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Radiation Tolerant Electronics / Paul Leroux
| Radiation Tolerant Electronics / Paul Leroux |
| Autore | LeRoux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN |
9783039212804
303921280X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
LeRoux Paul
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Wide Bandgap Based Devices : Design, Fabrication and Applications
| Wide Bandgap Based Devices : Design, Fabrication and Applications |
| Autore | Medjdoub Farid |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 online resource (242 p.) |
| Soggetto topico | Technology: general issues |
| Soggetto non controllato |
4H-SiC
active power filter (APF) AESA radars Ag sinter paste AlGaN/GaN amorphous InGaZnO asymmetric multiple quantum wells barrier thickness breakdown voltage (BV) buffer trapping effect buried-channel composition-graded AlxGa1−xN electron blocking layer (EBL) copper metallization cosolvent direct bonded copper (DBC) substrate distortions distributed feedback (DFB) double barrier electrochromism electron leakage electron leakage current flexible devices gallium nitride gallium nitride (GaN) Gallium nitride (GaN) high-electron-mobility transistors (HEMTs) GaN GaN 5G GaN laser diode GaN-based vertical-cavity surface-emitting laser (VCSEL) GaN-on-GaN grooved-anode diode HEMT hierarchical nanostructures high electron mobility transistors high electron mobility transistors (HEMT) high-electron-mobility transistor (HEMT) high-electron-mobility transistors high-energy α-particle detection IGBT InGaN laser diodes jammer system low voltage metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT) millimeter wave morphology n/a new radio nitrogen-doping normally off normally-off operation numerical simulation ON-state voltage optical absorption loss optical band gap optimization photon extraction efficiency photonic emitter polyol method power amplifier power cycle test power quality (PQ) power switching device proton irradiation recessed gate reliability RF front-end schottky barrier diodes self-align SiC micro-heater chip sidewall gratings silver nanoring silver nanowire spin coating stability surface gratings terahertz Gunn diode thermal resistance thick depletion width detectors thin-film transistor time-dependent dielectric breakdown (TDDB) transmittance tungsten trioxide film turn-off loss ultra-wide band gap vertical breakdown voltage vertical gate structure wide band gap semiconductors wide band-gap (WBG) wide bandgap semiconductors wide-bandgap semiconductor wideband ZnO nanorod/NiO nanosheet |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Wide Bandgap Based Devices |
| Record Nr. | UNINA-9910557351703321 |
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Medjdoub Farid
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||