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Challenges and New Trends in Power Electronic Devices Reliability
| Challenges and New Trends in Power Electronic Devices Reliability |
| Autore | Falco Pasquale De |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 online resource (207 p.) |
| Soggetto topico |
Energy industries & utilities
Technology: general issues |
| Soggetto non controllato |
AC motor drive
AC-coupled configuration accelerated test AlGaN/GaN HEMT availability battery bond wire cables capacitors cascode structure condition monitoring cracks current harmonics DC-coupled configuration DC/AC converter electromagnetic launching field failure monitoring fusion algorithm heavy-ion irradiation experiment high-light mode high-power thyristors IGBT reliability junction temperature LED lifetime prediction loss modeling low-light mode maintenance microgrid inverter mission profile module transconductance multi-chip IGBT module n/a online evaluation photovoltaic system photovoltaic systems power device power electronic converters power electronics power MOSFET power system faults PPS reliability reverse recovery currents segmented LSTM sensor lamp SiC MOSFET single event effects solder joint technology computer-aided design simulation temperature calibration thermal cycling test voltage harmonics |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910674042803321 |
Falco Pasquale De
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics / Paul Leroux
| Radiation Tolerant Electronics / Paul Leroux |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN |
9783039212804
303921280X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
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Leroux Paul
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Reliability Analysis of Electrotechnical Devices
| Reliability Analysis of Electrotechnical Devices |
| Autore | Tan Cher Ming |
| Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
| Descrizione fisica | 1 online resource (174 p.) |
| Soggetto topico |
History of engineering & technology
Technology: general issues |
| Soggetto non controllato |
3D X-ray
3D-IC (three-dimensional integrated circuit) BGA bias temperature-humidity reliability test conductive anodic filament (CAF) de-penalization deconvolution deep space environment elastic mechanical properties electrochemistry based electrical model electromagnetic interference extreme thermal shocks factorial design of experiment finite element analysis fracture failure gamma process GaN genetic algorithm optimization lifetime lineal energy linear energy transfer low temperature measurement system analysis microdosimetry Monte Carlo simulation multiple-input multiple-output (MIMO) n/a near field measurement operational amplifier pressureless sintered micron silver joints prompt gamma imaging proton therapy quality and reliability assurance radiation hardness reconstruction reliability estimation remaining useful life return loss SAC305 semi-empirical capacity fading model simulation single event effect single event effects state of health useful life distribution |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910585945603321 |
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Tan Cher Ming
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| Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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