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Autopsy of a crime lab : exposing the flaws in forensics / / Brandon L. Garrett
| Autopsy of a crime lab : exposing the flaws in forensics / / Brandon L. Garrett |
| Autore | Garrett Brandon |
| Pubbl/distr/stampa | Oakland, California : , : University of California Press, , [2021] |
| Descrizione fisica | 1 online resource (252 pages) : illustrations |
| Disciplina | 345.064 |
| Soggetto topico | DNA fingerprinting - Law and legislation |
| Soggetto genere / forma | Electronic books. |
| Soggetto non controllato |
Error
FBI Wrongful convictions approachable arson investigations bite marks cases courtrooms crime scenes debunk error rates facial recognition software false positives faulty science fibers fingerprints forensic evidence guide laboratories law enforcement legal expert quality control rapid DNA machines regulations solutions statistics technologies |
| ISBN | 0-520-97663-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Frontmatter -- Contents -- Part I The Crisis in Forensics -- Introduction -- 1 The Bite Mark Case -- 2 The Crisis in Forensics -- Part II Flawed Forensics -- 3 False ID -- 4 Error Rates -- 5 Overstatement -- 6 Qualifications -- 7 Hidden Bias -- 8 The Gatekeepers -- Part III Failed Labs -- 9 Failed Quality Control -- 10 Crime Scene Contamination -- Part IV The Movement to Fix Forensics -- 11 The Rebirth of the Lab -- 12 Big Data Forensics -- 13 Fixing Forensics -- Acknowledgments -- Appendix Suggested Resources -- Notes -- Index |
| Record Nr. | UNINA-9910554254303321 |
Garrett Brandon
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| Oakland, California : , : University of California Press, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics
| Radiation Tolerant Electronics |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN | 3-03921-280-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
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Leroux Paul
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| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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