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MEMS Packaging Technologies and 3D Integration
MEMS Packaging Technologies and 3D Integration
Autore Seok Seonho
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 electronic resource (210 p.)
Soggetto topico Research & information: general
Biology, life sciences
Soggetto non controllato heterogeneous integration
wafer bonding
wafer sealing
room-temperature bonding
Au-Au bonding
surface activated bonding
Au film thickness
surface roughness
microelectromechanical systems (MEMS) packaging
inkjet printing
redistribution layers
capacitive micromachined ultrasound transducers (CMUT)
fan-out wafer-level packaging (FOWLP)
adhesion
thin film metal
parylene
neural probe
scotch tape test
FEM
MEMS resonator
temperature coefficient
thermal stress
millimeter-wave
redundant TSV
equivalent circuit model
S-parameters extraction
technology evaluation
MEMS and IC integration
MCDM
fuzzy AHP
fuzzy VIKOR
fan-out wafer-level package
finite element
glass substrate
reliability life
packaging-on-packaging
thermal sensors
TMOS sensor
finite difference time domain
optical and electromagnetics simulations
finite element analysis
ultrasonic bonding
metal direct bonding
microsystem integration
biocompatible packaging
implantable
reliability
Finite element method (FEM)
simulation
multilayer reactive bonding
integrated nanostructure-multilayer reactive system
spontaneous self-ignition
self-propagating exothermic reaction
Pd/Al reactive multilayer system
Ni/Al reactive multilayer system
low-temperature MEMS packaging
crack propagation
microbump
deflection angle
stress intensity factor (SIF)
polymer packaging
neural interface
chronic implantation
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910576876203321
Seok Seonho  
MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Silicon Photonics Bloom
Silicon Photonics Bloom
Autore Boyraz Ozdal
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Descrizione fisica 1 electronic resource (184 p.)
Soggetto topico History of engineering & technology
Soggetto non controllato quantum dot
silicon nanocrystals
light emitting diode
vertical grating coupler
WDM transmitter
optical interconnects
silicon photonics
silicon optical modulator
Silicon Photonics
off-chip coupling
polarisation controller
integrated polarimeter
polarisation multiplexing
polarisation shift keying
germanium
integrated optics
optoelectronics
photoconductivity
terahertz
frequency combs
heterogeneous integration
second-harmonic generation
supercontinuum
integrated photonics
mode-locked lasers
nonlinear optics
microelectromechanical systems (MEMS)
electrostatic actuator
parallel plate actuation
optical switch
silicon-on-insulator (SOI)
micro-platform
optical waveguide
silicon nitride photonics
phase change material
integrated silicon photonic circuits
nanophononics
modulator
multimode interferometer
photonics integrated circuit
carrier plasma
Mach-Zehnder interferometers
silicon oxynitride
thin film
photoluminescence
chemical vapor deposition
physical vapor deposition
dispersion control
Bragg gratings
photonic processors
unitary transformation
amorphous silicon oxycarbide
nitrogen doping
defect
plasma enhanced chemical vapor deposition
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557287403321
Boyraz Ozdal  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Wide Bandgap Based Devices: Design, Fabrication and Applications, Volume II
Wide Bandgap Based Devices: Design, Fabrication and Applications, Volume II
Autore Verzellesi Giovanni
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 electronic resource (320 p.)
Soggetto topico Technology: general issues
History of engineering & technology
Energy industries & utilities
Soggetto non controllato energy storage system
power conditioning system
silicon carbide
vanadium redox flow batteries
AlGaN/GaN
SiC
high electron mobility transistor
Schottky barrier diode
breakdown field
noise
charge traps
radio frequency
wide-bandgap (WBG)
gallium nitride (GaN)
silicon carbide (SiC)
high electron mobility transistor (HEMT)
metal-oxide-semiconductor field effect transistor (MOSFET)
driving technology
nickel oxide
annealing temperature
crystallite size
optical band gap
electrochromic device
indium oxide thin film
solution method
plasma surface treatment
bias stability
aluminum nitride
Schottky barrier diodes
radio frequency sputtering
X-ray diffraction
X-ray photoelectron spectroscopy
piezoelectric micromachined ultrasonic transducers
ranging
time of flight (TOF)
time to digital converter circuit (TDC)
AlGaN/GaN heterojunction
p-GaN gate
unidirectional operation
rectifying electrode
first-principles
density functional theory
pure β-Ga2O3
Sr-doped β-Ga2O3
p-type doping
band structure
density of states
optical absorption
AlN buffer layer
NH3 growth interruption
strain relaxation
GaN-based LED
low defect density
gate bias modulation
palladium catalyst
gallium nitride
nitrogen dioxide gas sensor
laser micromachining
sapphire
AlGaN/GaN heterostructures
high-electron mobility devices
p-GaN gate HEMT
normally off
low-resistance SiC substrate
temperature
high electron-mobility transistor (HEMT)
equivalent-circuit modeling
microwave frequency
scattering-parameter measurements
GaN
MIS-HEMTs
fabrication
threshold voltage stability
supercritical technology
GaN power HEMTs
breakdown voltage
current collapse
compensation ratio
auto-compensation
carbon doping
HVPE
AlN
high-temperature
buffer layer
nitridation
high-electron mobility transistor
heterogeneous integration
SOI
QST
crystal growth
cubic and hexagonal structure
blue and yellow luminescence
electron lifetime
wafer dicing
stealth dicing
laser thermal separation
dry processing
laser processing
wide bandgap semiconductor
photovoltaic module
digital signal processor
synchronous buck converter
polar
semi-polar
non-polar
magnetron sputtering
HTA
GaN-HEMT mesa structures
2DEG
X-ray sensor
X-ray imaging
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Wide Bandgap Based Devices
Record Nr. UNINA-9910576886103321
Verzellesi Giovanni  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui