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Analysis of adhesively bonded ceramics using an asymmetric wedge test [[electronic resource] /] / by Andres Bujanda ... [and others]
| Analysis of adhesively bonded ceramics using an asymmetric wedge test [[electronic resource] /] / by Andres Bujanda ... [and others] |
| Pubbl/distr/stampa | Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2008] |
| Descrizione fisica | vi, 24 pages : digital, PDF file |
| Altri autori (Persone) | BujandaAndres |
| Collana | ARL-TR |
| Soggetto topico |
Ceramic materials - Brittleness - Testing
X-ray photoelectron spectroscopy Composite materials - Bonding - Testing |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910698899703321 |
| Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis
| Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis |
| Autore | Tao Franklin |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Newark : , : John Wiley & Sons, Incorporated, , 2023 |
| Descrizione fisica | 1 online resource (286 pages) |
| Disciplina | 543.62 |
| Soggetto topico |
X-ray photoelectron spectroscopy
Catalysis |
| ISBN |
9781119845485
1119845483 9781119845454 1119845459 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright Page -- Contents -- Preface -- Chapter 1 From Surface of Model Catalyst in UHV to Surface of Nanoparticle Catalyst During Catalysis -- References -- Chapter 2 Application of XPS: from Surface in UHV to Surface in Gas or Liquid Phase -- 2.1 Origin of X-ray Photoelectron Spectroscopy -- 2.2 Applications of XPS to Study Surface in High Vacuum -- 2.3 Applications of XPS to Study Sample in Gas Phase -- 2.4 Applications of XPS to Study Sample in Liquid Phase -- 2.4.1 XPS Studies of Surface of Nanoparticle Catalyst in Static Liquid -- 2.4.2 XPS Studies of Surface of Nanoparticle Catalyst in Flowing Liquid -- 2.4.3 XPS Study of Flowing Gas with a Pressure of 1 atm or Higher -- References -- Chapter 3 Fundamentals of X-ray Photoelectron Spectroscopy -- 3.1 Principle of XPS -- 3.2 Generation of X-ray -- 3.3 Excitation of Photoelectron and Chemical Shift -- 3.3.1 Initial State Effect -- 3.3.2 Final State Effect -- 3.3.2.1 Core Hole-Induced Polarization Final State Effect -- 3.3.2.2 Core Hole-Induced Rearrangement Final State Effect -- 3.4 Measurements of Energy of Photoelectrons -- 3.5 Measurements of Intensity of Photoelectrons -- References -- Chapter 4 Instrumentation of XPS -- 4.1 Regular X-ray Source -- 4.2 X-ray Source with a Monochromator -- 4.3 Energy Analyzer -- 4.4 Detector -- References -- Chapter 5 Significance and Challenge of Studying Surface of a Catalyst in Gaseous Phase -- 5.1 Origin of Difference between Surface in UHV and Surface in Reactant Gas -- 5.2 Intrinsic Feature of Catalytic Sites on Surface: Environmental Sensitivity -- 5.3 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Surface at Ambient Pressure of Reactants -- 5.3.1 Difference among Ex Situ, Semi-In Situ, and In Situ/Operando Studies.
5.3.2 Example of Surface Structures Only Formed and Maintained by Reactant at a Relatively High Pressure -- 5.3.3 Example of Catalyst Structure Only Observable during Catalysis -- 5.4 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Structure at High Pressure -- 5.5 Technical Challenges in Studying Surface of a Catalyst in Gas Phase -- References -- Chapter 6 Instrumentation of Ambient Pressure X-ray Photoelectron Spectrometer -- 6.1 X-ray Source for AP-XPS Studies -- 6.1.1 Brief of X-ray Sources -- 6.1.2 Soft X-ray for AP-XPS and Its Limitation in High Pressure Studies -- 6.1.3 Al K for AP-XPS and Its Challenge in Working at Higher Pressure -- 6.1.4 Hard X-ray for AP-XPS and its Application to High Pressure Studies -- 6.2 Reaction Cell with Capability of Flowing Gas -- 6.2.1 Necessity of Having a Reaction Cell for Performing In Situ/Operando Studies of Catalysis -- 6.2.2 Structure of Reaction Cell -- 6.2.3 Sealing of a Reaction Cell and its Engaging Mechanism -- 6.2.4 Function of a Reaction Cell for AP-XPS Studies of Catalyst -- 6.3 Differential Pumping Energy Analyzer with High Transmission -- 6.4 Mass Spectrometer with Capability of Measurement of Catalytic Performance -- References -- Chapter 7 Experimental Methods of AP-XPS Studies -- 7.1 Leak Test of Reaction Cell -- 7.2 Exclusion of Catalysis by Reaction Cell -- 7.3 Tunning and Control of Sample-Aperture Distance -- 7.4 Sample Heating and Temperature Control -- 7.5 Online Measurement of Reactants and Products -- 7.6 Spectroscopic Titration of Surface Species -- References -- Chapter 8 Difference in Data Analysis Between AP-XPS and High Vacuum XPS -- 8.1 Potential Difference in Measuring Atomic Ratio of Two Elements on Catalyst Surface -- 8.2 Difference in Intensity of Photoelectrons Collected by Energy Analyzer -- 8.3 Difference in Resolution and Baseline of Spectrum. 8.4 Difference in Spectrum between Free Molecules in Gas and Adsorbed Molecules on Surface -- 8.5 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas -- 8.6 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Mixture of Reactants -- 8.7 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas Obtained at Different Temperature for Fair Comparison -- References -- Chapter 9 Significance of Using AP-XPS in Studies of Catalysis -- 9.1 Fundamental of Catalyst Surface -- 9.2 Significance of Characterization of Surface of a Catalyst in Gas Phase -- 9.3 Significance of Using AP-XPS in Fundamental Studies of Catalysis -- References -- Chapter 10 CO Oxidation on Single Crystal Model Catalysts -- 10.1 Pt(557) and Pt(332) in CO -- 10.2 CO Oxidation on Pd(100), Pd(111), and Pd(110) -- 10.2.1 CO Oxidation on Pd(100) -- 10.2.2 CO Oxidation on Pd(111) -- 10.2.3 CO Oxidation on Pd(110) -- 10.3 CO Oxidation on Pt(110) and Pt(111) -- 10.3.1 CO Oxidation on Pt(110) -- 10.3.2 CO Oxidation on Pt(111) -- 10.4 CO Oxidation on Rh(110) -- 10.5 CO Oxidation on Cu(111) -- References -- Chapter 11 CO Oxidation on High Surface Area Catalysts -- 11.1 CO Oxidation on Rh Nanoparticles -- 11.2 CO Oxidation on Ru Nanoparticles -- References -- Chapter 12 Hydrogenation of Carbon Dioxide -- References -- Chapter 13 Water-Gas Shift -- 13.1 Co3O4 and Pt/Co3O4 -- 13.1.1 Gas Composition-dependent Reducibility -- 13.1.2 Active Phase of Co3O4 during Water-Gas Shift -- 13.1.3 Active Phase of 0.5 wt% Pt/Co3O4 at 150-200 °C -- 13.1.4 Active Phase of 0.5 wt% Pt/Co3O4 at 280-350 °C -- 13.1.5 Temperature-dependent Evolution of Active Phase -- 13.2 Pt,Au, Pd, and Cu Supported on CeO2 Nanorods -- 13.3 CuO−Cr2O3−Fe2O3 -- References -- Chapter 14 Complete Oxidation of Methane -- 14.1 Complete Oxidation of Methane on NiCo2O4. 14.2 Complete Oxidation of Methane on NiFe2O4 -- 14.3 Complete Oxidation of Methane on NiO with Different Surface Structures -- References -- Chapter 15 Partial Oxidation of Methanol -- 15.1 Partial Oxidation of Methanol on Pd1Zn3/ZnO -- 15.2 Partial Oxidation of Methanol on Ir1Zn3/ZnO -- References -- Chapter 16 Partial Oxidation of Methane -- 16.1 Partial Oxidation of Methane on Pd/CeO2 -- 16.2 Partial Oxidation of Methane on Pt/CeO2 -- 16.3 Partial Oxidation of Methane on Rh/CeO2 -- References -- Chapter 17 Oxidative Coupling of Methane -- 17.1 OCM on Supported Na2WO4 and Hypothesized Active Phase Na2O2 -- 17.2 First Observation of Na2O2 through AP-XPS Studies at 800 °C -- 17.3 Formation of a Thin Layer of Na2O2 Supported on Na2WO4 -- References -- Chapter 18 Dry and Steam Reforming of Methane -- 18.1 Dry Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Sites -- 18.2 Steam Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Single-atom Sites -- References -- Chapter 19 Reduction of NO with CO -- 19.1 Reduction of NO with CO on Co3O4 -- 19.2 Reduction of NO with CO on Rh1Co3 Clusters Supported on CoO -- References -- Chapter 20 Tuning Catalyst Surfaces for Developing Catalysts -- 20.1 Capability of Compositional Restructuring Checkable with AP-XPS -- 20.2 Tracking Restructuring of Bimetallic Surface under Reaction and Catalytic Conditions for Tuning Catalytic Performance of a Bimetallic Catalyst -- References -- Chapter 21 Photocatalysis -- References -- Index -- EULA. |
| Record Nr. | UNINA-9911020252503321 |
Tao Franklin
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| Newark : , : John Wiley & Sons, Incorporated, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Auger- and x-ray photoelectron spectroscopy in materials science : a user-oriented guide / / Siegfried Hofmann
| Auger- and x-ray photoelectron spectroscopy in materials science : a user-oriented guide / / Siegfried Hofmann |
| Autore | Hofmann S (Siegfried) |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin ; ; Heidelberg, : Springer, 2012 |
| Descrizione fisica | 1 online resource (543 p.) |
| Disciplina | 543.62 |
| Collana | Springer series in surface sciences |
| Soggetto topico |
X-ray photoelectron spectroscopy
Auger effect |
| ISBN | 3-642-27381-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Outline of the Technique/Brief Description -- Theoretical Background -- Instrumentation -- Practical Surface Analysis with AES -- Data Evaluation/Quantification -- Problem Solving with AES (Examples). |
| Record Nr. | UNINA-9910437802903321 |
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Hofmann S (Siegfried)
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| Berlin ; ; Heidelberg, : Springer, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Oxidation of polyethylene [[electronic resource] ] : a comparison of plasma and ultraviolet ozone processing techniques / / by Nicole Zander, Daphne Pappas, and Ben Stein
| Oxidation of polyethylene [[electronic resource] ] : a comparison of plasma and ultraviolet ozone processing techniques / / by Nicole Zander, Daphne Pappas, and Ben Stein |
| Autore | Zander Nicole |
| Pubbl/distr/stampa | Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2009] |
| Descrizione fisica | iv, 16 pages : digital, PDF file |
| Altri autori (Persone) |
PappasDaphne
SteinBen |
| Collana | ARL-TR |
| Soggetto topico |
Polyethylene
X-ray photoelectron spectroscopy Ultraviolet radiation Oxidation Surface energy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Oxidation of polyethylene |
| Record Nr. | UNINA-9910698753103321 |
|
Zander Nicole
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| Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2009] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West
| Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West |
| Pubbl/distr/stampa | Cambridge, UK, : RSC Pub., c2008 |
| Descrizione fisica | 1 online resource (304 p.) |
| Disciplina | 543.62 |
| Altri autori (Persone) |
PottsP. J
WestMargaret |
| Soggetto topico |
X-ray spectroscopy
X-ray photoelectron spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-84755-864-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Portable X-ray_revised; i_iv; v_vi; vii_xii; 001_012; 013_038; 039_055; 056_082; 083_097; 098_140; 141_173; 174_205; 206_246; 247_278; 279_291 |
| Record Nr. | UNINA-9910454968703321 |
| Cambridge, UK, : RSC Pub., c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West
| Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West |
| Pubbl/distr/stampa | Cambridge, UK, : RSC Pub., c2008 |
| Descrizione fisica | 1 online resource (304 p.) |
| Disciplina | 543.62 |
| Altri autori (Persone) |
PottsP. J
WestMargaret |
| Soggetto topico |
X-ray spectroscopy
X-ray photoelectron spectroscopy |
| ISBN | 1-84755-864-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Portable X-ray_revised; i_iv; v_vi; vii_xii; 001_012; 013_038; 039_055; 056_082; 083_097; 098_140; 141_173; 174_205; 206_246; 247_278; 279_291 |
| Record Nr. | UNINA-9910778305603321 |
| Cambridge, UK, : RSC Pub., c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy : an introduction to principles and practices / / Paul van der Heide
| X-ray photoelectron spectroscopy : an introduction to principles and practices / / Paul van der Heide |
| Autore | Van der Heide Paul <1962-> |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, c2012 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina | 543/.62 |
| Soggetto topico |
X-ray photoelectron spectroscopy
Spectrum analysis |
| ISBN |
9786613332479
9781283332477 1283332477 9781118162903 1118162900 9781118162897 1118162897 9781118162927 1118162927 |
| Classificazione | SCI078000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-RAY PHOTOELECTRON SPECTROSCOPY: An Introduction to Principles and Practices; CONTENTS; FOREWORD; PREFACE; ACKNOWLEDGMENTS; LIST OF CONSTANTS; CHAPTER 1: INTRODUCTION; 1.1 SURFACE ANALYSIS; 1.2 XPS/ESCA FOR SURFACE ANALYSIS; 1.3 HISTORICAL PERSPECTIVE; 1.4 PHYSICAL BASIS OF XPS; 1.5 SENSITIVITY AND SPECIFICITY OF XPS; 1.6 SUMMARY; CHAPTER 2: ATOMS, IONS, AND THEIR ELECTRONIC STRUCTURE; 2.1 ATOMS, IONS, AND MATTER; 2.1.1 Atomic Structure; 2.1.2 Electronic Structure; 2.1.2.1 Quantum Numbers; 2.1.2.2 Stationary-State Notation; 2.1.2.3 Stationary-State Transition Notation
2.1.2.4 Stationary States 2.1.2.5 Spin Orbit Splitting; 2.2 SUMMARY; CHAPTER 3: XPS INSTRUMENTATION; 3.1 PREREQUISITES OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS); 3.1.1 Vacuum; 3.1.1.1 Vacuum Systems; 3.1.2 X-ray Sources; 3.1.2.1 Standard Sources; 3.1.2.2 Monochromated Sources; 3.1.2.3 Gas Discharge Lamps; 3.1.2.4 Synchrotron Sources; 3.1.3 Electron Sources; 3.1.3.1 Thermionic Sources; 3.1.4 Ion Sources; 3.1.4.1 EI Sources; 3.1.5 Energy Analyzers; 3.1.5.1 CMA; 3.1.5.2 CHA; 3.1.5.3 Modes of Operation; 3.1.5.4 Energy Resolution; 3.1.6 Detectors; 3.1.6.1 EMs; 3.1.7 Imaging; 3.1.7.1 Serial Imaging 3.1.7.2 Parallel Imaging 3.1.7.3 Spatial Resolution; 3.2 SUMMARY; CHAPTER 4: DATA COLLECTION AND QUANTIFICATION; 4.1 ANALYSIS PROCEDURES; 4.1.1 Sample Handling; 4.1.2 Data Collection; 4.1.3 Energy Referencing; 4.1.4 Charge Compensation; 4.1.5 X-ray and Electron-Induced Damage; 4.2 PHOTOELECTRON INTENSITIES; 4.2.1 Photoelectron Cross Sections; 4.2.2 The Analyzed Volume; 4.2.2.1 Electron Path Lengths; 4.2.2.2 Takeoff Angle; 4.2.3 The Background Signal; 4.2.4 Quantification; 4.3 INFORMATION AS A FUNCTION OF DEPTH; 4.3.1 Opening up the Third Dimension; 4.3.1.1 AR-XPS and Energy-Resolved XPS 4.3.1.2 Sputter Depth Profiling 4.4 SUMMARY; CHAPTER 5: SPECTRAL INTERPRETATION; 5.1 SPECIATION; 5.1.1 Photoelectron Binding Energies; 5.1.1.1 The Z + 1 Approximation; 5.1.1.2 Initial State Effects; 5.1.1.3 Final State Effects; 5.1.1.4 The Auger Parameter; 5.1.1.5 Curve Fitting; 5.2 SUMMARY; CHAPTER 6: SOME CASE STUDIES; 6.1 OVERVIEW; 6.1.1 Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT); 6.1.2 Analysis of Group IIA-IV Metal Oxides; 6.1.3 Analysis of Mixed Metal Oxides of Interest as SOFC Cathodes; 6.1.4 Analysis of YBCO and Related Oxides/Carbonates; 6.2 SUMMARY; APPENDICES APPENDIX A: PERIODIC TABLE OF THE ELEMENTS APPENDIX B: BINDING ENERGIES (B.E.XPS ORB.E.XRF) OF THE ELEMENTS; B.1 1S-3S, 2P-3P, AND 3D VALUES; B.2 4S-5S, 4P-5P, AND 4D VALUES; APPENDIX C: SOME QUANTUM MECHANICS CALCULATIONS OF INTEREST; APPENDIX D: SOME STATISTICAL DISTRIBUTIONS OF INTEREST; D.1 GAUSSIAN DISTRIBUTION; D.2 POISSON DISTRIBUTION; D.3 LORENTZIAN DISTRIBUTIONS; APPENDIX E: SOME OPTICAL PROPERTIES OF INTEREST; E.1 CHROMATIC ABERRATIONS; E.2 SPHERICAL ABERRATIONS; E.3 DIFFRACTION LIMIT; APPENDIX F: SOME OTHER SPECTROSCOPIC/SPECTROMETRIC TECHNIQUES OF INTEREST F.1 PHOTON SPECTROSCOPIES |
| Record Nr. | UNINA-9910139552903321 |
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Van der Heide Paul <1962->
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| Hoboken, N.J., : Wiley, c2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor
| X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (290 p.) |
| Disciplina | 543/.62 |
| Altri autori (Persone) | WagnerJohanna M |
| Collana | Chemical engineering methods and technology |
| Soggetto topico | X-ray photoelectron spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-61728-240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA""; ""CONTENTS ""; ""PREFACE ""; ""Chapter 1: X-RAY PHOTOELECTRON SPECTROSCOPY: STUDIES FROM INDUSTRIAL & BIOACTIVE GLASS TO BIOMATERIALS""; ""ABSTRACT ""; ""1. X-RAY PHOTOELECTRON SPECTROSCOPY: CONCEPT AND PRINCIPLES""; ""2. RELATING GLASS TO XPS ""; ""3. SILICATE GLASS CORROSION ""; ""4. APPLICATION OF XPS TO GLASS CORROSION""; ""5. XPS ROLE IN GLASS FABRICATION ""; ""6. EVOLUTION OF BIOACTIVE GLASSES ""; ""7. GLASS BASED BIOMATERIALS: GLASS IONOMER CEMENTS ""
""REFERENCES """"Chapter 2: XPS FOR INVESTIGATING CULTURAL HERITAGE MATERIALS""; ""ABSTRACT ""; ""1. INTRODUCTION ""; ""2. PIGMENTS IDENTIFICATION AND ALTERATION IN PAINT LAYERS""; ""2.1. The Case of Copper Resinate ""; ""2.2. The Case of Smalt""; ""3. STONE ""; ""3.1. The Case of Michealgelo's David ""; ""4. GLASS ""; ""5. SURFACE MODIFICATIONS INDUCED BY CLEANING AND PROTECTIVE TREATMENTS ""; ""6. BRONZE ""; ""REFERENCES ""; ""Chapter 3: X-RAY PHOTOELECTRON SPECTROSCOPY APPLIED TO ATOMIC STRUCTURE ANALYSIS OF SILICATE GLASSES THIN LAYERS ""; ""ABSTRACT ""; ""INTRODUCTION"" ""EXPERIMENTAL """"SILICA STRUCTURE ""; ""STRUCTURE OF SILICA FILMS PRODUCED BY CATHODE SPRAY DEPOSITION OF SILICON IN OXYGEN MEDIUM""; ""STRUCTURE OF SOL-GEL SILICA FILMS""; ""STRUCTURE OF LEAD-SILICATE GLASSES ""; ""THE SECONDARY-ELECTRON EMISSION COEFFICIENTS OF LEAD SILICATE GLASSES ""; ""CONCLUSION ""; ""REFERENCES ""; ""Chapter 4: INFLUENCE OF NO2 ON ATMOSPHERIC CORROSION OF ZINC EXPOSED IN A CLIMATE CHAMBER ""; ""ABSTRACT ""; ""INTRODUCTION ""; ""EXPERIMENTAL PROCEDURE ""; ""ZINC SAMPLES WITHOUT EXPOSURE ""; ""EXPOSITION AT 35°C ""; ""EXPOSITION AT 25°C "" ""INFLUENCE OF ION SPUTTERING ON THE S2P PHOTOELECTRON PEAK FOR ZINC-SULFUR CORROSION PRODUCTS """"CONCLUSION ""; ""REFERENCES ""; ""Chapter 5: X-RAY PHOTOELECTRON SPECTROSCOPY AS A TOOL IN THE STUDY OF NANOSTRUCTURED TITANIUM AND COMMERCIAL PET SURFACES IN BIOTECHNOLOGICAL APPLICATIONS ""; ""ABSTRACT ""; ""1. XPS AND BIOTECHNOLOGY ""; ""2. CASE STUDY 1 TITANIUM OXIDATION STATES ON TITANIUM THIN FILMS AND BULK SURFACES ""; ""2.1. Experimental Design ""; ""2.2. Elemental Analysis ""; ""2.3. Titanium Oxidation States ""; ""2.4. Carbon Contamination ""; ""2.5. Conclusions "" ""3. CASE STUDY 2 BACTERIAL MODIFICATION OF POLY(ETHYLENE TEREPHTHALATE) POLYMER SURFACES""""3.1. Experimental Design ""; ""3.2. Elemental Analysis ""; ""3.3. High-Resolution Spectra ""; ""3.4. Bacterial Modifications ""; ""3.5. Carbon Contamination ""; ""3.6. Conclusions ""; ""4. SUMMARY ""; ""5. REFERENCES ""; ""Chapter 6: XPS AS A POWERFUL TOOL TO INVESTIGATE THE SURFACE PROPERTIES OF SIMPLE, DOPED AND MIXED METAL OXIDES ""; ""ABSTRACT ""; ""ABBREVIATIONS AND ACRONYMS ""; ""GENERAL REMARKS ""; ""1. Metal oxides: a general overview ""; ""1.1. General remarks on metal oxides "" ""1.2 Importance of surface in metal oxides "" |
| Record Nr. | UNINA-9910457922903321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor
| X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (290 p.) |
| Disciplina | 543/.62 |
| Altri autori (Persone) | WagnerJohanna M |
| Collana | Chemical engineering methods and technology |
| Soggetto topico | X-ray photoelectron spectroscopy |
| ISBN | 1-61728-240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA""; ""CONTENTS ""; ""PREFACE ""; ""Chapter 1: X-RAY PHOTOELECTRON SPECTROSCOPY: STUDIES FROM INDUSTRIAL & BIOACTIVE GLASS TO BIOMATERIALS""; ""ABSTRACT ""; ""1. X-RAY PHOTOELECTRON SPECTROSCOPY: CONCEPT AND PRINCIPLES""; ""2. RELATING GLASS TO XPS ""; ""3. SILICATE GLASS CORROSION ""; ""4. APPLICATION OF XPS TO GLASS CORROSION""; ""5. XPS ROLE IN GLASS FABRICATION ""; ""6. EVOLUTION OF BIOACTIVE GLASSES ""; ""7. GLASS BASED BIOMATERIALS: GLASS IONOMER CEMENTS ""
""REFERENCES """"Chapter 2: XPS FOR INVESTIGATING CULTURAL HERITAGE MATERIALS""; ""ABSTRACT ""; ""1. INTRODUCTION ""; ""2. PIGMENTS IDENTIFICATION AND ALTERATION IN PAINT LAYERS""; ""2.1. The Case of Copper Resinate ""; ""2.2. The Case of Smalt""; ""3. STONE ""; ""3.1. The Case of Michealgelo's David ""; ""4. GLASS ""; ""5. SURFACE MODIFICATIONS INDUCED BY CLEANING AND PROTECTIVE TREATMENTS ""; ""6. BRONZE ""; ""REFERENCES ""; ""Chapter 3: X-RAY PHOTOELECTRON SPECTROSCOPY APPLIED TO ATOMIC STRUCTURE ANALYSIS OF SILICATE GLASSES THIN LAYERS ""; ""ABSTRACT ""; ""INTRODUCTION"" ""EXPERIMENTAL """"SILICA STRUCTURE ""; ""STRUCTURE OF SILICA FILMS PRODUCED BY CATHODE SPRAY DEPOSITION OF SILICON IN OXYGEN MEDIUM""; ""STRUCTURE OF SOL-GEL SILICA FILMS""; ""STRUCTURE OF LEAD-SILICATE GLASSES ""; ""THE SECONDARY-ELECTRON EMISSION COEFFICIENTS OF LEAD SILICATE GLASSES ""; ""CONCLUSION ""; ""REFERENCES ""; ""Chapter 4: INFLUENCE OF NO2 ON ATMOSPHERIC CORROSION OF ZINC EXPOSED IN A CLIMATE CHAMBER ""; ""ABSTRACT ""; ""INTRODUCTION ""; ""EXPERIMENTAL PROCEDURE ""; ""ZINC SAMPLES WITHOUT EXPOSURE ""; ""EXPOSITION AT 35°C ""; ""EXPOSITION AT 25°C "" ""INFLUENCE OF ION SPUTTERING ON THE S2P PHOTOELECTRON PEAK FOR ZINC-SULFUR CORROSION PRODUCTS """"CONCLUSION ""; ""REFERENCES ""; ""Chapter 5: X-RAY PHOTOELECTRON SPECTROSCOPY AS A TOOL IN THE STUDY OF NANOSTRUCTURED TITANIUM AND COMMERCIAL PET SURFACES IN BIOTECHNOLOGICAL APPLICATIONS ""; ""ABSTRACT ""; ""1. XPS AND BIOTECHNOLOGY ""; ""2. CASE STUDY 1 TITANIUM OXIDATION STATES ON TITANIUM THIN FILMS AND BULK SURFACES ""; ""2.1. Experimental Design ""; ""2.2. Elemental Analysis ""; ""2.3. Titanium Oxidation States ""; ""2.4. Carbon Contamination ""; ""2.5. Conclusions "" ""3. CASE STUDY 2 BACTERIAL MODIFICATION OF POLY(ETHYLENE TEREPHTHALATE) POLYMER SURFACES""""3.1. Experimental Design ""; ""3.2. Elemental Analysis ""; ""3.3. High-Resolution Spectra ""; ""3.4. Bacterial Modifications ""; ""3.5. Carbon Contamination ""; ""3.6. Conclusions ""; ""4. SUMMARY ""; ""5. REFERENCES ""; ""Chapter 6: XPS AS A POWERFUL TOOL TO INVESTIGATE THE SURFACE PROPERTIES OF SIMPLE, DOPED AND MIXED METAL OXIDES ""; ""ABSTRACT ""; ""ABBREVIATIONS AND ACRONYMS ""; ""GENERAL REMARKS ""; ""1. Metal oxides: a general overview ""; ""1.1. General remarks on metal oxides "" ""1.2 Importance of surface in metal oxides "" |
| Record Nr. | UNINA-9910779094703321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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