Advances in Environmental Applied Physics
| Advances in Environmental Applied Physics |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2023 |
| Descrizione fisica | 1 online resource (146 p.) |
| Soggetto topico |
Environmental science, engineering and technology
Technology: general issues |
| Soggetto non controllato |
137-caesium
absorbed dose activity concentration Antarctica atmosphere aviation baby food background radioactivity basalt aggregate for concrete car parking lots complex DNA damage cosmic rays double strand breaks drinking water effective dose equivalent dose rate flight level flour gamma spectrometry gamma spectroscopy heavy metals heavy metals contamination High Purity Germanium (HPGe) gamma-ray spectrometry high-purity germanium gamma spectrometry HPGe γ-ray spectrometry inductively coupled plasma mass spectrometry Inductively Coupled Plasma-Mass Spectrometry (ICP-MS) inductively-coupled plasma emission spectroscopy inductively-coupled plasma mass spectrometry ingestion ionization ionizing radiation mineral concentration mineralogy Monte Carlo simulation multivariate statistics n/a natural and anthropogenic radioactivity natural radioactivity neutron measurement pollution portable monitoring system potentially toxic elements pyroclastic products radiation radiation detector radioactivity radiological hazard radiological incident radiological risk radiological risks radionuclide radon exhalation river sediments solar cycle surface activity uranium X-ray diffraction |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910743272103321 |
| MDPI - Multidisciplinary Digital Publishing Institute, 2023 | ||
| Lo trovi qui: Univ. Federico II | ||
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SiC based Miniaturized Devices
| SiC based Miniaturized Devices |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 online resource (170 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
3C-SiC
4H-SiC 4H-SiC, epitaxial layer 6H-SiC aluminum nitride amorphous SiC Berkovich indenter bulge test bulk micromachining circular membrane cleavage strength critical depth of cut critical load deep level transient spectroscopy (DLTS) deformation doped SiC electrochemical characterization electrochemical etching electron beam induced current spectroscopy (EBIC) epitaxial growth FEM grazing incidence X-ray diffraction (GIXRD) high-power impulse magnetron sputtering (HiPIMS) high-temperature converters indentation material removal mechanisms MEA mechanical properties MEMS devices MESFET microelectrode array microstrip detector n-type n/a nanoscratching negative gate-source voltage spike neural implant neural interface neural probe p-type PAE point defects power electronics power module pulse height spectroscopy (PHS) radiation detector Raman spectroscopy residual stress Rutherford backscattering spectrometry (RBS) Schottky barrier semiconductor radiation detector SiC SiC power electronic devices silicon carbide simulation thermally stimulated current spectroscopy (TSC) thin film vibrometry Young's modulus |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557498703321 |
| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Lo trovi qui: Univ. Federico II | ||
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