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Computational Methods for Fatigue and Fracture
| Computational Methods for Fatigue and Fracture |
| Autore | Branco Ricardo |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
| Descrizione fisica | 1 online resource (144 p.) |
| Soggetto topico |
History of engineering & technology
Technology: general issues |
| Soggetto non controllato |
ANSYS mechanical
critical load critical plane design flaws fatigue crack growth fatigue failure fatigue life fatigue life prediction FEM finite element method Finite Element Model fracture gears hinge kit system lead crowning modifications LEFM material characterization mechanical system mesh density meshing errors metal casting mixed mode stress intensity factors mold design multiaxial fatigue n/a optimization parametric ALT reliability simulation Single Tooth Bending Fatigue smart crack growth STBF stress intensity factors Taguchi method theory of critical distances tooth profile deviations tooth surface contact stress tubular cantilever beam U-notch XFEM |
| ISBN | 3-0365-5300-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910619470603321 |
Branco Ricardo
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| MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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SiC based Miniaturized Devices
| SiC based Miniaturized Devices |
| Pubbl/distr/stampa | Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
| Descrizione fisica | 1 online resource (170 p.) |
| Soggetto topico | History of engineering and technology |
| Soggetto non controllato |
3C-SiC
4H-SiC 4H-SiC, epitaxial layer 6H-SiC aluminum nitride amorphous SiC Berkovich indenter bulge test bulk micromachining circular membrane cleavage strength critical depth of cut critical load deep level transient spectroscopy (DLTS) deformation doped SiC electrochemical characterization electrochemical etching electron beam induced current spectroscopy (EBIC) epitaxial growth FEM grazing incidence X-ray diffraction (GIXRD) high-power impulse magnetron sputtering (HiPIMS) high-temperature converters indentation material removal mechanisms MEA mechanical properties MEMS devices MESFET microelectrode array microstrip detector n-type n/a nanoscratching negative gate-source voltage spike neural implant neural interface neural probe p-type PAE point defects power electronics power module pulse height spectroscopy (PHS) radiation detector Raman spectroscopy residual stress Rutherford backscattering spectrometry (RBS) Schottky barrier semiconductor radiation detector SiC SiC power electronic devices silicon carbide simulation thermally stimulated current spectroscopy (TSC) thin film vibrometry Young's modulus |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910557498703321 |
| Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||