Computational Methods for Fatigue and Fracture

• Autore: Branco Ricardo
• Pubblicazione: MDPI - Multidisciplinary Digital Publishing Institute, 2022
• Descrizione fisica: 1 online resource (144 p.)
• Soggetto topico: History of engineering & technology; Technology: general issues
• Soggetto non controllato: ANSYS mechanical; critical load; critical plane; design flaws; fatigue crack growth; fatigue failure; fatigue life; fatigue life prediction; FEM; finite element method; Finite Element Model; fracture; gears; hinge kit system; lead crowning modifications; LEFM; material characterization; mechanical system; mesh density; meshing errors; metal casting; mixed mode stress intensity factors; mold design; multiaxial fatigue; n/a; optimization; parametric ALT; reliability; simulation; Single Tooth Bending Fatigue; smart crack growth; STBF; stress intensity factors; Taguchi method; theory of critical distances; tooth profile deviations; tooth surface contact stress; tubular cantilever beam; U-notch; XFEM
• Persona (resp. second.): BertoFilippo; WuShengchuan; BrancoRicardo
• Sommario/riassunto: The development of modern numerical methods has led to significant advances in the field of fatigue and fracture, which are pivotal issues in structural integrity. Because of the permanent tendency to shorten time-to-market periods and the development cost, the use of the finite element method, extended finite element method, peridynamics, or meshless methods, among others, has represented a viable alternative to experimental methods. This Special Issue aims to focus on the new trends in computational methods to address fatigue and fracture problems. Research on innovative and successful industrial applications as well as on nonconventional numerical approaches is also addressed.
• Titolo autorizzato: Computational Methods for Fatigue and Fracture
• ISBN: 3-0365-5300-2
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910619470603321
• Lo trovi qui: Univ. Federico II