Flash Memory Devices |
Autore | Zambelli Cristian |
Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
Descrizione fisica | 1 electronic resource (144 p.) |
Soggetto topico | Technology: general issues |
Soggetto non controllato |
retention characteristic
high-κ nonvolatile charge-trapping memory stack engineering NOR flash memory aluminum oxide NAND flash memory interference Technology Computer Aided Design (TCAD) simulation disturbance program non-volatile memory (NVM) 3D NAND Flash memories random telegraph noise Flash memory reliability test platform endurance support vector machine raw bit error 3D NAND Flash RBER reliability flash signal processing randomization scheme solid-state drives 3D flash memory performance cliff tail latency garbage collection artificial neural network error correction code work function effective work function dipole metal gate high-k SiO2 interfacial reaction MHONOS erase performance 3D NAND flash memory temperature read disturb |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910557617103321 |
Zambelli Cristian
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Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
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Lo trovi qui: Univ. Federico II | ||
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High-Density Solid-State Memory Devices and Technologies |
Autore | Monzio Compagnoni Christian |
Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
Descrizione fisica | 1 electronic resource (210 p.) |
Soggetto topico |
Technology: general issues
History of engineering & technology |
Soggetto non controllato |
resistive switching memory
in-memory computing crosspoint array artificial intelligence deep learning dielectric RTN TAT Wiener-Khinchin transient analysis phonon surface roughness spectral index power spectrum program suspend 3D NAND Flash Solid State Drives MOSFET low-frequency noise random telegraph noise evaluation method array test pattern STT-MRAM spintronics CoFeB composite free layer low power electronics NAND Flash memory endurance reliability oxide trapped charge artificial neural networks neuromorphic computing NOR Flash memory arrays program noise pulse-width modulation 3D NAND floating gate cell charge-trap cell CMOS under array bumpless TSV WOW COW BBCube bandwidth yield power consumption thermal management |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910566470403321 |
Monzio Compagnoni Christian
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Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
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