Metal Micro-forming |
Autore | Manabe Ken-ichi |
Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
Descrizione fisica | 1 electronic resource (206 p.) |
Soggetto topico | History of engineering & technology |
Soggetto non controllato |
laser impact liquid flexible embossing
microforming 3-D large area micro arrays liquid shock wave high strain rate forming numerical simulation carbon nanotubes feedstock homogeneity metallic powders micro hot embossing shaping plasma printing micro-texturing screen printing low-temperature plasma nitriding selective anisotropic nitrogen embedding selective hardening sand blasting AISI316 micro-meshing punch array copper plates resistance heating system surface modification free surface roughness evolution compression thin sheet metal micro metal forming ultrasonic orbital forming micro-tubes micro-tube drawing micro-hydroforming laser assisted severe plastic deformation micro-tube testing dieless drawing SUS304 stainless steel wires oxide layer finite element simulation surface texturing sheet metal forming in-situ observation micro-dimple lubricant microtube hydroforming T-shape bulging tube materials friction tube length micro hydroformability process window FE analysis microstructure size effects deformation characterization micro-rolling wire |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910557108603321 |
Manabe Ken-ichi
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Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
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Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics |
Autore | Leroux Paul |
Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
Descrizione fisica | 1 electronic resource (210 p.) |
Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
ISBN | 3-03921-280-X |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910367565203321 |
Leroux Paul
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MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
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Lo trovi qui: Univ. Federico II | ||
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