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Statistical Quality Technologies : Theory and Practice / Yuhlong Lio … [et al.] editors]
| Statistical Quality Technologies : Theory and Practice / Yuhlong Lio … [et al.] editors] |
| Pubbl/distr/stampa | Cham, : Springer, 2019 |
| Descrizione fisica | xix, 402 p. : ill. ; 24 cm |
| Soggetto topico |
62-XX - Statistics [MSC 2020]
62Nxx - Survival analysis and censored data [MSC 2020] 62P30 - Applications of statistics in engineering and industry; control charts [MSC 2020] |
| Soggetto non controllato |
Acceptance Sampling Plans
Average Run Length Bayesian Sampling Plan Cumulative Sum Chart Degradation Data Analysis Economical Sampling Plans Exponentially Weighted Moving Average Control Chart Industrial Statistics Multiple Deferred State Sampling Plan Nonparametric Control Chart Process capability index Reliability Testing Sequential Design Statistical System Monitoring (SSM) Statistical process control |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0127165 |
| Cham, : Springer, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Statistical Quality Technologies : Theory and Practice / Yuhlong Lio … [et al.] editors]
| Statistical Quality Technologies : Theory and Practice / Yuhlong Lio … [et al.] editors] |
| Pubbl/distr/stampa | Cham, : Springer, 2019 |
| Descrizione fisica | xix, 402 p. : ill. ; 24 cm |
| Soggetto topico |
62-XX - Statistics [MSC 2020]
62Nxx - Survival analysis and censored data [MSC 2020] 62P30 - Applications of statistics in engineering and industry; control charts [MSC 2020] |
| Soggetto non controllato |
Acceptance Sampling Plans
Average Run Length Bayesian Sampling Plan Cumulative Sum Chart Degradation Data Analysis Economical Sampling Plans Exponentially Weighted Moving Average Control Chart Industrial Statistics Multiple Deferred State Sampling Plan Nonparametric Control Chart Process capability index Reliability Testing Sequential Design Statistical System Monitoring (SSM) Statistical process control |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00127165 |
| Cham, : Springer, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Theory and Practice of Thermal Transient Testing of Electronic Components / Marta Rencz, Gábor Farkas, András Poppe editors
| Theory and Practice of Thermal Transient Testing of Electronic Components / Marta Rencz, Gábor Farkas, András Poppe editors |
| Pubbl/distr/stampa | Cham, : Springer, 2022 |
| Descrizione fisica | ix, 385 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] 94-XX - Information and communication theory, circuits [MSC 2020] |
| Soggetto non controllato |
Bipolar transistors
Capacitors IGBT devices MOS transistors Reliability Testing Resistors Si diodes Structure integrity testing Thermal characterization Thermal testing Thermal transient testing Wide bandgap materials |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN00283898 |
| Cham, : Springer, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||