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Ferroelectric Domain Walls : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy : Doctoral Thesis accepted by the University of Geneva, Switzerland / Jill Guyonnet
| Ferroelectric Domain Walls : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy : Doctoral Thesis accepted by the University of Geneva, Switzerland / Jill Guyonnet |
| Autore | Guyonnet, Jill |
| Pubbl/distr/stampa | Cham, : Springer, 2014 |
| Descrizione fisica | xv, 159 p. : ill. ; 24 cm |
| Soggetto topico |
81-XX - Quantum theory [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020] 78-XX - Optics, electromagnetic theory [MSC 2020] 00A79 (77-XX) - Physics [MSC 2020] |
| Soggetto non controllato |
Atomic Force Microscopy
Characteristic Roughness Scaling Defect Localization at Domain Walls Disordered Elastic Interfaces Domain Engineering Ferroelectric Domain Patterning Ferroelectric Domains Ferroelectric Thin Films Lateral Piezoelectric Response Piezoresponse Force Microscopy |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0132896 |
Guyonnet, Jill
|
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| Cham, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Ferroelectric Domain Walls : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy : Doctoral Thesis accepted by the University of Geneva, Switzerland / Jill Guyonnet
| Ferroelectric Domain Walls : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy : Doctoral Thesis accepted by the University of Geneva, Switzerland / Jill Guyonnet |
| Autore | Guyonnet, Jill |
| Pubbl/distr/stampa | Cham, : Springer, 2014 |
| Descrizione fisica | xv, 159 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] 81-XX - Quantum theory [MSC 2020] 82-XX - Statistical mechanics, structure of matter [MSC 2020] |
| Soggetto non controllato |
Atomic Force Microscopy
Characteristic Roughness Scaling Defect Localization at Domain Walls Disordered Elastic Interfaces Domain Engineering Ferroelectric Domain Patterning Ferroelectric Domains Ferroelectric Thin Films Lateral Piezoelectric Response Piezoresponse Force Microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00132896 |
|
Guyonnet, Jill
|
||
| Cham, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||