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Diffuse x-ray scattering and models of disorder [[electronic resource] /] / T.R. Welberry
| Diffuse x-ray scattering and models of disorder [[electronic resource] /] / T.R. Welberry |
| Autore | Welberry T. R (Thomas Richard) |
| Pubbl/distr/stampa | Oxford, : Oxford University Press, 2004 |
| Descrizione fisica | 1 online resource (281 p.) |
| Disciplina | 548/.83 |
| Collana | International Union of Crystallography monographs on crystallography |
| Soggetto topico |
X-rays - Scattering
X-ray crystallography |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-84704-2
0-19-152376-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; I: EXPERIMENT; II: DISORDER MODELS; III: EXAMPLES OF REAL DISORDERED SYSTEMS; References; Index |
| Record Nr. | UNINA-9910452975303321 |
Welberry T. R (Thomas Richard)
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| Oxford, : Oxford University Press, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electron dynamics by inelastic X-ray scattering [[electronic resource] /] / Winfried Schülke
| Electron dynamics by inelastic X-ray scattering [[electronic resource] /] / Winfried Schülke |
| Autore | Schülke Winfried |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2007 |
| Descrizione fisica | 1 online resource (606 p.) |
| Disciplina | 539.7/58 |
| Collana | Oxford series on synchrotron radiation |
| Soggetto topico |
X-rays - Scattering
Electrons - Inelastic scattering |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-16006-7
9786611160067 0-19-152328-3 1-4356-2072-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of important symbols; 1 Introductory survey; 2 Characteristic valence electron excitations; 3 Core-electron excitation (X-ray Raman scattering (XRS)); 4 The Compton scattering regime; 5 Resonant inelastic X-ray scattering (RIXS); 6 Theoretical foundation; Index |
| Record Nr. | UNINA-9910451906303321 |
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Schülke Winfried
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| Oxford ; ; New York, : Oxford University Press, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electron dynamics by inelastic X-ray scattering [[electronic resource] /] / Winfried Schülke
| Electron dynamics by inelastic X-ray scattering [[electronic resource] /] / Winfried Schülke |
| Autore | Schülke Winfried |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2007 |
| Descrizione fisica | 1 online resource (606 p.) |
| Disciplina | 539.7/58 |
| Collana | Oxford series on synchrotron radiation |
| Soggetto topico |
X-rays - Scattering
Electrons - Inelastic scattering |
| ISBN |
0-19-168755-3
1-281-16006-7 9786611160067 0-19-152328-3 1-4356-2072-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of important symbols; 1 Introductory survey; 2 Characteristic valence electron excitations; 3 Core-electron excitation (X-ray Raman scattering (XRS)); 4 The Compton scattering regime; 5 Resonant inelastic X-ray scattering (RIXS); 6 Theoretical foundation; Index |
| Record Nr. | UNINA-9910778368903321 |
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Schülke Winfried
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| Oxford ; ; New York, : Oxford University Press, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Elementary scattering theory : for X-ray and neutron users / / D.S. Sivia
| Elementary scattering theory : for X-ray and neutron users / / D.S. Sivia |
| Autore | Sivia D. S |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Oxford, England ; ; New York, : Oxford University Press, c2011 |
| Descrizione fisica | 1 online resource (216 p.) |
| Disciplina | 539.7213 |
| Soggetto topico |
Neutrons - Scattering
X-rays - Scattering |
| ISBN | 0-19-100477-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Contents; I: Some preliminaries; 1 Studying matter at the atomic and molecular level; 1.1 Length scales and logarithmic axes; 1.2 Resolution, magnification and microscopy; 1.3 Structure, dynamics and spectroscopy; 1.4 Atomic building blocks and interactions; 1.5 Energy, length and temperature scales; 1.6 A table of useful constants; 2 Waves, complex numbers and Fourier transforms; 2.1 Sinusoidal waves; 2.2 Complex numbers; 2.3 Fourier series; 2.4 Fourier transforms; 2.5 Fourier optics and physical insight; 2.6 Fourier data analysis; 2.7 A list of useful formulae; II: Elastic scattering
3 The basics of X-ray and neutron scattering3.1 An idealized scattering experiment; 3.2 Scattering by a single fixed atom; 3.3 Scattering from an assembly of atoms; 3.4 X-rays and synchrotron sources; 3.5 Reactors and pulsed neutron sources; 4 Surfaces, interfaces and reflectivity; 4.1 Reflectivity and Fourier transforms; 4.2 Reflectivity and geometrical optics; 4.3 X-rays, neutrons and other techniques; 5 Small-angle scattering and the big picture; 5.1 Diffraction and length scales; 5.2 Size, shape and molecular form factors; 5.3 Assemblies and correlations; 5.4 Pair-distribution function 5.5 Contrast matching6 Liquids and amorphous materials; 6.1 The middle phase of matter; 6.2 Radial distribution functions; 6.3 Structure factors; 6.4 Comparison with small-angle scattering; 6.5 The Placzek correction; 7 Periodicity, symmetry and crystallography; 7.1 Repetitive structures and Bragg peaks; 7.2 Patterns and symmetries; 7.3 Circumventing the phase problem; 7.4 Powdered samples; 7.5 Magnetic structures; III: Inelastic scattering; 8 Energy exchange and dynamical information; 8.1 Experimental considerations; 8.2 Scattering from time-varying structures 8.3 A quantum transitions approach9 Examples of inelastic scattering; 9.1 Compton scattering; 9.2 Lattice vibrations; 9.3 Molecular spectroscopy; A: Discrete Fourier transforms; B: Resonant scattering and absorption; References; Index; A; B; C; D; E; F; G; H; I; J; K; L; M; N; O; P; Q; R; S; T; U; V; W; X; Y |
| Record Nr. | UNINA-9910619454803321 |
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Sivia D. S
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| Oxford, England ; ; New York, : Oxford University Press, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege
| High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege |
| Autore | Hau-Riege Stefan P. |
| Pubbl/distr/stampa | Weinheim : , : Wiley-VCH, , [2011] |
| Descrizione fisica | 1 online resource (521 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
X-rays - Scattering
Materials - Effect of radiation on X-ray microanalysis |
| Soggetto genere / forma | Electronic books. |
| ISBN |
3-527-63638-2
3-527-63637-4 3-527-63636-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright; Dedication; Preface; Chapter 1: Introduction; 1.1 Examples for the Application of X-Ray-Matter Interaction; 1.2 Electromagnetic Spectrum; 1.3 X-Ray Light Sources; 1.4 Fundamental Models to Describe X-Ray-Matter Interaction; 1.5 Introduction to X-Ray-Matter Interaction Processes; 1.6 Databases Relevant to Photon-Matter Interaction; References; Chapter 2: Atomic Physics; 2.1 Atomic States; 2.2 Atomic Processes; 2.3 Effect of Plasma Environment; References; Chapter 3: Scattering of X-Ray Radiation; 3.1 Scattering by Free Charges
3.2 Scattering by Atoms and Ions3.3 Scattering by Gases, Liquids, and Amorphous Solids; 3.4 Scattering by Plasmas; 3.5 Scattering by Crystals; References; Chapter 4: Electromagnetic Wave Propagation; 4.1 Electromagnetic Waves in Matter; 4.2 Reflection and Refraction at Interfaces; 4.3 Reflection by Thin Films, Bilayers, and Multilayers; 4.4 Dispersive Interaction of Wavepackets with Materials; 4.5 Kramers-Kronig Relation; References; Chapter 5: Electron Dynamics; 5.1 Transition of Solids into Plasmas; 5.2 Directional Emission of Photoelectrons; 5.3 Electron Scattering 5.4 Energy Loss Mechanisms5.5 Electron Dynamics in Plasmas; 5.6 Statistical Description of Electron Dynamics; 5.7 Bremsstrahlung Emission and Inverse Bremsstrahlung Absorption; 5.8 Charge Trapping in Small Objects; References; Chapter 6: Short X-Ray Pulses; 6.1 Characteristics of Short X-Ray Pulses; 6.2 Generating Short X-Ray Pulses; 6.3 Characterizing Short X-Ray Pulses; 6.4 Characteristic Time Scales in Matter; 6.5 Short-Pulse X-Ray-Matter Interaction Processes; 6.6 Single-Pulse X-Ray Optics; References; Chapter 7: High-Intensity Effects in the X-Ray Regime 7.1 Intensity and Electric Field of Intense X-Ray Sources7.2 High-X-Ray-Intensity Effects in Atoms; 7.3 Nonlinear Optics; 7.4 High-Intensity Effects in Plasmas; 7.5 High-Field Physics; References; Chapter 8: Dynamics of X-Ray-Irradiated Materials; 8.1 X-Ray-Matter Interaction Time Scales; 8.2 The Influence of X-Ray Heating on Absorption; 8.3 Thermodynamics of Phase Transformation; 8.4 Ablation; 8.5 Intensity Dependence of X-Ray-Matter Interaction; 8.6 X-Ray-Induced Mechanical Damage; 8.7 X-Ray Damage in Inertial Confinement Fusion; 8.8 X-Ray Damage in Semiconductors 8.9 Damage to Biomolecules in X-Ray ImagingReferences; Chapter 9: Simulation of X-Ray-Matter Interaction; 9.1 Models for Different Time- and Length Scales; 9.2 Atomistic Models; 9.3 Statistical Kinetics Models; 9.4 Hydrodynamic Models; References; Chapter 10: Examples of X-Ray-Matter Interaction; 10.1 Interaction of Intense X-Ray Radiation with Atoms and Molecules; 10.2 Interaction of Intense X-Ray Pulses with Atomic Clusters; 10.3 Biological Imaging; 10.4 X-Ray Scattering Diagnostics of Dense Plasmas; References; Index |
| Record Nr. | UNINA-9910130960903321 |
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Hau-Riege Stefan P.
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| Weinheim : , : Wiley-VCH, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege
| High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege |
| Autore | Hau-Riege Stefan P. |
| Pubbl/distr/stampa | Weinheim : , : Wiley-VCH, , [2011] |
| Descrizione fisica | 1 online resource (521 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
X-rays - Scattering
Materials - Effect of radiation on X-ray microanalysis |
| ISBN |
3-527-63638-2
3-527-63637-4 3-527-63636-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright; Dedication; Preface; Chapter 1: Introduction; 1.1 Examples for the Application of X-Ray-Matter Interaction; 1.2 Electromagnetic Spectrum; 1.3 X-Ray Light Sources; 1.4 Fundamental Models to Describe X-Ray-Matter Interaction; 1.5 Introduction to X-Ray-Matter Interaction Processes; 1.6 Databases Relevant to Photon-Matter Interaction; References; Chapter 2: Atomic Physics; 2.1 Atomic States; 2.2 Atomic Processes; 2.3 Effect of Plasma Environment; References; Chapter 3: Scattering of X-Ray Radiation; 3.1 Scattering by Free Charges
3.2 Scattering by Atoms and Ions3.3 Scattering by Gases, Liquids, and Amorphous Solids; 3.4 Scattering by Plasmas; 3.5 Scattering by Crystals; References; Chapter 4: Electromagnetic Wave Propagation; 4.1 Electromagnetic Waves in Matter; 4.2 Reflection and Refraction at Interfaces; 4.3 Reflection by Thin Films, Bilayers, and Multilayers; 4.4 Dispersive Interaction of Wavepackets with Materials; 4.5 Kramers-Kronig Relation; References; Chapter 5: Electron Dynamics; 5.1 Transition of Solids into Plasmas; 5.2 Directional Emission of Photoelectrons; 5.3 Electron Scattering 5.4 Energy Loss Mechanisms5.5 Electron Dynamics in Plasmas; 5.6 Statistical Description of Electron Dynamics; 5.7 Bremsstrahlung Emission and Inverse Bremsstrahlung Absorption; 5.8 Charge Trapping in Small Objects; References; Chapter 6: Short X-Ray Pulses; 6.1 Characteristics of Short X-Ray Pulses; 6.2 Generating Short X-Ray Pulses; 6.3 Characterizing Short X-Ray Pulses; 6.4 Characteristic Time Scales in Matter; 6.5 Short-Pulse X-Ray-Matter Interaction Processes; 6.6 Single-Pulse X-Ray Optics; References; Chapter 7: High-Intensity Effects in the X-Ray Regime 7.1 Intensity and Electric Field of Intense X-Ray Sources7.2 High-X-Ray-Intensity Effects in Atoms; 7.3 Nonlinear Optics; 7.4 High-Intensity Effects in Plasmas; 7.5 High-Field Physics; References; Chapter 8: Dynamics of X-Ray-Irradiated Materials; 8.1 X-Ray-Matter Interaction Time Scales; 8.2 The Influence of X-Ray Heating on Absorption; 8.3 Thermodynamics of Phase Transformation; 8.4 Ablation; 8.5 Intensity Dependence of X-Ray-Matter Interaction; 8.6 X-Ray-Induced Mechanical Damage; 8.7 X-Ray Damage in Inertial Confinement Fusion; 8.8 X-Ray Damage in Semiconductors 8.9 Damage to Biomolecules in X-Ray ImagingReferences; Chapter 9: Simulation of X-Ray-Matter Interaction; 9.1 Models for Different Time- and Length Scales; 9.2 Atomistic Models; 9.3 Statistical Kinetics Models; 9.4 Hydrodynamic Models; References; Chapter 10: Examples of X-Ray-Matter Interaction; 10.1 Interaction of Intense X-Ray Radiation with Atoms and Molecules; 10.2 Interaction of Intense X-Ray Pulses with Atomic Clusters; 10.3 Biological Imaging; 10.4 X-Ray Scattering Diagnostics of Dense Plasmas; References; Index |
| Record Nr. | UNINA-9910830184203321 |
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Hau-Riege Stefan P.
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| Weinheim : , : Wiley-VCH, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Inelastic X-ray scattering and X-ray powder diffraction applications / / edited by Alessandro Cunsolo, Margareth K. K. D. Franco, Fabiano Yokaichiya
| Inelastic X-ray scattering and X-ray powder diffraction applications / / edited by Alessandro Cunsolo, Margareth K. K. D. Franco, Fabiano Yokaichiya |
| Pubbl/distr/stampa | London, United Kingdom : , : IntechOpen, , [2020] |
| Descrizione fisica | 1 online resource (130 pages) : illustrations |
| Disciplina | 539.7222 |
| Soggetto topico | X-rays - Scattering |
| ISBN | 1-78985-052-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910417995903321 |
| London, United Kingdom : , : IntechOpen, , [2020] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Molecular design of novel poly(urethane-urea) hybrids as helmet pads for ballistic and blast trauma mitigation [[electronic resource]] / Alex J. Hsieh, Joshua A. Orlicki, and Rick L. Beyer
| Molecular design of novel poly(urethane-urea) hybrids as helmet pads for ballistic and blast trauma mitigation [[electronic resource]] / Alex J. Hsieh, Joshua A. Orlicki, and Rick L. Beyer |
| Autore | Hsieh Alex J |
| Pubbl/distr/stampa | Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2009] |
| Descrizione fisica | vi, 14 pages : digital, PDF file |
| Altri autori (Persone) |
OrlickiJoshua A
BeyerRick L |
| Collana | ARL-TR |
| Soggetto topico |
Polyurethanes
Helmets - Protection X-rays - Scattering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Molecular design of novel poly |
| Record Nr. | UNINA-9910698754203321 |
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Hsieh Alex J
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| Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2009] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others]
| Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others] |
| Autore | Stangl Julian |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & sons, , 2013 |
| Descrizione fisica | 1 online resource (284 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
Electron probe microanalysis
Nanotechnology X-rays - Scattering |
| ISBN |
3-527-65508-5
3-527-65506-9 3-527-65509-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory
2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate 3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data 4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup 5.5 Detectors: Pixel and Time Resolution, Dynamical Range |
| Record Nr. | UNINA-9910139013203321 |
|
Stangl Julian
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||
| Hoboken, New Jersey : , : John Wiley & sons, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others]
| Nanobeam x-ray scattering : probing matter at the nanoscale / / Julian Stangl [and three others] |
| Autore | Stangl Julian |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & sons, , 2013 |
| Descrizione fisica | 1 online resource (284 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
Electron probe microanalysis
Nanotechnology X-rays - Scattering |
| ISBN |
3-527-65508-5
3-527-65506-9 3-527-65509-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory
2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate 3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data 4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup 5.5 Detectors: Pixel and Time Resolution, Dynamical Range |
| Record Nr. | UNINA-9910818082403321 |
|
Stangl Julian
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| Hoboken, New Jersey : , : John Wiley & sons, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||