Info
Material Characterization Techniques and Applications / Euth Ortiz Ortega ... [et al.]
| Material Characterization Techniques and Applications / Euth Ortiz Ortega ... [et al.] |
| Pubbl/distr/stampa | Singapore, : Springer, 2022 |
| Descrizione fisica | xv, 305 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] |
| Soggetto non controllato |
Atomic Force Microscopy
DRIFT Spectroscopy Electrochemical Impedance Spectroscopy Fourier-transform Infrared spectroscopy High-Performance Liquid Chromatography MALDI-TOF Spectrometry Optical Microscopy Raman spectroscopy Scanning Electron Microscopy Thermal gravimetric analysis Transmission Electron Microscopy Wettability Analysis X-Ray Photoelectron Spectroscopy |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN00284168 |
| Singapore, : Springer, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM) / Debbie J Stokes
| Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM) / Debbie J Stokes |
| Autore | Stokes, Debbie J |
| Pubbl/distr/stampa | Chichester : Wiley, c2008 |
| Descrizione fisica | XII,221 p. : ill. ; 24 cm |
| Soggetto non controllato | Scanning Electron Microscopy |
| ISBN | 978-0-470-06540-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990009750400403321 |
Stokes, Debbie J
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| Chichester : Wiley, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors]
| Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors] |
| Pubbl/distr/stampa | Singapore, : Springer ; Beijing, : Peking University Press, 2018 |
| Descrizione fisica | vii, 508 p. : ill. ; 24 cm |
| Soggetto topico |
00Bxx - Conference proceedings and collections of articles [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] 81V35 - Nuclear physics [MSC 2020] |
| Soggetto non controllato |
Aberration Corrected Transmission Electron Microscopy
Charged-particle microscopy Electron Microanalysis Electron/Ion Optics Helium Ion Microscopy In situ TEM Scanning Electron Microscopy Transmission Electron Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0212761 |
| Singapore, : Springer ; Beijing, : Peking University Press, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors]
| Progress in Nanoscale Characterization and Manipulation / Rongming Wang … [et al.] editors] |
| Pubbl/distr/stampa | Singapore, : Springer ; Beijing, : Peking University Press, 2018 |
| Descrizione fisica | vii, 508 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
00Bxx - Conference proceedings and collections of articles [MSC 2020] 81V35 - Nuclear physics [MSC 2020] |
| Soggetto non controllato |
Aberration Corrected Transmission Electron Microscopy
Charged-particle microscopy Electron Microanalysis Electron/Ion Optics Helium Ion Microscopy In situ TEM Scanning Electron Microscopy Transmission Electron Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00212761 |
| Singapore, : Springer ; Beijing, : Peking University Press, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
The Effect of Layer Orientation on the Fatigue Behavior of 3D Printed PLA Samples / Fawaz Aladwani ... [et al.]
| The Effect of Layer Orientation on the Fatigue Behavior of 3D Printed PLA Samples / Fawaz Aladwani ... [et al.] |
| Pubbl/distr/stampa | Cham, : Springer, 2023 |
| Descrizione fisica | v, 48 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
74-XX - Mechanics of deformable solids [MSC 2020] |
| Soggetto non controllato |
Additive manufacturing
Bending tests Fiber Orientation Izod tests Modified ductile concentric orientation Optical Microscopy Phantom ultra-high-speed camera images Rotating beam fatigue Scanning Electron Microscopy Tensile tests |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN00286303 |
| Cham, : Springer, 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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