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Applications of General Relativity : With Problems / Philippe Jetzer
Applications of General Relativity : With Problems / Philippe Jetzer
Autore Jetzer, Philippe
Pubbl/distr/stampa Cham, : Springer, 2022
Descrizione fisica xiii, 195 p. : ill. ; 24 cm
Soggetto non controllato Geodetic Precession
Hawking Radiation
Laws of Black Hole Dynamics
Lense-Thirring Effect
Post-Newtonian approximation
Sources of Gravitational Waves
Spinors in Curved Spacetime
Tests of general relativity
Time Delay of Radar Echoes
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN00283366
Jetzer, Philippe  
Cham, : Springer, 2022
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
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Applied General Relativity : Theory and Applications in Astronomy, Celestial Mechanics and Metrology / Michael H. Soffel, Wen-Biao Han
Applied General Relativity : Theory and Applications in Astronomy, Celestial Mechanics and Metrology / Michael H. Soffel, Wen-Biao Han
Autore Soffel, Michael H.
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xx, 538 p. : ill. ; 24 cm
Altri autori (Persone) Han, Wen-Biao
Soggetto topico 70-XX - Mechanics of particles and systems [MSC 2020]
83-XX - Relativity and gravitational theory [MSC 2020]
85-XX - Astronomy and Astrophysics [MSC 2020]
83Bxx - Observational and experimental questions in relativity and gravitational theory [MSC 2020]
Soggetto non controllato Multipolar- post-Minkowskian approximation
Post-Newtonian approximation
Pulsar Timing
Relativistic astrometry
Relativistic celestial mechanics
Relativistic metrology
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0214494
Soffel, Michael H.  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Applied General Relativity : Theory and Applications in Astronomy, Celestial Mechanics and Metrology / Michael H. Soffel, Wen-Biao Han
Applied General Relativity : Theory and Applications in Astronomy, Celestial Mechanics and Metrology / Michael H. Soffel, Wen-Biao Han
Autore Soffel, Michael H.
Pubbl/distr/stampa Cham, : Springer, 2019
Descrizione fisica xx, 538 p. : ill. ; 24 cm
Altri autori (Persone) Han, Wen-Biao
Soggetto topico 70-XX - Mechanics of particles and systems [MSC 2020]
83-XX - Relativity and gravitational theory [MSC 2020]
83Bxx - Observational and experimental questions in relativity and gravitational theory [MSC 2020]
85-XX - Astronomy and Astrophysics [MSC 2020]
Soggetto non controllato Multipolar- post-Minkowskian approximation
Post-Newtonian approximation
Pulsar Timing
Relativistic astrometry
Relativistic celestial mechanics
Relativistic metrology
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00214494
Soffel, Michael H.  
Cham, : Springer, 2019
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
General Relativistic and Post-Newtonian Dynamics for Near-Earth Objects and Solar System Bodies : Doctoral Thesis accepted by University of South Australia, Adelaide, Australia / Joseph O’Leary
General Relativistic and Post-Newtonian Dynamics for Near-Earth Objects and Solar System Bodies : Doctoral Thesis accepted by University of South Australia, Adelaide, Australia / Joseph O’Leary
Autore O’Leary, Joseph
Pubbl/distr/stampa Cham, : Springer, 2021
Descrizione fisica xvii, 102 p. : ill. ; 24 cm
Soggetto topico 37-XX - Dynamical systems and ergodic theory [MSC 2020]
70-XX - Mechanics of particles and systems [MSC 2020]
83-XX - Relativity and gravitational theory [MSC 2020]
85-XX - Astronomy and Astrophysics [MSC 2020]
Soggetto non controllato General Relativity
Orbital dynamics
Post-Newtonian approximation
Relativistic Orbitography
Relativistic celestial mechanics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN00282504
O’Leary, Joseph  
Cham, : Springer, 2021
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui