Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Metal Phosphonates and Phosphinates
| Metal Phosphonates and Phosphinates |
| Autore | Costantino Ferdinando |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 electronic resource (120 p.) |
| Soggetto non controllato |
solar energy conversion
carboxylic acid organic salts 2?:6? Cerium drug delivery layered materials coordination polymer copper solid state NMR metal-organic frameworks synthesis coordination polymers in situ characterisation mechanochemistry phosphonic acids amorphous nickel(II) oxide heterogeneous catalysis phosphonic acid MOF porosity phosphonate ester proton conduction X-ray and electron diffraction gas sorption/separation metal phosphonate electron diffraction tomography ionic compounds dye-sensitized solar cell 2?-terpyridine dye 2 rechargeable batteries anchor defects p-type crystal structure diphosphinate zinc(II) metal phosphonates and phosphinates |
| ISBN | 3-03928-003-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910372784503321 |
Costantino Ferdinando
|
||
| MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
SiC based Miniaturized Devices
| SiC based Miniaturized Devices |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 electronic resource (170 pages) |
| Soggetto topico |
Engineering - History
Technology |
| Soggetto non controllato |
high-power impulse magnetron sputtering (HiPIMS)
silicon carbide aluminum nitride thin film Rutherford backscattering spectrometry (RBS) grazing incidence X-ray diffraction (GIXRD) Raman spectroscopy 6H-SiC indentation deformation material removal mechanisms critical load 4H-SiC critical depth of cut Berkovich indenter cleavage strength nanoscratching power electronics high-temperature converters MEMS devices SiC power electronic devices neural interface neural probe neural implant microelectrode array MEA SiC 3C-SiC doped SiC n-type p-type amorphous SiC epitaxial growth electrochemical characterization MESFET simulation PAE bulk micromachining electrochemical etching circular membrane bulge test vibrometry mechanical properties Young's modulus residual stress FEM semiconductor radiation detector microstrip detector power module negative gate-source voltage spike 4H-SiC, epitaxial layer Schottky barrier radiation detector point defects deep level transient spectroscopy (DLTS) thermally stimulated current spectroscopy (TSC) electron beam induced current spectroscopy (EBIC) pulse height spectroscopy (PHS) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557498703321 |
| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||