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Educational measurement for applied researchers : theory into practice / Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
Educational measurement for applied researchers : theory into practice / Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
Autore Wu, Margaret
Pubbl/distr/stampa Singapore, : Springer, 2016
Descrizione fisica XIV, 306 p. : ill. ; 24 cm
Altri autori (Persone) Jen, Tsung-Hau
Tam, Hak Ping
Soggetto topico 62-XX - Statistics [MSC 2020]
62C10 - Bayesian problems; characterization of Bayes procedures [MSC 2020]
91C05 - Measurement theory in the social and behavioral sciences [MSC 2020]
62N03 - Testing in survival analysis and censored data [MSC 2020]
Soggetto non controllato Classical test theory
Educational Measurement R Packages
Educational Testing
Educational measurement
Item response theory
Psychometrics
Test Analysis
Test and Scale Development
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0114655
Wu, Margaret  
Singapore, : Springer, 2016
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Educational measurement for applied researchers : theory into practice / Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
Educational measurement for applied researchers : theory into practice / Margaret Wu, Hak Ping Tam, Tsung-Hau Jen
Autore Wu, Margaret
Pubbl/distr/stampa Singapore, : Springer, 2016
Descrizione fisica XIV, 306 p. : ill. ; 24 cm
Altri autori (Persone) Jen, Tsung-Hau
Tam, Hak Ping
Soggetto topico 62-XX - Statistics [MSC 2020]
62C10 - Bayesian problems; characterization of Bayes procedures [MSC 2020]
62N03 - Testing in survival analysis and censored data [MSC 2020]
91C05 - Measurement theory in the social and behavioral sciences [MSC 2020]
Soggetto non controllato Classical test theory
Educational Measurement R Packages
Educational Testing
Educational measurement
Item response theory
Psychometrics
Test Analysis
Test and Scale Development
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00114655
Wu, Margaret  
Singapore, : Springer, 2016
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
The Basics of Item Response Theory Using R / Frank B. Baker, Seock-Ho Kim
The Basics of Item Response Theory Using R / Frank B. Baker, Seock-Ho Kim
Autore Baker, Frank B.
Pubbl/distr/stampa Cham, : Springer, 2017
Descrizione fisica xiv, 174 p. : ill. ; 24 cm
Altri autori (Persone) Kim, Seock-Ho
Soggetto topico 62-XX - Statistics [MSC 2020]
62P15 - Applications of statistics to psychology [MSC 2020]
Soggetto non controllato Ability parameter
Binary items
Classical test theory
Dichotomously scored
Difficulty parameter
Discrimination parameter
Guessing parameter
Information function
Invariance principle
Item characteristic curve
Item response theory
Logistic model
Maximum likelihood estimation
One-parameter model
Probability of correct response
Rasch model
Test calibration
Test characteristic curve
Three-parameter model
Two-parameter model
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN0123552
Baker, Frank B.  
Cham, : Springer, 2017
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
The Basics of Item Response Theory Using R / Frank B. Baker, Seock-Ho Kim
The Basics of Item Response Theory Using R / Frank B. Baker, Seock-Ho Kim
Autore Baker, Frank B.
Pubbl/distr/stampa Cham, : Springer, 2017
Descrizione fisica xiv, 174 p. : ill. ; 24 cm
Altri autori (Persone) Kim, Seock-Ho
Soggetto topico 62-XX - Statistics [MSC 2020]
62P15 - Applications of statistics to psychology [MSC 2020]
Soggetto non controllato Ability parameter
Binary items
Classical test theory
Dichotomously scored
Difficulty parameter
Discrimination parameter
Guessing parameter
Information function
Invariance principle
Item characteristic curve
Item response theory
Logistic model
Maximum likelihood estimation
One-parameter model
Probability of correct response
Rasch model
Test calibration
Test characteristic curve
Three-parameter model
Two-parameter model
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Titolo uniforme
Record Nr. UNICAMPANIA-VAN00123552
Baker, Frank B.  
Cham, : Springer, 2017
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui