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Principles and applications of powder diffraction
| Principles and applications of powder diffraction |
| Pubbl/distr/stampa | [Place of publication not identified], : John Wiley and Sons Ltd, 2008 |
| Disciplina | 548/.83 |
| Soggetto topico |
X-rays - Measurement - Diffraction
Powders - Optical properties Light & Optics Physics Physical Sciences & Mathematics |
| ISBN |
1-4443-0548-4
1-4443-0561-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. |
| Record Nr. | UNINA-9910139384203321 |
| [Place of publication not identified], : John Wiley and Sons Ltd, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Principles and applications of powder diffraction
| Principles and applications of powder diffraction |
| Pubbl/distr/stampa | [Place of publication not identified], : John Wiley and Sons Ltd, 2008 |
| Disciplina | 548/.83 |
| Soggetto topico |
X-rays - Measurement - Diffraction
Powders - Optical properties Light & Optics Physics Physical Sciences & Mathematics |
| ISBN |
1-4443-0548-4
1-4443-0561-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. |
| Record Nr. | UNINA-9910830482903321 |
| [Place of publication not identified], : John Wiley and Sons Ltd, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Principles and applications of powder diffraction
| Principles and applications of powder diffraction |
| Pubbl/distr/stampa | [Place of publication not identified], : John Wiley and Sons Ltd, 2008 |
| Disciplina | 548/.83 |
| Soggetto topico |
X-rays - Measurement - Diffraction
Powders - Optical properties Light & Optics Physics Physical Sciences & Mathematics |
| ISBN |
1-4443-0548-4
1-4443-0561-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. |
| Record Nr. | UNINA-9910877055303321 |
| [Place of publication not identified], : John Wiley and Sons Ltd, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
