Image Processing Using FPGAs / Donald Bailey
| Image Processing Using FPGAs / Donald Bailey |
| Autore | Bailey Donald |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (204 p.) |
| Soggetto topico | Information technology industries |
| Soggetto non controllato |
nuclei detection
System-on-Chip FPGA K-Means hardware acceleration image analysis perceptual coding line buffer heterogeneous computing window filters processor architectures hardware accelerators stream processing embedded systems image processing pipeline image processing generalized Laplacian of Gaussian filter background estimation real-time systems FPGA implementation hardware architecture compression image borders memory zig-zag scan histopathology just-noticeable difference (JND) memory management downsampling image segmentation feature extraction design mean Shift clustering high-throughput segmentation streaming architecture power D-SWIM hardware/software co-design high-level synthesis contrast masking texture detection pipeline field programmable gate array (FPGA) JPEG-LS low-latency connected components analysis luminance masking field programmable gate arrays (FPGA) |
| ISBN |
9783038979197
3038979198 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910346693003321 |
Bailey Donald
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics / Paul Leroux
| Radiation Tolerant Electronics / Paul Leroux |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN |
9783039212804
303921280X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
Leroux Paul
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Lo trovi qui: Univ. Federico II | ||
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