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Feature Papers in Electronic Materials Section
Feature Papers in Electronic Materials Section
Autore Roccaforte Fabrizio
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (438 p.)
Soggetto topico Energy industries and utilities
History of engineering and technology
Technology: general issues
Soggetto non controllato 2D materials
3C-SiC
4H-SiC
aluminum oxide
arrhythmia detection
binary oxides
bulk growth
cardiovascular monitoring
charge removal rate
chemical vapour deposition
compensation
compliant substrates
cubic silicon carbide
CVD
CVD graphene
defects
degradation
diamond
diodes
doping
electrical characterization
electron microscopy
energy electronics
epitaxial lift-off
Fabry-Perot filter
flexible bioelectronics
flexible electronics
Ga2O3
GaAs
gallium oxide
GaN
GaN-on-diamond
gate dielectric
graphene absorption
HEMT
heteroepitaxy
high-throughput method
high-κ dielectrics
hybrid integration
InGaAs channel
instability
insulators
interface
iron-based superconductor
irradiation temperature
KOH etching
material printing
MOS
MoS2
MPCVD growth
nanomanufacturing
nanomembrane
ohmic contact
optical fibers
power electronics
proton and electron irradiation
pulsed laser deposition
quasi-vertical GaN
radiation effects
radiation hardness
radio frequency sputtering
reliability
Schottky barrier
Schottky diodes
silica point defects
silicon carbide
SIMS
simulation
soft biosensors
spinel
stacking faults
stress
thermal management
thin film
threshold voltage
Ti3SiC2
transistors
transmission electron microscopy
trapping
traps
trench MOS
ultra-wide bandgap
van der Waals
vertical GaN
wearable sensors
wide band gap semiconductors
ZnGa2O4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557620303321
Roccaforte Fabrizio  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Miniaturized Transistors, Volume II
Miniaturized Transistors, Volume II
Autore Filipovic Lado
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (352 p.)
Soggetto topico Mathematics & science
Research & information: general
Soggetto non controllato 1200 V SiC MOSFET
2D hole gas (2DHG)
4H-SiC
4H-SiC MESFET
active layers
active noise control
AlGaN/GaN HEMTs
avalanche photodiode
average subthreshold swing
band-to-band tunnelling (BTBT)
bandwidth
bias temperature instabilities (BTI)
body diode
circuit design
CMOS
CMOS compatible technology
CMOS device
compact circuit style
confinement effective mass
control gate
core-insulator
defects
device processing
device reliability
DGSOI
diamond
dielectrics
direct source-to-drain tunneling
electron trapping
F-N plot
field effect transistor
field emission
FinFET
FinFETs
flexible transistors
floating gate transistor
GAA
GaN
gate structures
gate-all-around
germanium-around-source gate-all-around TFET (GAS GAA TFET)
grain boundary
HEMT
high gate
high responsivity
IMRD structure
integrated circuits
Landauer-Büttiker formalism
mean free path
MESFET
metal oxides
MoO3
mosfet
MOSFET
multi-recessed buffer
multi-subband ensemble Monte Carlo
multiple epitaxial layers
n/a
nanocomposites
nanoscale
nanoscale transistor
nanotransistor
nanowire
new device
non-equilibrium Green's function
non-radiative multiphonon (NMP) model
one-transistor dynamic random-access memory (1T-DRAM)
oxide defects
particle trajectory model
polymers
polysilicon
power added efficiency
power added efficiency (PAE)
power density
power-added efficiency
prototype
pulse width
quantum current
quantum transport
R-matrix method
random telegraph noise
reliability
silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs)
silicon photodiode
silvaco simulation
simulation
single-defect spectroscopy
SiO2
solid state circuit breaker (SSCB)
space-charge-limited currents
specific on-resistance
SPICE model
split-gate trench power MOSFET
surface transfer doping
surge reliability
T-channel
thermal simulation
three-input transistor
time-dependent defect spectroscopy
transient channel temperature
transport effective mass
tunnelling field-effect transistor (TFET)
V2O5
vacuum channel
vertical air-channel diode
vertical transistor
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910580205803321
Filipovic Lado  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Transistor- und Leitungsmodellierung zum Entwurf von monolithisch integrierten Leistungsverstärkern für den hohen Millimeterwellen-Frequenzbereich
Transistor- und Leitungsmodellierung zum Entwurf von monolithisch integrierten Leistungsverstärkern für den hohen Millimeterwellen-Frequenzbereich
Autore Diebold Sebastian
Pubbl/distr/stampa KIT Scientific Publishing, 2013
Descrizione fisica 1 online resource (XIII, 217 p. p.)
Collana Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
Soggetto topico Technology: general issues
Soggetto non controllato 3-5
coplanar waveguide
FETmillimeterwave
HEMT
III-V semiconductor
koplanarer Wellenleiter
Leistungsverstärker
mHEMT
microstrip transmission line
Mikrostreifenleitung
Millimeterwelle
millimetre-wave
MMIC
monolithic integrated
power amplifier
Terahertz
Verbindungshalbleiter
ISBN 1000037898
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione ger
Record Nr. UNINA-9910347055603321
Diebold Sebastian  
KIT Scientific Publishing, 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Wide Bandgap Based Devices : Design, Fabrication and Applications
Wide Bandgap Based Devices : Design, Fabrication and Applications
Autore Medjdoub Farid
Pubbl/distr/stampa Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Descrizione fisica 1 online resource (242 p.)
Soggetto topico Technology: general issues
Soggetto non controllato 4H-SiC
active power filter (APF)
AESA radars
Ag sinter paste
AlGaN/GaN
amorphous InGaZnO
asymmetric multiple quantum wells
barrier thickness
breakdown voltage (BV)
buffer trapping effect
buried-channel
composition-graded AlxGa1−xN electron blocking layer (EBL)
copper metallization
cosolvent
direct bonded copper (DBC) substrate
distortions
distributed feedback (DFB)
double barrier
electrochromism
electron leakage
electron leakage current
flexible devices
gallium nitride
gallium nitride (GaN)
Gallium nitride (GaN) high-electron-mobility transistors (HEMTs)
GaN
GaN 5G
GaN laser diode
GaN-based vertical-cavity surface-emitting laser (VCSEL)
GaN-on-GaN
grooved-anode diode
HEMT
hierarchical nanostructures
high electron mobility transistors
high electron mobility transistors (HEMT)
high-electron-mobility transistor (HEMT)
high-electron-mobility transistors
high-energy α-particle detection
IGBT
InGaN laser diodes
jammer system
low voltage
metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT)
millimeter wave
morphology
n/a
new radio
nitrogen-doping
normally off
normally-off operation
numerical simulation
ON-state voltage
optical absorption loss
optical band gap
optimization
photon extraction efficiency
photonic emitter
polyol method
power amplifier
power cycle test
power quality (PQ)
power switching device
proton irradiation
recessed gate
reliability
RF front-end
schottky barrier diodes
self-align
SiC micro-heater chip
sidewall gratings
silver nanoring
silver nanowire
spin coating
stability
surface gratings
terahertz Gunn diode
thermal resistance
thick depletion width detectors
thin-film transistor
time-dependent dielectric breakdown (TDDB)
transmittance
tungsten trioxide film
turn-off loss
ultra-wide band gap
vertical breakdown voltage
vertical gate structure
wide band gap semiconductors
wide band-gap (WBG)
wide bandgap semiconductors
wide-bandgap semiconductor
wideband
ZnO nanorod/NiO nanosheet
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Wide Bandgap Based Devices
Record Nr. UNINA-9910557351703321
Medjdoub Farid  
Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2021
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui