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Advanced X-ray imaging of electrochemical energy materials and devices / / Jiajun Wang, editor
| Advanced X-ray imaging of electrochemical energy materials and devices / / Jiajun Wang, editor |
| Pubbl/distr/stampa | Singapore : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (252 pages) |
| Disciplina | 543.08586 |
| Soggetto topico |
X-ray spectroscopy
X-ray microscopy |
| ISBN | 981-16-5328-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910503010503321 |
| Singapore : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Annotated bibliography on soft X-ray spectroscopy [[electronic resource] /] / H. Yakowitz and J.R. Cuthill
| Annotated bibliography on soft X-ray spectroscopy [[electronic resource] /] / H. Yakowitz and J.R. Cuthill |
| Autore | Yakowitz Harvey <1939-> |
| Pubbl/distr/stampa | Washington, D.C. : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1962] |
| Descrizione fisica | iv, 108 pages, 1 unnumbered folded leaf : illustrations ; ; 26 cm |
| Disciplina | 016.620167 |
| Altri autori (Persone) | CuthillJ. R |
| Collana | NBS monograph |
| Soggetto topico |
X-ray spectroscopy
Spectrometry, X-Ray Emission |
| Soggetto genere / forma |
Abstracts.
Bibliographies. |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910712903903321 |
Yakowitz Harvey <1939->
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| Washington, D.C. : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1962] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
| ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1984 |
| Descrizione fisica | 1 online resource (39 pages) |
| Disciplina | 543.08586 |
| Soggetto topico |
X-ray spectroscopy
Semiconductors |
| ISBN | 0-7381-0715-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Record Nr. | UNISA-996279553103316 |
| Piscataway, New Jersey : , : IEEE, , 1984 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
| ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1984 |
| Descrizione fisica | 1 online resource (39 pages) |
| Disciplina | 543.08586 |
| Soggetto topico |
X-ray spectroscopy
Semiconductors |
| ISBN | 0-7381-0715-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Record Nr. | UNINA-9910135417703321 |
| Piscataway, New Jersey : , : IEEE, , 1984 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Certifying Central Facility Beamlines for Biological and Chemical Crystallography and Allied Methods / / by John R. Helliwell
| Certifying Central Facility Beamlines for Biological and Chemical Crystallography and Allied Methods / / by John R. Helliwell |
| Autore | Helliwell John R |
| Edizione | [1st ed. 2025.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 |
| Descrizione fisica | 1 online resource (141 pages) |
| Disciplina | 549 |
| Collana | SpringerBriefs in Crystallography |
| Soggetto topico |
Mineralogy
Crystallography X-ray spectroscopy Crystallography and Scattering Methods X-Ray Spectroscopy |
| ISBN |
9783031801815
3031801814 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1.A beginner’s guide to synchrotron radiation and X-ray lasers -- 2.A beginner’s guide to neutron reactor and spallation sources and detectors -- 3.A beginner’s guide to detectors in use at X-ray beamlines and their calibration -- 4.Introduction to X-ray beamlines for crystallography -- 5.Guidance in preparing the experiment at your home facility including sample preparation -- 6.Beamline scientist perspective -- 7.Beamline user perspective -- 8.Fixed wavelength high intensity beamline -- 9.Tuneable wavelength beamline -- 10.Laue diffraction beamline -- 11.Microfocus beamline -- 12.Serial crystallography beamline: synchrotron -- 13.Serial crystallography beamline: X-ray laser -- 14.Time-resolved crystallography -- 15.Electron crystallography facility -- 16.Neutron crystallography instruments -- 17.Facility data archiving policy considerations -- 18.Facility publication authorship policies -- 19.Sample environment, cryostats and or containment, light sources for photo-initiation or mixing devices for reactions in a crystal -- 20.Electron biological imaging centres at the SR facilities: Diamond, ESRF, Soleil and SSRL/SLAC as examples -- 21.NMR crystallography -- 22.Small and Wide-Angle Scattering beamlines -- 23.X-ray absorption spectroscopy beamlines -- 24.Mass spectroscopy -- 25.UV/Vis and Infra-red spectroscopy -- 26.Data analysis and software -- 27.Safety Matters -- 28.Theoretical and Computational Sciences -- 29.Summary -- 30.So, to the Measuring Team briefing before the Experiment. |
| Record Nr. | UNINA-9910983058303321 |
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Helliwell John R
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| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Chemical correlation of some late Cenozoic tuffs of northern and central California by neutron activation analysis of glass and comparison with X-ray fluorescence analysis / / by Andrei M. Sarna-Wojcicki, Harry W. Bowman, and Paul C. Russell
| Chemical correlation of some late Cenozoic tuffs of northern and central California by neutron activation analysis of glass and comparison with X-ray fluorescence analysis / / by Andrei M. Sarna-Wojcicki, Harry W. Bowman, and Paul C. Russell |
| Autore | Sarna-Wojcicki Andrei M. |
| Pubbl/distr/stampa | Washington : , : United States Department of the Interior, Geological Survey, , 1979 |
| Descrizione fisica | 1 online resource (iii, 15 pages) : illustrations, map |
| Collana | Geological Survey professional paper |
| Soggetto topico |
Geology, Stratigraphic - Cenozoic
Nuclear activation analysis Stratigraphic correlation - California Volcanic ash, tuff, etc - California X-ray spectroscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910706901803321 |
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Sarna-Wojcicki Andrei M.
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| Washington : , : United States Department of the Interior, Geological Survey, , 1979 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Energy dispersion X-ray analysis : X-ray and electron probe analysis
| Energy dispersion X-ray analysis : X-ray and electron probe analysis |
| Pubbl/distr/stampa | Philadelphia : , : American Society for Testing and Materials, , 1971 |
| Descrizione fisica | 1 online resource ([2], 285 pages) : illustrations, charts, tables, diagrams |
| Disciplina | 537.5/352 |
| Collana | ASTM special technical publication Energy dispersion X-ray analysis: X-ray and electron probe analysis. |
| Soggetto topico |
Electromagnetic noise
Germanium X-ray spectroscopy |
| ISBN | 0-8031-5571-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910164726303321 |
| Philadelphia : , : American Society for Testing and Materials, , 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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EXAFS spectroscopy, techniques and applications / edited by B. K. Teo and D. C. Joy
| EXAFS spectroscopy, techniques and applications / edited by B. K. Teo and D. C. Joy |
| Pubbl/distr/stampa | New York : Plenum Press, c1981 |
| Descrizione fisica | viii, 275 p. : ill. ; 26 cm |
| Disciplina | 543.6 |
| Altri autori (Persone) |
Teo, B. K.
Joy, David C. |
| Altri autori (Enti) | Materials Research Society |
| Soggetto topico |
X-ray spectroscopy
Absorption spectra Extended x-ray absorption fine structure |
| ISBN | 0306406543 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001348509707536 |
| New York : Plenum Press, c1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz
| Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz |
| Autore | Grieken, Rene : van |
| Pubbl/distr/stampa | New York, NY : Marcel Dekker, c1993 |
| Descrizione fisica | xiv, 704 p. : ill. ; 26 cm. |
| Altri autori (Persone) | Markowicz, Andrzej |
| Collana | Practical spectroscopy series ; 14 |
| Soggetto topico | X-ray spectroscopy |
| ISBN | 0824784839 |
| Classificazione |
53.0.692
53.8.8 543.08586 QD96.X2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000989959707536 |
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Grieken, Rene : van
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| New York, NY : Marcel Dekker, c1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz
| Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz |
| Edizione | [2nd ed., rev. and expanded] |
| Pubbl/distr/stampa | New York : Marcel Dekker, c2002 |
| Descrizione fisica | xvi, 983 p. : ill. ; 26 cm |
| Disciplina | 543.08586 |
| Altri autori (Persone) |
Grieken, R. van (René)
Markowicz, Andrzej |
| Collana | Practical spectroscopy ; v. 29 |
| Soggetto topico |
X-ray spectroscopy
Spectrometry, X-Ray Emission - methods |
| ISBN | 0824706005 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000555579707536 |
| New York : Marcel Dekker, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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