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An introduction to synchrotron radiation : techniques and applications / / Phil Willmott
| An introduction to synchrotron radiation : techniques and applications / / Phil Willmott |
| Autore | Willmott Philip |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2019 |
| Descrizione fisica | 1 online resource (504 pages) |
| Disciplina | 539.735 |
| Soggetto topico |
Synchrotron radiation
X-ray optics |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-119-28038-9
1-119-28037-0 1-119-28045-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The interaction of x-rays with matter -- Synchrotron physics -- Free-electron lasers -- Beamlines -- Scattering techniques -- Spectroscopic techniques -- Imaging techniques. |
| Record Nr. | UNINA-9910554855703321 |
Willmott Philip
|
||
| Hoboken, NJ : , : Wiley, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An introduction to synchrotron radiation : techniques and applications / / Phil Willmott
| An introduction to synchrotron radiation : techniques and applications / / Phil Willmott |
| Autore | Willmott Philip |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2019 |
| Descrizione fisica | 1 online resource (504 pages) |
| Disciplina | 539.735 |
| Soggetto topico |
Synchrotron radiation
X-ray optics |
| ISBN |
1-119-28038-9
1-119-28037-0 1-119-28045-1 |
| Classificazione | OPT 280 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The interaction of x-rays with matter -- Synchrotron physics -- Free-electron lasers -- Beamlines -- Scattering techniques -- Spectroscopic techniques -- Imaging techniques. |
| Record Nr. | UNINA-9910677834703321 |
|
Willmott Philip
|
||
| Hoboken, NJ : , : Wiley, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications
| Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications |
| Autore | Willmott Philip |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2011 |
| Descrizione fisica | 1 online resource (370 p.) |
| Disciplina | 539.7/35 |
| Soggetto topico |
Synchrotron radiation
X-ray optics |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-119-97286-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Introduction to Synchrotron Radiation; Contents; Preface; Acknowledgements; 1. Introduction; 1.1 A Potted History of X-rays; 1.2 Synchrotron Sources Over the Last 50 Years; References; 2. The Interaction of X-rays with Matter; 2.1 Introduction; 2.2 The Electromagnetic Spectrum; 2.3 Thomson Scattering; 2.4 Compton Scattering; 2.5 Atomic Scattering Factors; 2.5.1 Scattering From a Cloud of Free Electrons; 2.5.2 Correction Terms for the Atomic Scattering Factor; 2.6 The Refractive Index, Reflection and Absorption; 2.6.1 The Refractive Index; 2.6.2 Refraction and Reflection; 2.6.3 Absorption
2.7 X-ray Fluorescence and Auger Emission2.7.1 X-ray Fluorescence; 2.7.2 Auger Emission; 2.7.3 Fluorescence or Auger?; 2.8 Concluding Remarks; References; 3. Synchrotron Physics; 3.1 Introduction; 3.2 Overview; 3.3 Radiation From Relativistic Electrons; 3.3.1 Magnetic Deflection Fields; 3.3.2 Radiated Power Loss in Synchrotrons; 3.4 Radio Frequency Power Supply and Bunching; 3.5 Photon Beam Properties; 3.5.1 Flux and Brilliance; 3.5.2 Emittance; 3.5.3 Coherence; 3.5.4 Polarization of Synchrotron Radiation; 3.6 Bending Magnets and Superbends; 3.7 Insertion Devices; 3.7.1 Wigglers 3.7.2 Worked Example: The SLS Materials Science Beamline Wiggler3.7.3 Undulators; 3.8 Future Sources of Synchrotron Light; 3.8.1 The Energy Recovery Linac; 3.8.2 The Free-Electron Laser; 3.8.3 Tabletop Synchrotrons; 3.9 Concluding Remarks; References; 4. Beamlines; 4.1 Introduction; 4.2 Front End; 4.2.1 Beam-Position Monitors; 4.2.2 Primary Aperture and Front-End Slits; 4.2.3 Low-Energy Filters; 4.3 Primary Optics; 4.3.1 X-ray Mirrors; 4.3.2 Mirror Focal Lengths - The Coddington Equations; 4.3.3 Monochromators; 4.3.4 Focusing Geometry; 4.4 Microfocus and Nanofocus Optics; 4.4.1 Lens Types 4.5 Beam Intensity Monitors4.6 Detectors; 4.6.1 Photographic Plates; 4.6.2 Scintillator Detectors; 4.6.3 The Point-Spread Function; 4.6.4 Crystal Analysers; 4.6.5 Image Plates and Charge-Coupled Devices; 4.6.6 Pixel and Microstrip Detectors; 4.6.7 Energy-Dispersive Detectors; 4.7 Time-Resolved Experiments; 4.7.1 Avalanche Photodiodes; 4.7.2 Streak Cameras; 4.8 Concluding Remarks; References; 5. Scattering Techniques; 5.1 Introduction; 5.2 Diffraction at Synchrotron Sources; 5.3 Description of Crystals; 5.3.1 Lattices and Bases; 5.3.2 Crystal Planes 5.3.3 Labelling Crystallographic Planes and Axes5.4 Basic Tenets of X-ray Diffraction; 5.4.1 Introduction; 5.4.2 The Bragg Law and the Reciprocal Lattice; 5.4.3 The Influence of the Basis; 5.4.4 Kinematical and Dynamical Diffraction; 5.5 Diffraction and the Convolution Theorem; 5.5.1 The Convolution Theorem; 5.5.2 Understanding the Structure Factor; 5.6 The Phase Problem and Anomalous Diffraction; 5.6.1 Introduction; 5.6.2 The Patterson Map; 5.6.3 Friedel's Law and Bijvoet Mates; 5.6.4 Anomalous Diffraction; 5.6.5 Direct Methods; 5.7 Types of Crystalline Samples 5.8 Single Crystal Diffraction |
| Record Nr. | UNINA-9910453593703321 |
|
Willmott Philip
|
||
| Hoboken, : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications
| Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications |
| Autore | Willmott Philip |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2011 |
| Descrizione fisica | 1 online resource (370 p.) |
| Disciplina | 539.7/35 |
| Soggetto topico |
Synchrotron radiation
X-ray optics |
| ISBN | 1-119-97286-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Introduction to Synchrotron Radiation; Contents; Preface; Acknowledgements; 1. Introduction; 1.1 A Potted History of X-rays; 1.2 Synchrotron Sources Over the Last 50 Years; References; 2. The Interaction of X-rays with Matter; 2.1 Introduction; 2.2 The Electromagnetic Spectrum; 2.3 Thomson Scattering; 2.4 Compton Scattering; 2.5 Atomic Scattering Factors; 2.5.1 Scattering From a Cloud of Free Electrons; 2.5.2 Correction Terms for the Atomic Scattering Factor; 2.6 The Refractive Index, Reflection and Absorption; 2.6.1 The Refractive Index; 2.6.2 Refraction and Reflection; 2.6.3 Absorption
2.7 X-ray Fluorescence and Auger Emission2.7.1 X-ray Fluorescence; 2.7.2 Auger Emission; 2.7.3 Fluorescence or Auger?; 2.8 Concluding Remarks; References; 3. Synchrotron Physics; 3.1 Introduction; 3.2 Overview; 3.3 Radiation From Relativistic Electrons; 3.3.1 Magnetic Deflection Fields; 3.3.2 Radiated Power Loss in Synchrotrons; 3.4 Radio Frequency Power Supply and Bunching; 3.5 Photon Beam Properties; 3.5.1 Flux and Brilliance; 3.5.2 Emittance; 3.5.3 Coherence; 3.5.4 Polarization of Synchrotron Radiation; 3.6 Bending Magnets and Superbends; 3.7 Insertion Devices; 3.7.1 Wigglers 3.7.2 Worked Example: The SLS Materials Science Beamline Wiggler3.7.3 Undulators; 3.8 Future Sources of Synchrotron Light; 3.8.1 The Energy Recovery Linac; 3.8.2 The Free-Electron Laser; 3.8.3 Tabletop Synchrotrons; 3.9 Concluding Remarks; References; 4. Beamlines; 4.1 Introduction; 4.2 Front End; 4.2.1 Beam-Position Monitors; 4.2.2 Primary Aperture and Front-End Slits; 4.2.3 Low-Energy Filters; 4.3 Primary Optics; 4.3.1 X-ray Mirrors; 4.3.2 Mirror Focal Lengths - The Coddington Equations; 4.3.3 Monochromators; 4.3.4 Focusing Geometry; 4.4 Microfocus and Nanofocus Optics; 4.4.1 Lens Types 4.5 Beam Intensity Monitors4.6 Detectors; 4.6.1 Photographic Plates; 4.6.2 Scintillator Detectors; 4.6.3 The Point-Spread Function; 4.6.4 Crystal Analysers; 4.6.5 Image Plates and Charge-Coupled Devices; 4.6.6 Pixel and Microstrip Detectors; 4.6.7 Energy-Dispersive Detectors; 4.7 Time-Resolved Experiments; 4.7.1 Avalanche Photodiodes; 4.7.2 Streak Cameras; 4.8 Concluding Remarks; References; 5. Scattering Techniques; 5.1 Introduction; 5.2 Diffraction at Synchrotron Sources; 5.3 Description of Crystals; 5.3.1 Lattices and Bases; 5.3.2 Crystal Planes 5.3.3 Labelling Crystallographic Planes and Axes5.4 Basic Tenets of X-ray Diffraction; 5.4.1 Introduction; 5.4.2 The Bragg Law and the Reciprocal Lattice; 5.4.3 The Influence of the Basis; 5.4.4 Kinematical and Dynamical Diffraction; 5.5 Diffraction and the Convolution Theorem; 5.5.1 The Convolution Theorem; 5.5.2 Understanding the Structure Factor; 5.6 The Phase Problem and Anomalous Diffraction; 5.6.1 Introduction; 5.6.2 The Patterson Map; 5.6.3 Friedel's Law and Bijvoet Mates; 5.6.4 Anomalous Diffraction; 5.6.5 Direct Methods; 5.7 Types of Crystalline Samples 5.8 Single Crystal Diffraction |
| Record Nr. | UNINA-9910791205503321 |
|
Willmott Philip
|
||
| Hoboken, : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An introduction to synchrotron radiation : techniques and applications / / Phil Willmott
| An introduction to synchrotron radiation : techniques and applications / / Phil Willmott |
| Autore | Willmott Phil (Phil R.) |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Chichester, West Sussex, U.K., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (370 p.) |
| Disciplina | 539.7/35 |
| Soggetto topico |
Synchrotron radiation
X-ray optics |
| ISBN | 1-119-97286-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
An Introduction to Synchrotron Radiation; Contents; Preface; Acknowledgements; 1. Introduction; 1.1 A Potted History of X-rays; 1.2 Synchrotron Sources Over the Last 50 Years; References; 2. The Interaction of X-rays with Matter; 2.1 Introduction; 2.2 The Electromagnetic Spectrum; 2.3 Thomson Scattering; 2.4 Compton Scattering; 2.5 Atomic Scattering Factors; 2.5.1 Scattering From a Cloud of Free Electrons; 2.5.2 Correction Terms for the Atomic Scattering Factor; 2.6 The Refractive Index, Reflection and Absorption; 2.6.1 The Refractive Index; 2.6.2 Refraction and Reflection; 2.6.3 Absorption
2.7 X-ray Fluorescence and Auger Emission2.7.1 X-ray Fluorescence; 2.7.2 Auger Emission; 2.7.3 Fluorescence or Auger?; 2.8 Concluding Remarks; References; 3. Synchrotron Physics; 3.1 Introduction; 3.2 Overview; 3.3 Radiation From Relativistic Electrons; 3.3.1 Magnetic Deflection Fields; 3.3.2 Radiated Power Loss in Synchrotrons; 3.4 Radio Frequency Power Supply and Bunching; 3.5 Photon Beam Properties; 3.5.1 Flux and Brilliance; 3.5.2 Emittance; 3.5.3 Coherence; 3.5.4 Polarization of Synchrotron Radiation; 3.6 Bending Magnets and Superbends; 3.7 Insertion Devices; 3.7.1 Wigglers 3.7.2 Worked Example: The SLS Materials Science Beamline Wiggler3.7.3 Undulators; 3.8 Future Sources of Synchrotron Light; 3.8.1 The Energy Recovery Linac; 3.8.2 The Free-Electron Laser; 3.8.3 Tabletop Synchrotrons; 3.9 Concluding Remarks; References; 4. Beamlines; 4.1 Introduction; 4.2 Front End; 4.2.1 Beam-Position Monitors; 4.2.2 Primary Aperture and Front-End Slits; 4.2.3 Low-Energy Filters; 4.3 Primary Optics; 4.3.1 X-ray Mirrors; 4.3.2 Mirror Focal Lengths - The Coddington Equations; 4.3.3 Monochromators; 4.3.4 Focusing Geometry; 4.4 Microfocus and Nanofocus Optics; 4.4.1 Lens Types 4.5 Beam Intensity Monitors4.6 Detectors; 4.6.1 Photographic Plates; 4.6.2 Scintillator Detectors; 4.6.3 The Point-Spread Function; 4.6.4 Crystal Analysers; 4.6.5 Image Plates and Charge-Coupled Devices; 4.6.6 Pixel and Microstrip Detectors; 4.6.7 Energy-Dispersive Detectors; 4.7 Time-Resolved Experiments; 4.7.1 Avalanche Photodiodes; 4.7.2 Streak Cameras; 4.8 Concluding Remarks; References; 5. Scattering Techniques; 5.1 Introduction; 5.2 Diffraction at Synchrotron Sources; 5.3 Description of Crystals; 5.3.1 Lattices and Bases; 5.3.2 Crystal Planes 5.3.3 Labelling Crystallographic Planes and Axes5.4 Basic Tenets of X-ray Diffraction; 5.4.1 Introduction; 5.4.2 The Bragg Law and the Reciprocal Lattice; 5.4.3 The Influence of the Basis; 5.4.4 Kinematical and Dynamical Diffraction; 5.5 Diffraction and the Convolution Theorem; 5.5.1 The Convolution Theorem; 5.5.2 Understanding the Structure Factor; 5.6 The Phase Problem and Anomalous Diffraction; 5.6.1 Introduction; 5.6.2 The Patterson Map; 5.6.3 Friedel's Law and Bijvoet Mates; 5.6.4 Anomalous Diffraction; 5.6.5 Direct Methods; 5.7 Types of Crystalline Samples 5.8 Single Crystal Diffraction |
| Record Nr. | UNINA-9910809602303321 |
|
Willmott Phil (Phil R.)
|
||
| Chichester, West Sussex, U.K., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Modern developments in X-ray and neutron optics / / Alexei Erko [and three others], editors
| Modern developments in X-ray and neutron optics / / Alexei Erko [and three others], editors |
| Edizione | [1st ed. 2008.] |
| Pubbl/distr/stampa | Berlin, Germany : , : Springer-Verlag, , [2008] |
| Descrizione fisica | 1 online resource (XXIV, 534 p. 299 illus., 5 illus. in color.) |
| Disciplina | 539.7213 |
| Collana | Springer Series in Optical Sciences |
| Soggetto topico |
Neutron optics
X-ray optics |
| ISBN | 3-540-74561-0 |
| Classificazione |
530
UH 5100 UN 6700 UQ 5100 UX 1320 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Theoretical Approaches and Calculations -- X-Ray and Neutron Optical Systems -- The BESSY Raytrace Program RAY -- Neutron Beam Phase Space Mapping -- Raytrace of Neutron Optical Systems with RESTRAX -- Wavefront Propagation -- Theoretical Analysis of X-Ray Waveguides -- Focusing Optics for Neutrons -- Volume Effects in Zone Plates -- Nano-Optics Metrology -- Slope Error and Surface Roughness -- The Long Trace Profilers -- The Nanometer Optical Component Measuring Machine -- Shape Optimization of High Performance X-Ray Optics -- Measurement of Groove Density of Diffraction Gratings -- The COST P7 Round Robin for Slope Measuring Profilers -- Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology -- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data -- Refection/Refraction Optics -- Hard X-Ray Microoptics -- Capillary Optics for X-Rays -- Reflective Optical Arrays -- Reflective Optical Structures and Imaging Detector Systems -- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays -- Multilayer Optics Developments -- Neutron Supermirror Development -- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics -- Multilayers with Ultra-Short Periods -- Specially Designed Multilayers -- Diffraction Optics -- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces -- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering -- Volume Modulated Diffraction X-Ray Optics -- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors -- Thermal Effects under Synchrotron Radiation Power Absorption. |
| Record Nr. | UNINA-9910146748703321 |
| Berlin, Germany : , : Springer-Verlag, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray optics and instrumentation
| X-ray optics and instrumentation |
| Pubbl/distr/stampa | New York, NY, : Hindawi Publ |
| Soggetto topico | X-ray optics |
| Soggetto genere / forma | Periodicals. |
| Soggetto non controllato | Applied Physics |
| ISSN | 1687-7640 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996336813203316 |
| New York, NY, : Hindawi Publ | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
X-ray optics and instrumentation
| X-ray optics and instrumentation |
| Pubbl/distr/stampa | New York, NY, : Hindawi Publ |
| Soggetto topico | X-ray optics |
| Soggetto genere / forma | Periodicals. |
| Soggetto non controllato | Applied Physics |
| ISSN | 1687-7640 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146256203321 |
| New York, NY, : Hindawi Publ | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
