systematic variations
Sentaurus TCAD
indium selenide
nanosheets
technology computer-aided design (TCAD)
high-? dielectric
subthreshold bias range
statistical variations
fin field effect transistor (FinFET)
compact models
non-equilibrium Green's function
etching simulation
highly miniaturized transistor structure
compact model
silicon nanowire
surface potential
Silicon-Germanium source/drain (SiGe S/D)
nanowire
plasma-aided molecular beam epitaxy (MBE)
phonon scattering
mobility
silicon-on-insulator
drain engineered
device simulation
variability
semi-floating gate
synaptic transistor
neuromorphic system
theoretical model
CMOS
ferroelectrics
tunnel field-effect transistor (TFET)
SiGe
metal gate granularity
buried channel
ON-state
bulk NMOS devices
ambipolar
piezoelectrics
tunnel field effect transistor (TFET)
FinFETs
polarization
field-effect transistor
line edge roughness
random discrete dopants
radiation hardened by design (RHBD)
low energy
flux calculation
doping incorporation
low voltage
topography simulation
MOS devices
low-frequency noise
high-k
layout
level set
process variations
subthreshold
metal gate stack
electrostatic discharge (ESD)
ISBN 9783039210114
3039210114
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910346680003321
Filipovic Lado  
MDPI - Multidisciplinary Digital Publishing Institute, 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui