Analysis of Charge Transport : A Mathematical Study of Semiconductor Devices / Joseph W. Jerome

• Autore: Jerome, Joseph W.
• Pubblicazione: Berlin ; Heidelberg, : Springer, 1996
• Descrizione fisica: xi, 167 p. ; 24 cm
• Soggetto topico: 35J65 - Nonlinear boundary value problems for linear elliptic equations [MSC 2020]; 35Q60 - PDEs in connection with optics and electromagnetic theory [MSC 2020]; 65-XX - Numerical analysis [MSC 2020]; 65M12 - Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs [MSC 2020]; 65M60 - Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs [MSC 2020]; 65Zxx - Applications to the sciences [MSC 2020]; 78A35 - Motion of charged particles [MSC 2020]; 78A55 - Technical applications of optics and electromagnetic theory [MSC 2020]
• Soggetto non controllato: Boltzmann transport equations; Boltzmann transport models; Calculus; Deviation-diffusion systems; Differential equations; Drift-diffusion systems; Energy; Energy transport models; Finite element methods; Gummel iteration; Inf-sup theory Linearization; Mixed boundary value problems; Nonlinear finite element convergence theory; Numerical fixed point maps; Scharfetter-Gummel discretization; System decoupling; Transistor
• Titolo autorizzato: Analysis of Charge Transport
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: VAN00295923
• Lo trovi qui: Univ. Vanvitelli
• Localizzazioni e accesso elettronico: https://doi.org/10.1007/978-3-642-79987-7