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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach : Doctoral Thesis accepted by Lancaster University, Lancashire, England / Nicholas D. Kay
| Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach : Doctoral Thesis accepted by Lancaster University, Lancashire, England / Nicholas D. Kay |
| Autore | Kay, Nicholas D. |
| Pubbl/distr/stampa | Cham, : Springer, 2018 |
| Descrizione fisica | xxi, 122 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
74K35 - Thin films [MSC 2020] 74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] |
| Soggetto non controllato |
2D Crystals
2D Nanoelectromechanical Properties Atomic Force Microscopy Heterodyne Force Microscopy Nano Electromechanical Resonator Nano-Mechanics Nanoelectromechanical Properties of 2D Materials Subsurface Mechanical Properties Ultrasonic Force Microscopy |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0211460 |
Kay, Nicholas D.
|
||
| Cham, : Springer, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach : Doctoral Thesis accepted by Lancaster University, Lancashire, England / Nicholas D. Kay
| Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach : Doctoral Thesis accepted by Lancaster University, Lancashire, England / Nicholas D. Kay |
| Autore | Kay, Nicholas D. |
| Pubbl/distr/stampa | Cham, : Springer, 2018 |
| Descrizione fisica | xxi, 122 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] 74K35 - Thin films [MSC 2020] |
| Soggetto non controllato |
2D Crystals
2D Nanoelectromechanical Properties Atomic Force Microscopy Heterodyne Force Microscopy Nano Electromechanical Resonator Nano-Mechanics Nanoelectromechanical Properties of 2D Materials Subsurface Mechanical Properties Ultrasonic Force Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00211460 |
|
Kay, Nicholas D.
|
||
| Cham, : Springer, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||