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Miniaturized Transistors, Volume II
Miniaturized Transistors, Volume II
Autore Filipovic Lado
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (352 p.)
Soggetto topico Mathematics & science
Research & information: general
Soggetto non controllato 1200 V SiC MOSFET
2D hole gas (2DHG)
4H-SiC
4H-SiC MESFET
active layers
active noise control
AlGaN/GaN HEMTs
avalanche photodiode
average subthreshold swing
band-to-band tunnelling (BTBT)
bandwidth
bias temperature instabilities (BTI)
body diode
circuit design
CMOS
CMOS compatible technology
CMOS device
compact circuit style
confinement effective mass
control gate
core-insulator
defects
device processing
device reliability
DGSOI
diamond
dielectrics
direct source-to-drain tunneling
electron trapping
F-N plot
field effect transistor
field emission
FinFET
FinFETs
flexible transistors
floating gate transistor
GAA
GaN
gate structures
gate-all-around
germanium-around-source gate-all-around TFET (GAS GAA TFET)
grain boundary
HEMT
high gate
high responsivity
IMRD structure
integrated circuits
Landauer-Büttiker formalism
mean free path
MESFET
metal oxides
MoO3
mosfet
MOSFET
multi-recessed buffer
multi-subband ensemble Monte Carlo
multiple epitaxial layers
n/a
nanocomposites
nanoscale
nanoscale transistor
nanotransistor
nanowire
new device
non-equilibrium Green's function
non-radiative multiphonon (NMP) model
one-transistor dynamic random-access memory (1T-DRAM)
oxide defects
particle trajectory model
polymers
polysilicon
power added efficiency
power added efficiency (PAE)
power density
power-added efficiency
prototype
pulse width
quantum current
quantum transport
R-matrix method
random telegraph noise
reliability
silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs)
silicon photodiode
silvaco simulation
simulation
single-defect spectroscopy
SiO2
solid state circuit breaker (SSCB)
space-charge-limited currents
specific on-resistance
SPICE model
split-gate trench power MOSFET
surface transfer doping
surge reliability
T-channel
thermal simulation
three-input transistor
time-dependent defect spectroscopy
transient channel temperature
transport effective mass
tunnelling field-effect transistor (TFET)
V2O5
vacuum channel
vertical air-channel diode
vertical transistor
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910580205803321
Filipovic Lado  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
New Indicators for the Assessment and Prevention of Noise Nuisance
New Indicators for the Assessment and Prevention of Noise Nuisance
Autore Fredianelli Luca
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 electronic resource (170 p.)
Soggetto topico Technology: general issues
History of engineering & technology
Soggetto non controllato sound emergence
legislation
annoyance
measurement
prediction
uncertainty
audibility
signal-to-noise ratio
sound pressure level
field measurements
spectrum analysis
interior noise and vibration of vehicle
COVID-19
noise
soundscape
metrics
indicators
descriptors
sound
lockdown
Twitter
geolocation
noise classification
seafarers
acoustic pollution
noise onboard ship
health impact
environmental pollution
noise survey
hypertension
environmental noise
railway noise
recreational noise
airport noise
road traffic noise
blood pressure
noise annoyance
diastolic blood pressure
helicopter cabin
noise levels
noise reduction
acoustic evaluation
IAR Puma 330
ultrasound
active noise control
adjustable PAL
quiet areas
macro-temporal pattern
noise indicator
cognitive performance
Stroop task
listening experiment
port noise
noise sources
noise mapping
noise mitigations
noise modeling
ship noise
sustainable management
noise exposure prevention
noise measurements
research projects
noise indicators
noise metrics
psychoacoustic
nuisance
sleep disturbance
peak noise
impulsive events
health related quality of life
health effects
ISBN 3-0365-5740-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910637791903321
Fredianelli Luca  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui