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Feature Papers in Electronic Materials Section
Feature Papers in Electronic Materials Section
Autore Roccaforte Fabrizio
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 electronic resource (438 p.)
Soggetto topico Technology: general issues
History of engineering & technology
Energy industries & utilities
Soggetto non controllato vertical GaN
quasi-vertical GaN
reliability
trapping
degradation
MOS
trench MOS
threshold voltage
nanomanufacturing
high-throughput method
material printing
flexible bioelectronics
nanomembrane
hybrid integration
GaAs
InGaAs channel
epitaxial lift-off
HEMT
van der Waals
3C-SiC
stacking faults
doping
KOH etching
silicon carbide
radiation hardness
proton and electron irradiation
charge removal rate
compensation
irradiation temperature
heteroepitaxy
bulk growth
compliant substrates
defects
stress
cubic silicon carbide
power electronics
thin film
iron-based superconductor
pulsed laser deposition
transmission electron microscopy
diamond
MPCVD growth
electron microscopy
chemical vapour deposition
2D materials
MoS2
silica point defects
optical fibers
radiation effects
4H-SiC
ohmic contact
SIMS
Ti3SiC2
simulation
Schottky barrier
Schottky diodes
electrical characterization
graphene absorption
Fabry–Perot filter
radio frequency sputtering
CVD graphene
GaN
thermal management
GaN-on-diamond
CVD
arrhythmia detection
cardiovascular monitoring
soft biosensors
wearable sensors
flexible electronics
gate dielectric
aluminum oxide
interface
traps
instability
insulators
binary oxides
high-κ dielectrics
wide band gap semiconductors
energy electronics
ultra-wide bandgap
diodes
transistors
gallium oxide
Ga2O3
spinel
ZnGa2O4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557620303321
Roccaforte Fabrizio  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Intelligent Electronic Devices
Intelligent Electronic Devices
Autore Zhao Wenbing
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2020
Descrizione fisica 1 electronic resource (220 p.)
Soggetto non controllato wearable robot
electrical circuits and devices
threshold voltage
broadcast circuit
dual-input converter
built-in self-test
n-channel lateral diffused MOSFET (nLDMOS)
multi-robots
current-voltage characteristics
actuator
electromagnetic interference
sound recognition module
brushless DC motor
tabu search
transmission-line pulse system (TLP system)
skeletal feature representation
communications and information processing
180-degree conduction
mosquitoes
regions with convolutional neural network (R-CNN)
oscillator
secondary freeform lens device (SFLD)
low-dosed
ZnO-based nanowires
adaptive network-based fuzzy inference system (ANFIS)
galvanic isolation
lateral diffusion MOS (LDMOS)
non-uniform conduction
photoluminescence properties
Aedes albopictus
test pattern generation
stearic
high-definition multimedia interface
sensorless motor drive
PCB layout
leakage energy recycling
latchup (LU)
Aedes aegypti
secondary breakdown current (It2)
6-DOF robot arm
lower limb exoskeleton
as low as diagnostically acceptable (ALADA)
voltage-controlled oscillator
Eu3+ and In3+ ions
electromagnetic lock
computer science and engineering
holding voltage (Vh)
low cost
voltage clamping
cone-beam computerized tomography (CBCT)
selective anatomy analytic iteration reconstruction (SA2IR)
action quality assessment
diagnostic ability
high voltage gain
laser pointer
sparse projections
speed control
multiple simple current mirror
human activity analysis
path programming
negative differential resistance
drift region
electrostatic discharge (ESD)
radiation resistance
hydrothermal method
ISBN 3-03928-974-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910404081403321
Zhao Wenbing  
MDPI - Multidisciplinary Digital Publishing Institute, 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui