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Electrochemical Performance and Stability of Ba?.?Sr?.?Co?.?Fe?.?O??? for Oxygen Transport Membranes
| Electrochemical Performance and Stability of Ba?.?Sr?.?Co?.?Fe?.?O??? for Oxygen Transport Membranes |
| Autore | Niedrig Christian |
| Pubbl/distr/stampa | KIT Scientific Publishing, 2015 |
| Descrizione fisica | 1 online resource (IV, 180 p. p.) |
| Collana | Schriften des Instituts für Angewandte Materialien - Werkstoffe der Elektrotechnik, Karlsruher Institut für Technologie / Institut für Angewandte Materialien - Werkstoffe der Elektrotechnik |
| Soggetto topico | Technology: general issues |
| Soggetto non controllato |
BSCF
electrochemical characterization elektrochemische Charakterisierung elektronische/ionische Mischleiter oxygen transport membranes Sauerstofftransportmembranen thermal and chemical stability thermische und chemische Stabilitätmixed ionic-electronic conductors |
| ISBN | 1000049670 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910346776903321 |
Niedrig Christian
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| KIT Scientific Publishing, 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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SiC based Miniaturized Devices
| SiC based Miniaturized Devices |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 online resource (170 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
3C-SiC
4H-SiC 4H-SiC, epitaxial layer 6H-SiC aluminum nitride amorphous SiC Berkovich indenter bulge test bulk micromachining circular membrane cleavage strength critical depth of cut critical load deep level transient spectroscopy (DLTS) deformation doped SiC electrochemical characterization electrochemical etching electron beam induced current spectroscopy (EBIC) epitaxial growth FEM grazing incidence X-ray diffraction (GIXRD) high-power impulse magnetron sputtering (HiPIMS) high-temperature converters indentation material removal mechanisms MEA mechanical properties MEMS devices MESFET microelectrode array microstrip detector n-type n/a nanoscratching negative gate-source voltage spike neural implant neural interface neural probe p-type PAE point defects power electronics power module pulse height spectroscopy (PHS) radiation detector Raman spectroscopy residual stress Rutherford backscattering spectrometry (RBS) Schottky barrier semiconductor radiation detector SiC SiC power electronic devices silicon carbide simulation thermally stimulated current spectroscopy (TSC) thin film vibrometry Young's modulus |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557498703321 |
| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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