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Advanced Deep Learning Strategies for the Analysis of Remote Sensing Images
| Advanced Deep Learning Strategies for the Analysis of Remote Sensing Images |
| Autore | Bazi Yakoub |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 online resource (438 p.) |
| Soggetto topico | Research and information: general |
| Soggetto non controllato |
3D information
adversarial learning anomaly detection Batch Normalization building damage assessment CNN conditional random field (CRF) convolution convolutional neural network convolutional neural networks CycleGAN data augmentation deep convolutional networks deep features deep learning densenet DenseUNet depthwise atrous convolution desert despeckling edge enhancement EfficientNets faster region-based convolutional neural network (FRCNN) feature engineering feature fusion framework generative adversarial networks Generative Adversarial Networks global convolution network hand-crafted features high spatial resolution remote sensing high-resolution remote sensing image high-resolution remote sensing imagery high-resolution representations hyperspectral image classification image classification infrastructure ISPRS vaihingen Landsat-8 lifting scheme LSTM LSTM network machine learning mapping min-max entropy misalignments monitoring multi-scale nearest feature selector neural networks object detection object-based Open Street Map open-set domain adaptation orthophoto orthophotos registration orthophotos segmentation OUDN algorithm outline extraction pareto ranking pavement markings pixel-wise classification plant disease detection post-disaster precision agriculture remote sensing remote sensing imagery result correction road road extraction SAR satellite satellites scene classification semantic segmentation Sentinel-1 single-shot single-shot multibox detector (SSD) Sinkhorn loss sub-pixel super-resolution synthetic aperture radar text image matching triplet networks two stream residual network U-Net UAV multispectral images Unmanned Aerial Vehicles (UAV) unsupervised segmentation urban forests visibility water identification water index wildfire detection xBD |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557747903321 |
Bazi Yakoub
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics / Paul Leroux
| Radiation Tolerant Electronics / Paul Leroux |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN |
9783039212804
303921280X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
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Leroux Paul
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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