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Advanced X-ray imaging of electrochemical energy materials and devices / / Jiajun Wang, editor
Advanced X-ray imaging of electrochemical energy materials and devices / / Jiajun Wang, editor
Pubbl/distr/stampa Singapore : , : Springer, , [2021]
Descrizione fisica 1 online resource (252 pages)
Disciplina 543.08586
Soggetto topico X-ray spectroscopy
X-ray microscopy
ISBN 981-16-5328-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910503010503321
Singapore : , : Springer, , [2021]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Annotated bibliography on soft X-ray spectroscopy [[electronic resource] /] / H. Yakowitz and J.R. Cuthill
Annotated bibliography on soft X-ray spectroscopy [[electronic resource] /] / H. Yakowitz and J.R. Cuthill
Autore Yakowitz Harvey <1939->
Pubbl/distr/stampa Washington, D.C. : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1962]
Descrizione fisica iv, 108 pages, 1 unnumbered folded leaf : illustrations ; ; 26 cm
Disciplina 016.620167
Altri autori (Persone) CuthillJ. R
Collana NBS monograph
Soggetto topico X-ray spectroscopy
Spectrometry, X-Ray Emission
Soggetto genere / forma Abstracts.
Bibliography
Bibliographies.
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910712903903321
Yakowitz Harvey <1939->  
Washington, D.C. : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1962]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : IEEE, , 1984
Descrizione fisica 1 online resource (39 pages)
Disciplina 543.08586
Soggetto topico X-ray spectroscopy
Semiconductors
ISBN 0-7381-0715-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Record Nr. UNISA-996279553103316
Piscataway, New Jersey : , : IEEE, , 1984
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : IEEE, , 1984
Descrizione fisica 1 online resource (39 pages)
Disciplina 543.08586
Soggetto topico X-ray spectroscopy
Semiconductors
ISBN 0-7381-0715-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Record Nr. UNINA-9910135417703321
Piscataway, New Jersey : , : IEEE, , 1984
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Certifying Central Facility Beamlines for Biological and Chemical Crystallography and Allied Methods / / by John R. Helliwell
Certifying Central Facility Beamlines for Biological and Chemical Crystallography and Allied Methods / / by John R. Helliwell
Autore Helliwell John R
Edizione [1st ed. 2025.]
Pubbl/distr/stampa Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025
Descrizione fisica 1 online resource (141 pages)
Disciplina 549
Collana SpringerBriefs in Crystallography
Soggetto topico Mineralogy
Crystallography
X-ray spectroscopy
Crystallography and Scattering Methods
X-Ray Spectroscopy
ISBN 9783031801815
3031801814
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1.A beginner’s guide to synchrotron radiation and X-ray lasers -- 2.A beginner’s guide to neutron reactor and spallation sources and detectors -- 3.A beginner’s guide to detectors in use at X-ray beamlines and their calibration -- 4.Introduction to X-ray beamlines for crystallography -- 5.Guidance in preparing the experiment at your home facility including sample preparation -- 6.Beamline scientist perspective -- 7.Beamline user perspective -- 8.Fixed wavelength high intensity beamline -- 9.Tuneable wavelength beamline -- 10.Laue diffraction beamline -- 11.Microfocus beamline -- 12.Serial crystallography beamline: synchrotron -- 13.Serial crystallography beamline: X-ray laser -- 14.Time-resolved crystallography -- 15.Electron crystallography facility -- 16.Neutron crystallography instruments -- 17.Facility data archiving policy considerations -- 18.Facility publication authorship policies -- 19.Sample environment, cryostats and or containment, light sources for photo-initiation or mixing devices for reactions in a crystal -- 20.Electron biological imaging centres at the SR facilities: Diamond, ESRF, Soleil and SSRL/SLAC as examples -- 21.NMR crystallography -- 22.Small and Wide-Angle Scattering beamlines -- 23.X-ray absorption spectroscopy beamlines -- 24.Mass spectroscopy -- 25.UV/Vis and Infra-red spectroscopy -- 26.Data analysis and software -- 27.Safety Matters -- 28.Theoretical and Computational Sciences -- 29.Summary -- 30.So, to the Measuring Team briefing before the Experiment.
Record Nr. UNINA-9910983058303321
Helliwell John R  
Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Chemical correlation of some late Cenozoic tuffs of northern and central California by neutron activation analysis of glass and comparison with X-ray fluorescence analysis / / by Andrei M. Sarna-Wojcicki, Harry W. Bowman, and Paul C. Russell
Chemical correlation of some late Cenozoic tuffs of northern and central California by neutron activation analysis of glass and comparison with X-ray fluorescence analysis / / by Andrei M. Sarna-Wojcicki, Harry W. Bowman, and Paul C. Russell
Autore Sarna-Wojcicki Andrei M.
Pubbl/distr/stampa Washington : , : United States Department of the Interior, Geological Survey, , 1979
Descrizione fisica 1 online resource (iii, 15 pages) : illustrations, map
Collana Geological Survey professional paper
Soggetto topico Geology, Stratigraphic - Cenozoic
Nuclear activation analysis
Stratigraphic correlation - California
Volcanic ash, tuff, etc - California
X-ray spectroscopy
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910706901803321
Sarna-Wojcicki Andrei M.  
Washington : , : United States Department of the Interior, Geological Survey, , 1979
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Energy dispersion X-ray analysis : X-ray and electron probe analysis
Energy dispersion X-ray analysis : X-ray and electron probe analysis
Pubbl/distr/stampa Philadelphia : , : American Society for Testing and Materials, , 1971
Descrizione fisica 1 online resource ([2], 285 pages) : illustrations, charts, tables, diagrams
Disciplina 537.5/352
Collana ASTM special technical publication Energy dispersion X-ray analysis: X-ray and electron probe analysis.
Soggetto topico Electromagnetic noise
Germanium
X-ray spectroscopy
ISBN 0-8031-5571-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910164726303321
Philadelphia : , : American Society for Testing and Materials, , 1971
Materiale a stampa
Lo trovi qui: Univ. Federico II
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EXAFS spectroscopy, techniques and applications / edited by B. K. Teo and D. C. Joy
EXAFS spectroscopy, techniques and applications / edited by B. K. Teo and D. C. Joy
Pubbl/distr/stampa New York : Plenum Press, c1981
Descrizione fisica viii, 275 p. : ill. ; 26 cm
Disciplina 543.6
Altri autori (Persone) Teo, B. K.
Joy, David C.
Altri autori (Enti) Materials Research Society
Soggetto topico X-ray spectroscopy
Absorption spectra
Extended x-ray absorption fine structure
ISBN 0306406543
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991001348509707536
New York : Plenum Press, c1981
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz
Handbook of X-ray spectrometry : methods and techniques / edited by René E. van Grieken, Andrzej A. Markowicz
Autore Grieken, Rene : van
Pubbl/distr/stampa New York, NY : Marcel Dekker, c1993
Descrizione fisica xiv, 704 p. : ill. ; 26 cm.
Altri autori (Persone) Markowicz, Andrzej
Collana Practical spectroscopy series ; 14
Soggetto topico X-ray spectroscopy
ISBN 0824784839
Classificazione 53.0.692
53.8.8
543.08586
QD96.X2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991000989959707536
Grieken, Rene : van  
New York, NY : Marcel Dekker, c1993
Materiale a stampa
Lo trovi qui: Univ. del Salento
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Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz
Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz
Edizione [2nd ed., rev. and expanded]
Pubbl/distr/stampa New York : Marcel Dekker, c2002
Descrizione fisica xvi, 983 p. : ill. ; 26 cm
Disciplina 543.08586
Altri autori (Persone) Grieken, R. van (René)
Markowicz, Andrzej
Collana Practical spectroscopy ; v. 29
Soggetto topico X-ray spectroscopy
Spectrometry, X-Ray Emission - methods
ISBN 0824706005
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991000555579707536
New York : Marcel Dekker, c2002
Materiale a stampa
Lo trovi qui: Univ. del Salento
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