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Analysis, Design and Fabrication of Micromixers
| Analysis, Design and Fabrication of Micromixers |
| Autore | Kim Kwang-Yong |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 online resource (224 p.) |
| Soggetto topico | Technology: general issues |
| Soggetto non controllato |
acoustic micromixers
active micromixers additive manufacturing anti-reciprocity asymmetric split-and-recombine (ASAR) centrifugal microfluidics CFD comparative analysis computational fluid dynamics computational fluid dynamics (CFD) concentric flow Coriolis force deformation design for manufacturing diffusive mixing electrical impedance electro-mechanical systems electrokinetic vortices electromagnetic micromixers empirical modelling engulfment flow flow visualization fluid overlapping folding gyrator histogram and standard deviation kinematics length ratio mechanical velocity micro EDM milling micro heat exchanger microfluidics micromachining micromixer micromixers micronozzles mixers mixing cost mixing efficiency mixing index mixing rate n/a Navier-Stokes equations obstacles optimization particle tracking passive micromixers passive mixing pressure drop RBNN segmentation sequential injection soft tooling split-and-recombine stereolithography stretching surface metrology surface roughness T-shaped micromixer T-type microchannel thermal engineering thermal mixing three-dimensional (3D) printing TLCCM configuration U-shaped channel voice-coil mixers vortex vortex shedding vorticity Y-shaped structure zeta potential ratio |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557677203321 |
Kim Kwang-Yong
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
| Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry |
| Autore | Taudt Christopher |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Wiesbaden, : Springer Fachmedien Wiesbaden GmbH, 2021 |
| Descrizione fisica | 1 online resource (180 p.) |
| Soggetto topico |
Optical physics
Mensuration & systems of measurement |
| Soggetto non controllato |
surface metrology
profilometry interferometry low-coherence interferometry semiconductor manufacturing optical metrology Open Access |
| ISBN |
9783658359263
3658359269 |
| Classificazione | SCI053000TEC022000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Acknowledgements -- Abstract -- Contents -- List of Symbols -- List of Figures -- List of Tables -- 1 Introduction and Motivation -- 2 Related Works and Basic Considerations -- 2.1 Profilometry -- 2.1.1 Atomic Force Microscopy -- 2.1.2 Confocal Laser Scanning Microscopy -- 2.1.3 Digital Holographic Microscopy -- 2.1.4 Phase-shifting Interferometry -- 2.1.5 Coherence Scanning Interferometry -- 2.1.6 Low-coherence Interferometry -- 2.2 Polymer Cross-linking Characterization -- 2.2.1 Soxhlet-type Extraction -- 2.2.2 Differential Scanning Caliometry -- 2.2.3 Dynamic Mechanical Analysis -- 2.2.4 Spectroscopy-based Methods -- 2.2.5 Low-coherence Interferometry and Other Optical Methods -- 2.2.6 Spatially-resolved Approaches -- 2.3 Film Thickness Measurement -- 2.3.1 Spectral Reflectometry -- 2.3.2 Spectroscopic Ellipsometry -- 2.4 Material dispersion -- 2.4.1 Thermo-optic coefficient -- 2.4.2 Photo-elastic influences -- 2.4.3 Characterization of dispersion -- 3 Surface Profilometry -- 3.1 Experimental Setup -- 3.2 Measurement Range and Resolution -- 3.3 Signal Formation and Analysis -- 3.3.1 Fitting of Oscillating Data -- 3.3.2 Frequency Analysis -- 3.3.3 Two-Stage Fitting -- 3.3.4 Error Estimation of the Data Processing -- 3.4 Two-Dimensional Approach and Characterization -- 3.4.1 Height Standard Evaluation -- 3.4.2 Repeatability and Resolution Characterization -- 3.4.3 Edge Effects -- 3.4.4 Roughness Evaluation -- 3.4.5 High-Dynamic Range Measurements -- 3.4.6 Dual-Channel Approach -- 3.5 Areal Measurement Approaches -- 3.5.1 Translation-Based Areal Information -- 3.5.2 Alternative Spectral Encoding for Areal Measurements -- 4 Polymer Characterization -- 4.1 Temporal Approach -- 4.2 Scan-free Approach -- 4.2.1 Wrapped-phase Derivative Evaluation (WPDE) -- 4.2.2 Spatially-resolved Approaches -- 4.3 Influences and Limitations.
4.3.1 Error Parameters of the Temporal Approach -- 4.3.2 Error Propagation in WPDE -- 5 Thin-film Characterization -- 5.1 Setup Considerations -- 5.2 Characterization of Thin-films on Bulk Substrates -- 5.3 Characterization of Flexible Substrate Materials -- 6 Conclusion -- A Glossary -- Publications -- Bibliography. |
| Record Nr. | UNINA-9910510584003321 |
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Taudt Christopher
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| Wiesbaden, : Springer Fachmedien Wiesbaden GmbH, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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