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Cyber Security of Critical Infrastructures
Cyber Security of Critical Infrastructures
Autore Maglaras Leandros
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Descrizione fisica 1 electronic resource (316 p.)
Soggetto topico Technology: general issues
Soggetto non controllato crypto-ransomware
locker-ransomware
static analysis
dynamic analysis
machine learning
assessment framework
cybersecurity
GDPR
PCI-DSS
DSPT
NISD
cyber-ranges
security training
security modelling
serious games
dynamic adaptation
training programmes
computers in education
bloom
STRIDE
smart shipping
military
VMF
hash chain
T-OTP
lightweight secure hash (LSH)
CNR
web application
security vulnerability
analysis security testing
static analysis security testing
dynamic analysis security testing
interactive analysis security testing
assessment methodology
false positive
false negative
tools combination
deep learning
image classification
transfer learning
industrial control system
fine-tuning
testbeds
cyber ranges
cyber exercises
education
training
research
lattice cryptography
code cryptography
post quantum cryptography
physical unclonable function
public key infrastructure
high performance computing
malware analysis
static malware analysis
dynamic malware analysis
malware classification
random forest
support vector machines
smart grid
risk assessment
threat modeling
formal verification
probabilistic model checking
cloud robotics
image face recognition
deep learning algorithms
security
encryption algorithms
cybercrime
Hasse diagram
interval-valued complex intuitionistic fuzzy relations
interval-valued complex intuitionistic fuzzy sets
offensive cybersecurity
cyber-attacks
scoring model
offensive cybersecurity framework
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557336503321
Maglaras Leandros  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Radiation Tolerant Electronics
Radiation Tolerant Electronics
Autore Leroux Paul
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2019
Descrizione fisica 1 electronic resource (210 p.)
Soggetto non controllato single event effects
radiation-hardening-by-design (RHBD)
frequency divider by two
single event upset
Image processing
CMOS analog integrated circuits
FPGA
total ionizing dose (TID)
Impulse Sensitive Function
soft error
hardening by design
radiation hardening by design
X-rays
Single-Event Upsets (SEUs)
line buffer
heavy ions
VHDL
FPGA-based digital controller
radiation hardening by design (RHBD)
radiation hardening
SRAM-based FPGA
proton irradiation
ring oscillator
sensor readout IC
fault tolerance
space application
physical unclonable function
voltage controlled oscillator (VCO)
Ring Oscillators
analog single-event transient (ASET)
single event opset (SEU)
SEB
single event upsets
bipolar transistor
total ionizing dose
protons
triple modular redundancy (TMR)
gain degradation
space electronics
saturation effect
configuration memory
Co-60 gamma radiation
total ionization dose (TID)
frequency synthesizers
CMOS
PLL
TDC
single-event upsets (SEUs)
bandgap voltage reference (BGR)
4MR
single-shot
error rates
Radiation Hardening by Design
soft errors
heavy-ions
single-event effects (SEE)
single event transient (SET)
SEE testing
proton irradiation effects
RFIC
single event upset (SEU)
FMR
ionization
radiation tolerant
triplex-duplex
neutron irradiation effects
digital integrated circuits
single event gate rupture (SEGR)
power MOSFETs
ring-oscillator
selective hardening
voltage reference
nuclear fusion
TMR
gamma-rays
gamma ray
instrumentation amplifier
radiation effects
reference circuits
radiation-hardened
ISBN 3-03921-280-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910367565203321
Leroux Paul  
MDPI - Multidisciplinary Digital Publishing Institute, 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui