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Applications of Finite Element Modeling for Mechanical and Mechatronic Systems
Applications of Finite Element Modeling for Mechanical and Mechatronic Systems
Autore Krawczuk Marek
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Descrizione fisica 1 online resource (392 p.)
Soggetto topico Technology: general issues
Soggetto non controllato Abaqus
active periodic structures
adaptivity
Almen intensity
aluminum conductor steel-reinforced cable
applied load
aramid fiber
assessment
bell crank
bend deformation
bias tire
biomechanics
carbon fiber
channel
collision modeling
contact detection
convergence
crack detection
cut bar method
damage
damage detection
delamination
design
design of experiment
detection
disability
drill pipe joint
driver
electro-mechanical systems
endogenous fires
equilibrated residual method
experiment
fatigue fracture
FEA
FEM
finite element analysis
finite element method
finite element modeling
finite elements
Finite Elements Analysis (FEA)
finite volumne method
first-order models
friction coefficient
generative modelling
HALE UAV
head injury
heat lakes
hierarchical models
high peening coverage
hp-adaptivity
hpq/hp-approximations
hybrid composite
inflation analysis
injury criteria
local behaviors
longwall
low loading
mechanical parameters
misalignment
natural frequency
nondestructive inspection
numerical locking
numerical modeling
numerical simulation
NURBS
p-enrichment
PCHE
piezoelectrics
quantitative description of peening coverage
residual compressive stress
resolution
reverse engineering
roll-to-roll process
rubber
safety
sealing properties
sensitivity analysis
SFEM
shot peening
shrinkage
single-sided
smart materials
solid mechanics
spontaneous combustion
steady-state
strain deviation
stress
stress gradients
surface profile
swingarm
textile cord
thermal conductivity
thin-layer composite structure
three-wheel motorcycle
topology optimization
torsion springs
transition models
turbine blade
underground coal mine
utilization factor
ventilation system
vibrometer
web deformation
wind loads
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557596503321
Krawczuk Marek  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Autore Filipovic Lado
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2019
Descrizione fisica 1 electronic resource (202 p.)
Soggetto topico History of engineering and technology
Soggetto non controllato MOSFET
total ionizing dose (TID)
low power consumption
process simulation
two-dimensional material
negative-capacitance
power consumption
technology computer aided design (TCAD)
thin-film transistors (TFTs)
band-to-band tunneling (BTBT)
nanowires
inversion channel
metal oxide semiconductor field effect transistor (MOSFET)
spike-timing-dependent plasticity (STDP)
field effect transistor
segregation
systematic variations
Sentaurus TCAD
indium selenide
nanosheets
technology computer-aided design (TCAD)
high-? dielectric
subthreshold bias range
statistical variations
fin field effect transistor (FinFET)
compact models
non-equilibrium Green's function
etching simulation
highly miniaturized transistor structure
compact model
silicon nanowire
surface potential
Silicon-Germanium source/drain (SiGe S/D)
nanowire
plasma-aided molecular beam epitaxy (MBE)
phonon scattering
mobility
silicon-on-insulator
drain engineered
device simulation
variability
semi-floating gate
synaptic transistor
neuromorphic system
theoretical model
CMOS
ferroelectrics
tunnel field-effect transistor (TFET)
SiGe
metal gate granularity
buried channel
ON-state
bulk NMOS devices
ambipolar
piezoelectrics
tunnel field effect transistor (TFET)
FinFETs
polarization
field-effect transistor
line edge roughness
random discrete dopants
radiation hardened by design (RHBD)
low energy
flux calculation
doping incorporation
low voltage
topography simulation
MOS devices
low-frequency noise
high-k
layout
level set
process variations
subthreshold
metal gate stack
electrostatic discharge (ESD)
ISBN 9783039210114
3039210114
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910346680003321
Filipovic Lado  
MDPI - Multidisciplinary Digital Publishing Institute, 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui