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Computational Methods for Fatigue and Fracture
Computational Methods for Fatigue and Fracture
Autore Branco Ricardo
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 electronic resource (144 p.)
Soggetto topico Technology: general issues
History of engineering & technology
Soggetto non controllato finite element method
Taguchi method
tooth surface contact stress
tooth profile deviations
meshing errors
lead crowning modifications
critical load
fracture
tubular cantilever beam
U-notch
theory of critical distances
LEFM
mesh density
mixed mode stress intensity factors
fatigue crack growth
FEM
fatigue failure
design flaws
mechanical system
parametric ALT
hinge kit system
XFEM
ANSYS mechanical
smart crack growth
stress intensity factors
fatigue life prediction
gears
Single Tooth Bending Fatigue
STBF
Finite Element Model
material characterization
multiaxial fatigue
critical plane
metal casting
mold design
simulation
optimization
fatigue life
reliability
ISBN 3-0365-5300-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910619470603321
Branco Ricardo  
MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
SiC based Miniaturized Devices
SiC based Miniaturized Devices
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Descrizione fisica 1 electronic resource (170 pages)
Soggetto topico Engineering - History
Technology
Soggetto non controllato high-power impulse magnetron sputtering (HiPIMS)
silicon carbide
aluminum nitride
thin film
Rutherford backscattering spectrometry (RBS)
grazing incidence X-ray diffraction (GIXRD)
Raman spectroscopy
6H-SiC
indentation
deformation
material removal mechanisms
critical load
4H-SiC
critical depth of cut
Berkovich indenter
cleavage strength
nanoscratching
power electronics
high-temperature converters
MEMS devices
SiC power electronic devices
neural interface
neural probe
neural implant
microelectrode array
MEA
SiC
3C-SiC
doped SiC
n-type
p-type
amorphous SiC
epitaxial growth
electrochemical characterization
MESFET
simulation
PAE
bulk micromachining
electrochemical etching
circular membrane
bulge test
vibrometry
mechanical properties
Young's modulus
residual stress
FEM
semiconductor radiation detector
microstrip detector
power module
negative gate-source voltage spike
4H-SiC, epitaxial layer
Schottky barrier
radiation detector
point defects
deep level transient spectroscopy (DLTS)
thermally stimulated current spectroscopy (TSC)
electron beam induced current spectroscopy (EBIC)
pulse height spectroscopy (PHS)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557498703321
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui