Electrochemical Performance and Stability of Ba?.?Sr?.?Co?.?Fe?.?O??? for Oxygen Transport Membranes |
Autore | Niedrig Christian |
Pubbl/distr/stampa | KIT Scientific Publishing, 2015 |
Descrizione fisica | 1 electronic resource (IV, 180 p. p.) |
Collana | Schriften des Instituts für Angewandte Materialien - Werkstoffe der Elektrotechnik, Karlsruher Institut für Technologie / Institut für Angewandte Materialien - Werkstoffe der Elektrotechnik |
Soggetto non controllato |
electrochemical characterization
thermische und chemische Stabilitätmixed ionic-electronic conductors oxygen transport membranes elektronische/ionische Mischleiter thermal and chemical stability Sauerstofftransportmembranen BSCF elektrochemische Charakterisierung |
ISBN | 1000049670 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910346776903321 |
Niedrig Christian
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KIT Scientific Publishing, 2015 | ||
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Lo trovi qui: Univ. Federico II | ||
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SiC based Miniaturized Devices |
Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
Descrizione fisica | 1 electronic resource (170 pages) |
Soggetto topico |
Engineering - History
Technology |
Soggetto non controllato |
high-power impulse magnetron sputtering (HiPIMS)
silicon carbide aluminum nitride thin film Rutherford backscattering spectrometry (RBS) grazing incidence X-ray diffraction (GIXRD) Raman spectroscopy 6H-SiC indentation deformation material removal mechanisms critical load 4H-SiC critical depth of cut Berkovich indenter cleavage strength nanoscratching power electronics high-temperature converters MEMS devices SiC power electronic devices neural interface neural probe neural implant microelectrode array MEA SiC 3C-SiC doped SiC n-type p-type amorphous SiC epitaxial growth electrochemical characterization MESFET simulation PAE bulk micromachining electrochemical etching circular membrane bulge test vibrometry mechanical properties Young's modulus residual stress FEM semiconductor radiation detector microstrip detector power module negative gate-source voltage spike 4H-SiC, epitaxial layer Schottky barrier radiation detector point defects deep level transient spectroscopy (DLTS) thermally stimulated current spectroscopy (TSC) electron beam induced current spectroscopy (EBIC) pulse height spectroscopy (PHS) |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910557498703321 |
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
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Lo trovi qui: Univ. Federico II | ||
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