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Advanced Deep Learning Strategies for the Analysis of Remote Sensing Images
| Advanced Deep Learning Strategies for the Analysis of Remote Sensing Images |
| Autore | Bazi Yakoub |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 electronic resource (438 p.) |
| Soggetto topico | Research & information: general |
| Soggetto non controllato |
synthetic aperture radar
despeckling multi-scale LSTM sub-pixel high-resolution remote sensing imagery road extraction machine learning DenseUNet scene classification lifting scheme convolution CNN image classification deep features hand-crafted features Sinkhorn loss remote sensing text image matching triplet networks EfficientNets LSTM network convolutional neural network water identification water index semantic segmentation high-resolution remote sensing image pixel-wise classification result correction conditional random field (CRF) satellite object detection neural networks single-shot deep learning global convolution network feature fusion depthwise atrous convolution high-resolution representations ISPRS vaihingen Landsat-8 faster region-based convolutional neural network (FRCNN) single-shot multibox detector (SSD) super-resolution remote sensing imagery edge enhancement satellites open-set domain adaptation adversarial learning min-max entropy pareto ranking SAR Sentinel–1 Open Street Map U–Net desert road infrastructure mapping monitoring deep convolutional networks outline extraction misalignments nearest feature selector hyperspectral image classification two stream residual network Batch Normalization plant disease detection precision agriculture UAV multispectral images orthophotos registration 3D information orthophotos segmentation wildfire detection convolutional neural networks densenet generative adversarial networks CycleGAN data augmentation pavement markings visibility framework urban forests OUDN algorithm object-based high spatial resolution remote sensing Generative Adversarial Networks post-disaster building damage assessment anomaly detection Unmanned Aerial Vehicles (UAV) xBD feature engineering orthophoto unsupervised segmentation |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557747903321 |
Bazi Yakoub
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics / Paul Leroux
| Radiation Tolerant Electronics / Paul Leroux |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | Basel, Switzerland : , : MDPI, , 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN |
9783039212804
303921280X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
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Leroux Paul
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| Basel, Switzerland : , : MDPI, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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