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Advanced Computing in Electron Microscopy / Earl J. Kirkland
| Advanced Computing in Electron Microscopy / Earl J. Kirkland |
| Autore | Kirkland, Earl J. |
| Edizione | [3. ed] |
| Pubbl/distr/stampa | Cham, : Springer, 2020 |
| Descrizione fisica | xii, 354 p. : ill. ; 24 cm |
| Soggetto topico |
78-XX - Optics, electromagnetic theory [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] 94A08 - Image processing (compression, reconstruction, etc.) in information and communication theory [MSC 2020] |
| Soggetto non controllato |
ABF imaging
Biological Microscopy Fast Fourier Transform Fast Fourier projection theorem Image interpretation Multislice methods Parallel image processing Scanning transmission electron microscope Theory of electron image formation Transmission Electron Microscopy |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0225518 |
Kirkland, Earl J.
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| Cham, : Springer, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Advanced Computing in Electron Microscopy / Earl J. Kirkland
| Advanced Computing in Electron Microscopy / Earl J. Kirkland |
| Autore | Kirkland, Earl J. |
| Edizione | [3. ed] |
| Pubbl/distr/stampa | Cham, : Springer, 2020 |
| Descrizione fisica | xii, 354 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] 94A08 - Image processing (compression, reconstruction, etc.) in information and communication theory [MSC 2020] |
| Soggetto non controllato |
ABF imaging
Biological Microscopy Fast Fourier Transform Fast Fourier projection theorem Image interpretation Multislice methods Parallel image processing Scanning transmission electron microscope Theory of electron image formation Transmission Electron Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00225518 |
|
Kirkland, Earl J.
|
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| Cham, : Springer, 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Material Characterization Techniques and Applications / Euth Ortiz Ortega ... [et al.]
| Material Characterization Techniques and Applications / Euth Ortiz Ortega ... [et al.] |
| Pubbl/distr/stampa | Singapore, : Springer, 2022 |
| Descrizione fisica | xv, 305 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] |
| Soggetto non controllato |
Atomic Force Microscopy
DRIFT Spectroscopy Electrochemical Impedance Spectroscopy Fourier-transform Infrared spectroscopy High-Performance Liquid Chromatography MALDI-TOF Spectrometry Optical Microscopy Raman spectroscopy Scanning Electron Microscopy Thermal gravimetric analysis Transmission Electron Microscopy Wettability Analysis X-Ray Photoelectron Spectroscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN00284168 |
| Singapore, : Springer, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors]
| Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors] |
| Pubbl/distr/stampa | Singapore, : Springer ; Beijing, : Peking University Press, 2018 |
| Descrizione fisica | vii, 508 p. : ill. ; 24 cm |
| Soggetto topico |
00Bxx - Conference proceedings and collections of articles [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] 81V35 - Nuclear physics [MSC 2020] |
| Soggetto non controllato |
Aberration Corrected Transmission Electron Microscopy
Charged-particle microscopy Electron Microanalysis Electron/Ion Optics Helium Ion Microscopy In situ TEM Scanning Electron Microscopy Transmission Electron Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0212761 |
| Singapore, : Springer ; Beijing, : Peking University Press, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors]
| Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors] |
| Pubbl/distr/stampa | Singapore, : Springer ; Beijing, : Peking University Press, 2018 |
| Descrizione fisica | vii, 508 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
00Bxx - Conference proceedings and collections of articles [MSC 2020] 81V35 - Nuclear physics [MSC 2020] |
| Soggetto non controllato |
Aberration Corrected Transmission Electron Microscopy
Charged-particle microscopy Electron Microanalysis Electron/Ion Optics Helium Ion Microscopy In situ TEM Scanning Electron Microscopy Transmission Electron Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00212761 |
| Singapore, : Springer ; Beijing, : Peking University Press, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||