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Fracture and Fatigue Assessments of Structural Components
| Fracture and Fatigue Assessments of Structural Components |
| Autore | Campagnolo Alberto |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 online resource (186 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
3D reconstruction
ABAQUS subroutine affecting factors analytical model brittle broken coal seam cleat filler composite concrete beams control volume concept crack crack coalescence crack initiation crack propagation critical plane approach damage evolution damage index delamination dissipated energy double cantilever composite beam (DCB) fatigue fatigue crack fatigue damage evolution fatigue life fatigue life assessment fatigue life prediction FEM finite element method finite fracture mechanics fracture life assessment life prediction master-slave model MCT scanning metal microcracks monitoring of fatigue crack multiple fatigue crack multiscale nanodevice nanoscale notch nozzle guide vane ordinary state-based peridynamics rail corrugation running speed scroll compressor sensor network severely notched specimens silicon strain energy density structural health monitoring structure thermal barrier coat thermal evolution thermal fatigue thermo-graphic technique ultrasonic guided waves welded bogie frame welded joint wellbore stability wheel polygon |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557301003321 |
Campagnolo Alberto
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Nanowire Field-Effect Transistor (FET)
| Nanowire Field-Effect Transistor (FET) |
| Autore | García-Loureiro Antonio |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 |
| Descrizione fisica | 1 online resource (96 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
aspect ratio of channel cross-section
charge transport CMOS circuit conduction mechanism constriction Coulomb interaction DC and AC characteristic fluctuations device simulation dimensionality reduction drift-diffusion electron-phonon interaction fabrication field effect transistor gate-all-around geometric correlations heat equation hot electrons III-V Integration Kubo-Greenwood formalism lowest order approximation material properties metal gate modelling Monte Carlo MOSFETs nano-cooling nano-transistors nanodevice nanojunction nanowire nanowire field-effect transistors nanowire transistor noise margin fluctuation non-equilibrium Green functions nonequilibrium Green's function one-dimensional multi-subband scattering models Padé approximants phonon-phonon interaction power dissipation power fluctuation quantum confinement quantum electron transport quantum modeling quantum transport random dopant Richardson extrapolation Schrödinger based quantum corrections schrödinger-poisson solvers screening self-consistent Born approximation self-cooling silicon nanomaterials silicon nanowires statistical device simulation stochastic Schrödinger equations TASE thermoelectricity timing fluctuation variability variability effects work function fluctuation ZnO |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Nanowire Field-Effect Transistor |
| Record Nr. | UNINA-9910557553303321 |
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García-Loureiro Antonio
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| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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