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Flash Memory Devices
Flash Memory Devices
Autore Zambelli Cristian
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (144 p.)
Soggetto topico Technology: general issues
Soggetto non controllato 3D flash memory
3D NAND Flash
3D NAND Flash memories
3D NAND flash memory
aluminum oxide
artificial neural network
dipole
disturbance
effective work function
endurance
erase performance
error correction code
Flash memory reliability
flash signal processing
garbage collection
high-k
high-κ
interfacial reaction
interference
metal gate
MHONOS
n/a
NAND flash memory
non-volatile memory (NVM)
nonvolatile charge-trapping memory
NOR flash memory
performance cliff
program
random telegraph noise
randomization scheme
raw bit error
RBER
read disturb
reliability
retention characteristic
SiO2
solid-state drives
stack engineering
support vector machine
tail latency
Technology Computer Aided Design (TCAD) simulation
temperature
test platform
work function
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910557617103321
Zambelli Cristian  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
High-Density Solid-State Memory Devices and Technologies
High-Density Solid-State Memory Devices and Technologies
Autore Monzio Compagnoni Christian
Pubbl/distr/stampa Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Descrizione fisica 1 online resource (210 p.)
Soggetto topico History of engineering & technology
Technology: general issues
Soggetto non controllato 3D NAND
3D NAND Flash
array test pattern
artificial intelligence
artificial neural networks
bandwidth
BBCube
bumpless
charge-trap cell
CMOS under array
CoFeB
composite free layer
COW
crosspoint array
deep learning
dielectric
endurance
evaluation method
floating gate cell
in-memory computing
low power electronics
low-frequency noise
MOSFET
n/a
NAND Flash memory
neuromorphic computing
NOR Flash memory arrays
oxide trapped charge
phonon
power consumption
power spectrum
program noise
program suspend
pulse-width modulation
random telegraph noise
reliability
resistive switching memory
RTN
Solid State Drives
spectral index
spintronics
STT-MRAM
surface roughness
TAT
thermal management
transient analysis
TSV
Wiener-Khinchin
WOW
yield
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910566470403321
Monzio Compagnoni Christian  
Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui