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Radiation Tolerant Electronics
Radiation Tolerant Electronics
Autore Leroux Paul
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2019
Descrizione fisica 1 electronic resource (210 p.)
Soggetto non controllato single event effects
radiation-hardening-by-design (RHBD)
frequency divider by two
single event upset
Image processing
CMOS analog integrated circuits
FPGA
total ionizing dose (TID)
Impulse Sensitive Function
soft error
hardening by design
radiation hardening by design
X-rays
Single-Event Upsets (SEUs)
line buffer
heavy ions
VHDL
FPGA-based digital controller
radiation hardening by design (RHBD)
radiation hardening
SRAM-based FPGA
proton irradiation
ring oscillator
sensor readout IC
fault tolerance
space application
physical unclonable function
voltage controlled oscillator (VCO)
Ring Oscillators
analog single-event transient (ASET)
single event opset (SEU)
SEB
single event upsets
bipolar transistor
total ionizing dose
protons
triple modular redundancy (TMR)
gain degradation
space electronics
saturation effect
configuration memory
Co-60 gamma radiation
total ionization dose (TID)
frequency synthesizers
CMOS
PLL
TDC
single-event upsets (SEUs)
bandgap voltage reference (BGR)
4MR
single-shot
error rates
Radiation Hardening by Design
soft errors
heavy-ions
single-event effects (SEE)
single event transient (SET)
SEE testing
proton irradiation effects
RFIC
single event upset (SEU)
FMR
ionization
radiation tolerant
triplex-duplex
neutron irradiation effects
digital integrated circuits
single event gate rupture (SEGR)
power MOSFETs
ring-oscillator
selective hardening
voltage reference
nuclear fusion
TMR
gamma-rays
gamma ray
instrumentation amplifier
radiation effects
reference circuits
radiation-hardened
ISBN 3-03921-280-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910367565203321
Leroux Paul  
MDPI - Multidisciplinary Digital Publishing Institute, 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Wide Bandgap Based Devices : Design, Fabrication and Applications
Wide Bandgap Based Devices : Design, Fabrication and Applications
Autore Medjdoub Farid
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Descrizione fisica 1 electronic resource (242 p.)
Soggetto topico Technology: general issues
Soggetto non controllato GaN
high-electron-mobility transistor (HEMT)
ultra-wide band gap
GaN-based vertical-cavity surface-emitting laser (VCSEL)
composition-graded AlxGa1−xN electron blocking layer (EBL)
electron leakage
GaN laser diode
distributed feedback (DFB)
surface gratings
sidewall gratings
AlGaN/GaN
proton irradiation
time-dependent dielectric breakdown (TDDB)
reliability
normally off
power cycle test
SiC micro-heater chip
direct bonded copper (DBC) substrate
Ag sinter paste
wide band-gap (WBG)
thermal resistance
amorphous InGaZnO
thin-film transistor
nitrogen-doping
buried-channel
stability
4H-SiC
turn-off loss
ON-state voltage
breakdown voltage (BV)
IGBT
wide-bandgap semiconductor
high electron mobility transistors
vertical gate structure
normally-off operation
gallium nitride
asymmetric multiple quantum wells
barrier thickness
InGaN laser diodes
optical absorption loss
electron leakage current
wide band gap semiconductors
numerical simulation
terahertz Gunn diode
grooved-anode diode
Gallium nitride (GaN) high-electron-mobility transistors (HEMTs)
vertical breakdown voltage
buffer trapping effect
gallium nitride (GaN)
power switching device
active power filter (APF)
power quality (PQ)
metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT)
recessed gate
double barrier
high-electron-mobility transistors
copper metallization
millimeter wave
wide bandgap semiconductors
flexible devices
silver nanoring
silver nanowire
polyol method
cosolvent
tungsten trioxide film
spin coating
optical band gap
morphology
electrochromism
self-align
hierarchical nanostructures
ZnO nanorod/NiO nanosheet
photon extraction efficiency
photonic emitter
wideband
HEMT
power amplifier
jammer system
GaN 5G
high electron mobility transistors (HEMT)
new radio
RF front-end
AESA radars
transmittance
distortions
optimization
GaN-on-GaN
schottky barrier diodes
high-energy α-particle detection
low voltage
thick depletion width detectors
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Wide Bandgap Based Devices
Record Nr. UNINA-9910557351703321
Medjdoub Farid  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui