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Debye Screening Length : Effects of Nanostructured Materials / Kamakhya Prasad Ghatak, Sitangshu Bhattacharya
| Debye Screening Length : Effects of Nanostructured Materials / Kamakhya Prasad Ghatak, Sitangshu Bhattacharya |
| Autore | Ghatak, Kamakhya P. |
| Pubbl/distr/stampa | Cham, : Springer, 2014 |
| Descrizione fisica | xxxiii, 385 p. : ill. ; 24 cm |
| Altri autori (Persone) | Bhattacharya, Sitangshu |
| Soggetto topico |
82-XX - Statistical mechanics, structure of matter [MSC 2020]
74-XX - Mechanics of deformable solids [MSC 2020] 82D37 - Statistical mechanical studies of semiconductors [MSC 2020] |
| Soggetto non controllato |
Compound semiconductors
Debye Screening Length Inversion Layers Inversion Layers of Non-parabolic Semiconductors Low-Simensional Semiconductors NIPIS Quantized Optoelectronic Semiconductors Quantum Confinement Quantum Wells |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0132794 |
Ghatak, Kamakhya P.
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| Cham, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Debye Screening Length : Effects of Nanostructured Materials / Kamakhya Prasad Ghatak, Sitangshu Bhattacharya
| Debye Screening Length : Effects of Nanostructured Materials / Kamakhya Prasad Ghatak, Sitangshu Bhattacharya |
| Autore | Ghatak, Kamakhya P. |
| Pubbl/distr/stampa | Cham, : Springer, 2014 |
| Descrizione fisica | xxxiii, 385 p. : ill. ; 24 cm |
| Altri autori (Persone) | Bhattacharya, Sitangshu |
| Soggetto topico |
74-XX - Mechanics of deformable solids [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020] 82D37 - Statistical mechanical studies of semiconductors [MSC 2020] |
| Soggetto non controllato |
Compound semiconductors
Debye Screening Length Inversion Layers Inversion Layers of Non-parabolic Semiconductors Low-Simensional Semiconductors NIPIS Quantized Optoelectronic Semiconductors Quantum Confinement Quantum Wells |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00132794 |
|
Ghatak, Kamakhya P.
|
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| Cham, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
The Physics of Semiconductor Devices : Proceedings of IWPSD 2017 / R. K. Sharma, D.S. Rawal editors
| The Physics of Semiconductor Devices : Proceedings of IWPSD 2017 / R. K. Sharma, D.S. Rawal editors |
| Pubbl/distr/stampa | Cham, : Springer, 2019 |
| Descrizione fisica | lvii, 1299 p. : ill. ; 24 cm |
| Soggetto topico |
00Bxx - Conference proceedings and collections of articles [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020] 82D03 - Statistical mechanical studies in condensed matter (general) [MSC 2020] |
| Soggetto non controllato |
Compound semiconductors
Crystal growth, epitaxy and characterization Graphene and 2D materials III-Nitrides materials and devices IWPSD 2017 Semiconductors for quantum computing VLSI technology |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0219180 |
| Cham, : Springer, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
The Physics of Semiconductor Devices : Proceedings of IWPSD 2017 / R. K. Sharma, D.S. Rawal editors
| The Physics of Semiconductor Devices : Proceedings of IWPSD 2017 / R. K. Sharma, D.S. Rawal editors |
| Pubbl/distr/stampa | Cham, : Springer, 2019 |
| Descrizione fisica | lvii, 1299 p. : ill. ; 24 cm |
| Soggetto topico |
00Bxx - Conference proceedings and collections of articles [MSC 2020]
82-XX - Statistical mechanics, structure of matter [MSC 2020] 82D03 - Statistical mechanical studies in condensed matter (general) [MSC 2020] |
| Soggetto non controllato |
Compound semiconductors
Crystal growth, epitaxy and characterization Graphene and 2D materials III-Nitrides materials and devices IWPSD 2017 Semiconductors for quantum computing VLSI technology |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00219180 |
| Cham, : Springer, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||