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Manufacturing Metrology
Manufacturing Metrology
Autore Fan Kuang-Chao
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (414 p.)
Soggetto topico History of engineering & technology
Technology: general issues
Soggetto non controllato 3D reconstruction
a priori planning
absolute angle measurement
absolute distance measurement
actual laser imaging waveform
aeroengine blade
angle measurement
automated optical inspection
blade tip timing
blade twist
centroid difference
chromatic confocal probe
circular contour
circulating cooling water
circumferential Fourier fit
CMP
compressed sensing
confocal sensing
confocal sensor
coordinate measuring machine
cutting edge radius
defect detection
depth detection
diamond roller
differential Fabry-Pérot interferometer
differential measurement system
diffraction grating
dispensing robot
dual-axis level
dynamic measurement
dynamic response speed
dynamic thermal filtering
edge detection
elastic recovery
end-plate surface distance measurement
femtosecond laser
film interferometry
form measurement
form truing
GD&
generative adversarial network (GAN)
geometric analysis
geometric deviations
high aspect ratios
homodyne interferometer
identification method
in-process
in-situ measurements
laser autocollimation
laser interference
laser triangulation displacement sensor (LTDS)
length calibration
light refraction
light transmission
linear displacement
location system
machine tool
measurement and evaluation
measurement mechanism
measurement system analysis
measurement uncertainty
metrology
metrology for machining
miniature internal structures
mode-locked femtosecond laser
modular design
Monte Carlo method
multi-path laser synthesis technology
multi-tasking machine tools
n/a
nanoindentation system
nonlinear optics
nonlinearity error
off-axis differential method
on-site measurement
optical angle sensor
optical coherence tomography
optical frequency comb
over-constrained mechanism
pad dressing
pad lifetime
pad uniformity
point probing characteristics
positional relation
precision manufacturing
precision measurement
precision metrology
quality
quick response
repeatability accuracy
reproducibility
reversal method
roughness
roundness measurement
scanless 3D imaging
second harmonic generation
single point diamond tool
single-pixel detector
spherical diamond wheel
spherical scattering electrical field probe
squareness of translational axes
step gauge
stitching linear-scan method
surface charge distribution
surface form tracing
surface positioning
surface shape contour
surface texture measurement
synchronous vibration
system error correction
T
temperature stability
thermal management
topography measurement
tracking local minimum method
wafer die
white light interference
you only look once version 3 (YOLOv3)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910580211003321
Fan Kuang-Chao  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Reliability Analysis of Electrotechnical Devices
Reliability Analysis of Electrotechnical Devices
Autore Tan Cher Ming
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (174 p.)
Soggetto topico History of engineering & technology
Technology: general issues
Soggetto non controllato 3D X-ray
3D-IC (three-dimensional integrated circuit)
BGA
bias temperature-humidity reliability test
conductive anodic filament (CAF)
de-penalization
deconvolution
deep space environment
elastic mechanical properties
electrochemistry based electrical model
electromagnetic interference
extreme thermal shocks
factorial design of experiment
finite element analysis
fracture failure
gamma process
GaN
genetic algorithm optimization
lifetime
lineal energy
linear energy transfer
low temperature
measurement system analysis
microdosimetry
Monte Carlo simulation
multiple-input multiple-output (MIMO)
n/a
near field measurement
operational amplifier
pressureless sintered micron silver joints
prompt gamma imaging
proton therapy
quality and reliability assurance
radiation hardness
reconstruction
reliability estimation
remaining useful life
return loss
SAC305
semi-empirical capacity fading model
simulation
single event effect
single event effects
state of health
useful life distribution
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910585945603321
Tan Cher Ming  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui