Electronic Processes in Organic Electronics : Bridging Nanostructure, Electronic States and Device Properties / Hisao Ishii … [et al.] editors] |
Pubbl/distr/stampa | Tokyo, : Springer, 2015 |
Descrizione fisica | xiii, 432 p. : ill. ; 24 cm |
Soggetto topico | 00A79 (77-XX) - Physics [MSC 2020] |
Soggetto non controllato |
Diffusion of Metal Atom
Electronic Structure Interface and Energy Level Alignment Organic Device Photoelectron Spectroscopy |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN0133949 |
Tokyo, : Springer, 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Electronic Processes in Organic Electronics : Bridging Nanostructure, Electronic States and Device Properties / Hisao Ishii … [et al.] editors] |
Pubbl/distr/stampa | Tokyo, : Springer, 2015 |
Descrizione fisica | xiii, 432 p. : ill. ; 24 cm |
Soggetto topico | 00A79 (77-XX) - Physics [MSC 2020] |
Soggetto non controllato |
Diffusion of Metal Atom
Electronic Structure Interface and Energy Level Alignment Organic Device Photoelectron Spectroscopy |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN00133949 |
Tokyo, : Springer, 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Energy-Level Control at Hybrid Inorganic/Organic Semiconductor Interfaces : Doctoral Thesis accepted by the Humboldt University of Berlin, Germany / Raphael Schlesinger |
Autore | Schlesinger, Raphael |
Pubbl/distr/stampa | Cham, : Springer, 2017 |
Descrizione fisica | xviii, 211 p. : ill. ; 24 cm |
Soggetto topico |
78-XX - Optics, electromagnetic theory [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] 74K35 - Thin films [MSC 2020] 74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] |
Soggetto non controllato |
Adsorption–induced Band Bending
Gap State Density Hybrid Inorganic Organic Systems HIOS Interface Energy-level Alignment Interlayer Method Photoelectron Spectroscopy Work Function Tuning Zinc Oxide Organic Hybrid Semiconductor |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN0184649 |
Schlesinger, Raphael | ||
Cham, : Springer, 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Energy-Level Control at Hybrid Inorganic/Organic Semiconductor Interfaces : Doctoral Thesis accepted by the Humboldt University of Berlin, Germany / Raphael Schlesinger |
Autore | Schlesinger, Raphael |
Pubbl/distr/stampa | Cham, : Springer, 2017 |
Descrizione fisica | xviii, 211 p. : ill. ; 24 cm |
Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] 74K35 - Thin films [MSC 2020] 78-XX - Optics, electromagnetic theory [MSC 2020] |
Soggetto non controllato |
Adsorption–induced Band Bending
Gap State Density Hybrid Inorganic Organic Systems HIOS Interface Energy-level Alignment Interlayer Method Photoelectron Spectroscopy Work Function Tuning Zinc Oxide Organic Hybrid Semiconductor |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN00184649 |
Schlesinger, Raphael | ||
Cham, : Springer, 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
In-situ Materials Characterization : across Spatial and Temporal Scales / Alexander Ziegler … [et al.] editors] |
Pubbl/distr/stampa | Berlin, : Springer, 2014 |
Descrizione fisica | xi, 256 p. : ill. ; 24 cm |
Soggetto topico |
82-XX - Statistical mechanics, structure of matter [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] 82D80 - Statistical mechanical studies of nanostructures and nanoparticles [MSC 2020] |
Soggetto non controllato |
In-situ characterization
Material dynamics Nanoanalysis Nanoscale materials Neutron Scattering Photoelectron Spectroscopy Scanning probe techniques Structure-property Ultra-fast analysis X-ray Absorption Spectroscopy |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN0133235 |
Berlin, : Springer, 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
In-situ Materials Characterization : across Spatial and Temporal Scales / Alexander Ziegler … [et al.] editors] |
Pubbl/distr/stampa | Berlin, : Springer, 2014 |
Descrizione fisica | xi, 256 p. : ill. ; 24 cm |
Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020] 82D80 - Statistical mechanical studies of nanostructures and nanoparticles [MSC 2020] |
Soggetto non controllato |
In-situ characterization
Material dynamics Nanoanalysis Nanoscale materials Neutron Scattering Photoelectron Spectroscopy Scanning probe techniques Structure-property Ultra-fast analysis X-ray Absorption Spectroscopy |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN00133235 |
Berlin, : Springer, 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Photoelectron Spectroscopy : Bulk and Surface Electronic Structures / Shigemasa Suga, Akira Sekiyama |
Autore | Suga, Shigemasa |
Pubbl/distr/stampa | Berlin, : Springer, 2014 |
Descrizione fisica | xviii, 378 p. : ill. ; 24 cm |
Altri autori (Persone) | Sekiyama, Akira |
Soggetto topico |
78-XX - Optics, electromagnetic theory [MSC 2020]
00A79 (77-XX) - Physics [MSC 2020] |
Soggetto non controllato |
Angle Resolved Photoelectron Spectroscopy
Bulk Electronic Structures Fermi Surface High-resolution in Energies and Momenta Inverse Photoemission Photoelectron Diffraction Photoelectron Spectroscopy Spin Detection Surface Spectroscopy Surface and Interface Electronic Structures |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN0133052 |
Suga, Shigemasa | ||
Berlin, : Springer, 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Photoelectron Spectroscopy : Bulk and Surface Electronic Structures / Shigemasa Suga, Akira Sekiyama |
Autore | Suga, Shigemasa |
Pubbl/distr/stampa | Berlin, : Springer, 2014 |
Descrizione fisica | xviii, 378 p. : ill. ; 24 cm |
Altri autori (Persone) | Sekiyama, Akira |
Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] |
Soggetto non controllato |
Angle Resolved Photoelectron Spectroscopy
Bulk Electronic Structures Fermi Surface High-resolution in Energies and Momenta Inverse Photoemission Photoelectron Diffraction Photoelectron Spectroscopy Spin Detection Surface Spectroscopy Surface and Interface Electronic Structures |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN00133052 |
Suga, Shigemasa | ||
Berlin, : Springer, 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|