top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.
Filter Design Solutions for RF systems
Filter Design Solutions for RF systems
Autore Stornelli Vincenzo
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Descrizione fisica 1 online resource (186 p.)
Soggetto topico History of engineering and technology
Soggetto non controllato active filters
active inductor
additive manufacturing
analogue-to-digital conversion
anti-aliasing filters
anti-interference filter
ATHOS soft X-ray beamline
bandpass filter
broadband noise
conducted disturbances
current mode
defected ground structure (DGS)
dielectric properties
digital light processing
filter
finFET
hairpin resonator
Hall probe
HBT
inductorless
internal coupling
low-pass filter (LPF)
low-pass filters
low-voltage
microwave dielectric ceramics
MMIC
offset fluctuation and drift
operational amplifier
phase noise
post annealing
power line communication (PLC)
quarter wavelength
SiGe
SIMO filter
smart home
stepped impedance resonator
stepped impedance resonator (SIR)
stepped-impedance resonator (SIR)
stub-loaded
switched-capacitor filters
three-axis teslameter
total harmonic distortion
tunable filters
ultra-wideband
undulator
unity-gain bandwidth
universal filter
varactor
VCII
voltage conveyor
voltage-controlled oscillator
wideband
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557768003321
Stornelli Vincenzo  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond : Doctoral Thesis accepted by Chinese Academy of Sciences, Beijing, China / Guilei Wang
Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond : Doctoral Thesis accepted by Chinese Academy of Sciences, Beijing, China / Guilei Wang
Autore Wang, Guilei
Pubbl/distr/stampa Singapore, : Springer, 2019
Descrizione fisica xvi, 115 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
Soggetto non controllato Pattern dependency
RPCVD
Selective epitaxy
SiGe
Source/drain technology
Strain
Technology nodes
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0219614
Wang, Guilei  
Singapore, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond : Doctoral Thesis accepted by Chinese Academy of Sciences, Beijing, China / Guilei Wang
Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond : Doctoral Thesis accepted by Chinese Academy of Sciences, Beijing, China / Guilei Wang
Autore Wang, Guilei
Pubbl/distr/stampa Singapore, : Springer, 2019
Descrizione fisica xvi, 115 p. : ill. ; 24 cm
Soggetto topico 00A79 (77-XX) - Physics [MSC 2020]
Soggetto non controllato Pattern dependency
RPCVD
Selective epitaxy
SiGe
Source/drain technology
Strain
Technology nodes
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00219614
Wang, Guilei  
Singapore, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Miniaturized Transistors / Lado Filipovic, Tibor Grasser
Autore Filipovic Lado
Pubbl/distr/stampa MDPI - Multidisciplinary Digital Publishing Institute, 2019
Descrizione fisica 1 electronic resource (202 p.)
Soggetto topico History of engineering and technology
Soggetto non controllato MOSFET
total ionizing dose (TID)
low power consumption
process simulation
two-dimensional material
negative-capacitance
power consumption
technology computer aided design (TCAD)
thin-film transistors (TFTs)
band-to-band tunneling (BTBT)
nanowires
inversion channel
metal oxide semiconductor field effect transistor (MOSFET)
spike-timing-dependent plasticity (STDP)
field effect transistor
segregation
systematic variations
Sentaurus TCAD
indium selenide
nanosheets
technology computer-aided design (TCAD)
high-? dielectric
subthreshold bias range
statistical variations
fin field effect transistor (FinFET)
compact models
non-equilibrium Green's function
etching simulation
highly miniaturized transistor structure
compact model
silicon nanowire
surface potential
Silicon-Germanium source/drain (SiGe S/D)
nanowire
plasma-aided molecular beam epitaxy (MBE)
phonon scattering
mobility
silicon-on-insulator
drain engineered
device simulation
variability
semi-floating gate
synaptic transistor
neuromorphic system
theoretical model
CMOS
ferroelectrics
tunnel field-effect transistor (TFET)
SiGe
metal gate granularity
buried channel
ON-state
bulk NMOS devices
ambipolar
piezoelectrics
tunnel field effect transistor (TFET)
FinFETs
polarization
field-effect transistor
line edge roughness
random discrete dopants
radiation hardened by design (RHBD)
low energy
flux calculation
doping incorporation
low voltage
topography simulation
MOS devices
low-frequency noise
high-k
layout
level set
process variations
subthreshold
metal gate stack
electrostatic discharge (ESD)
ISBN 9783039210114
3039210114
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910346680003321
Filipovic Lado  
MDPI - Multidisciplinary Digital Publishing Institute, 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui