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Correction factors for on-line microprobe analysis of multielement alloy systems [[electronic resource] /] / Jalaiah Unnam, Darrel R. Tenney, and William D. Brewer
| Correction factors for on-line microprobe analysis of multielement alloy systems [[electronic resource] /] / Jalaiah Unnam, Darrel R. Tenney, and William D. Brewer |
| Autore | Unnam Jalaiah |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, Scientific and Technical Information Office, , 1977 |
| Descrizione fisica | 1 online resource (v, 211 pages) : illustrations |
| Altri autori (Persone) |
TenneyDarrel R
BrewerWilliam D |
| Collana | NASA reference publication |
| Soggetto topico |
Electron probe microanalysis
Alloys - Analysis Microprobe analysis X-ray microanalysis |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910701999403321 |
Unnam Jalaiah
|
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| Washington, D.C. : , : National Aeronautics and Space Administration, Scientific and Technical Information Office, , 1977 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege
| High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege |
| Autore | Hau-Riege Stefan P. |
| Pubbl/distr/stampa | Weinheim : , : Wiley-VCH, , [2011] |
| Descrizione fisica | 1 online resource (521 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
X-rays - Scattering
Materials - Effect of radiation on X-ray microanalysis |
| Soggetto genere / forma | Electronic books. |
| ISBN |
3-527-63638-2
3-527-63637-4 3-527-63636-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright; Dedication; Preface; Chapter 1: Introduction; 1.1 Examples for the Application of X-Ray-Matter Interaction; 1.2 Electromagnetic Spectrum; 1.3 X-Ray Light Sources; 1.4 Fundamental Models to Describe X-Ray-Matter Interaction; 1.5 Introduction to X-Ray-Matter Interaction Processes; 1.6 Databases Relevant to Photon-Matter Interaction; References; Chapter 2: Atomic Physics; 2.1 Atomic States; 2.2 Atomic Processes; 2.3 Effect of Plasma Environment; References; Chapter 3: Scattering of X-Ray Radiation; 3.1 Scattering by Free Charges
3.2 Scattering by Atoms and Ions3.3 Scattering by Gases, Liquids, and Amorphous Solids; 3.4 Scattering by Plasmas; 3.5 Scattering by Crystals; References; Chapter 4: Electromagnetic Wave Propagation; 4.1 Electromagnetic Waves in Matter; 4.2 Reflection and Refraction at Interfaces; 4.3 Reflection by Thin Films, Bilayers, and Multilayers; 4.4 Dispersive Interaction of Wavepackets with Materials; 4.5 Kramers-Kronig Relation; References; Chapter 5: Electron Dynamics; 5.1 Transition of Solids into Plasmas; 5.2 Directional Emission of Photoelectrons; 5.3 Electron Scattering 5.4 Energy Loss Mechanisms5.5 Electron Dynamics in Plasmas; 5.6 Statistical Description of Electron Dynamics; 5.7 Bremsstrahlung Emission and Inverse Bremsstrahlung Absorption; 5.8 Charge Trapping in Small Objects; References; Chapter 6: Short X-Ray Pulses; 6.1 Characteristics of Short X-Ray Pulses; 6.2 Generating Short X-Ray Pulses; 6.3 Characterizing Short X-Ray Pulses; 6.4 Characteristic Time Scales in Matter; 6.5 Short-Pulse X-Ray-Matter Interaction Processes; 6.6 Single-Pulse X-Ray Optics; References; Chapter 7: High-Intensity Effects in the X-Ray Regime 7.1 Intensity and Electric Field of Intense X-Ray Sources7.2 High-X-Ray-Intensity Effects in Atoms; 7.3 Nonlinear Optics; 7.4 High-Intensity Effects in Plasmas; 7.5 High-Field Physics; References; Chapter 8: Dynamics of X-Ray-Irradiated Materials; 8.1 X-Ray-Matter Interaction Time Scales; 8.2 The Influence of X-Ray Heating on Absorption; 8.3 Thermodynamics of Phase Transformation; 8.4 Ablation; 8.5 Intensity Dependence of X-Ray-Matter Interaction; 8.6 X-Ray-Induced Mechanical Damage; 8.7 X-Ray Damage in Inertial Confinement Fusion; 8.8 X-Ray Damage in Semiconductors 8.9 Damage to Biomolecules in X-Ray ImagingReferences; Chapter 9: Simulation of X-Ray-Matter Interaction; 9.1 Models for Different Time- and Length Scales; 9.2 Atomistic Models; 9.3 Statistical Kinetics Models; 9.4 Hydrodynamic Models; References; Chapter 10: Examples of X-Ray-Matter Interaction; 10.1 Interaction of Intense X-Ray Radiation with Atoms and Molecules; 10.2 Interaction of Intense X-Ray Pulses with Atomic Clusters; 10.3 Biological Imaging; 10.4 X-Ray Scattering Diagnostics of Dense Plasmas; References; Index |
| Record Nr. | UNINA-9910130960903321 |
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Hau-Riege Stefan P.
|
||
| Weinheim : , : Wiley-VCH, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege
| High-intensity X-rays - interaction with matter : processes in plasmas, clusters, molecules, and solids / / Stefan P. Hau-Riege |
| Autore | Hau-Riege Stefan P. |
| Pubbl/distr/stampa | Weinheim : , : Wiley-VCH, , [2011] |
| Descrizione fisica | 1 online resource (521 p.) |
| Disciplina | 539.7222 |
| Soggetto topico |
X-rays - Scattering
Materials - Effect of radiation on X-ray microanalysis |
| ISBN |
3-527-63638-2
3-527-63637-4 3-527-63636-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright; Dedication; Preface; Chapter 1: Introduction; 1.1 Examples for the Application of X-Ray-Matter Interaction; 1.2 Electromagnetic Spectrum; 1.3 X-Ray Light Sources; 1.4 Fundamental Models to Describe X-Ray-Matter Interaction; 1.5 Introduction to X-Ray-Matter Interaction Processes; 1.6 Databases Relevant to Photon-Matter Interaction; References; Chapter 2: Atomic Physics; 2.1 Atomic States; 2.2 Atomic Processes; 2.3 Effect of Plasma Environment; References; Chapter 3: Scattering of X-Ray Radiation; 3.1 Scattering by Free Charges
3.2 Scattering by Atoms and Ions3.3 Scattering by Gases, Liquids, and Amorphous Solids; 3.4 Scattering by Plasmas; 3.5 Scattering by Crystals; References; Chapter 4: Electromagnetic Wave Propagation; 4.1 Electromagnetic Waves in Matter; 4.2 Reflection and Refraction at Interfaces; 4.3 Reflection by Thin Films, Bilayers, and Multilayers; 4.4 Dispersive Interaction of Wavepackets with Materials; 4.5 Kramers-Kronig Relation; References; Chapter 5: Electron Dynamics; 5.1 Transition of Solids into Plasmas; 5.2 Directional Emission of Photoelectrons; 5.3 Electron Scattering 5.4 Energy Loss Mechanisms5.5 Electron Dynamics in Plasmas; 5.6 Statistical Description of Electron Dynamics; 5.7 Bremsstrahlung Emission and Inverse Bremsstrahlung Absorption; 5.8 Charge Trapping in Small Objects; References; Chapter 6: Short X-Ray Pulses; 6.1 Characteristics of Short X-Ray Pulses; 6.2 Generating Short X-Ray Pulses; 6.3 Characterizing Short X-Ray Pulses; 6.4 Characteristic Time Scales in Matter; 6.5 Short-Pulse X-Ray-Matter Interaction Processes; 6.6 Single-Pulse X-Ray Optics; References; Chapter 7: High-Intensity Effects in the X-Ray Regime 7.1 Intensity and Electric Field of Intense X-Ray Sources7.2 High-X-Ray-Intensity Effects in Atoms; 7.3 Nonlinear Optics; 7.4 High-Intensity Effects in Plasmas; 7.5 High-Field Physics; References; Chapter 8: Dynamics of X-Ray-Irradiated Materials; 8.1 X-Ray-Matter Interaction Time Scales; 8.2 The Influence of X-Ray Heating on Absorption; 8.3 Thermodynamics of Phase Transformation; 8.4 Ablation; 8.5 Intensity Dependence of X-Ray-Matter Interaction; 8.6 X-Ray-Induced Mechanical Damage; 8.7 X-Ray Damage in Inertial Confinement Fusion; 8.8 X-Ray Damage in Semiconductors 8.9 Damage to Biomolecules in X-Ray ImagingReferences; Chapter 9: Simulation of X-Ray-Matter Interaction; 9.1 Models for Different Time- and Length Scales; 9.2 Atomistic Models; 9.3 Statistical Kinetics Models; 9.4 Hydrodynamic Models; References; Chapter 10: Examples of X-Ray-Matter Interaction; 10.1 Interaction of Intense X-Ray Radiation with Atoms and Molecules; 10.2 Interaction of Intense X-Ray Pulses with Atomic Clusters; 10.3 Biological Imaging; 10.4 X-Ray Scattering Diagnostics of Dense Plasmas; References; Index |
| Record Nr. | UNINA-9910830184203321 |
|
Hau-Riege Stefan P.
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| Weinheim : , : Wiley-VCH, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]
| Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.] |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | New York : Kluwer Academic/Plenum, c2003 |
| Descrizione fisica | xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.) |
| Disciplina | 502.825 |
| Altri autori (Persone) | Goldstein, Joseph |
| Soggetto topico |
Scanning electron microscopy
X-ray microanalysis |
| ISBN | 0306472929 |
| Classificazione |
53.0.692
LC QH212.S3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001789879707536 |
| New York : Kluwer Academic/Plenum, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / Joseph I. Goldstein...[et al.]
| Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / Joseph I. Goldstein...[et al.] |
| Pubbl/distr/stampa | New York ; London : Plenum Press, c1981 |
| Descrizione fisica | xiii, 673 p. : ill. ; 24 cm |
| Disciplina | 502/.8/25 |
| Altri autori (Persone) | Goldstein, Joseph |
| Soggetto topico |
Scanning electron microscope
X-ray microanalysis |
| ISBN | 030640768X |
| Classificazione |
53.0.692
LC QH212.S3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001224919707536 |
| New York ; London : Plenum Press, c1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
X-ray microanalysis in the electron microscope / John A. Chandler
| X-ray microanalysis in the electron microscope / John A. Chandler |
| Autore | Chandler, John A. |
| Pubbl/distr/stampa | Amsterdam ; New York : North-Holland, 1977 |
| Descrizione fisica | 317-547 p. : ill. ; 23 cm |
| Disciplina | 502.825 |
| Collana | Practical methods in electron microscopy , V/II |
| Soggetto topico |
X-ray microanalysis
Electron microscopy - Technique Electron microscopy - Handbooks, manuals, etc |
| ISBN | 0720406072 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991004025189707536 |
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Chandler, John A.
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| Amsterdam ; New York : North-Holland, 1977 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière
| X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.11272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretièreRené |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9910141492503321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière
| X-rays and materials [[electronic resource] /] / edited by Philippe Goudeau, René Guinebretière |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.11272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretièreRené |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9910830202703321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-rays and materials / / edited by Philippe Goudeau, Rene Guinebretiere
| X-rays and materials / / edited by Philippe Goudeau, Rene Guinebretiere |
| Pubbl/distr/stampa | Hoboken, N.J., : ISTE/Wiley, 2012 |
| Descrizione fisica | 1 online resource (240 p.) |
| Disciplina | 620.1/1272 |
| Altri autori (Persone) |
GoudeauPhilippe
GuinebretiereRene |
| Collana | ISTE |
| Soggetto topico |
Materials - Analysis
X-ray microanalysis X-rays - Diffraction X-ray spectroscopy |
| ISBN |
1-118-56288-7
1-283-94140-6 1-118-56293-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; X-Rays and Materials; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. Synchrotron Radiation: Instrumentation in Condensed Matter; 1.1. Introduction; 1.2. Light sources in the storage ring; 1.2.1. Bending magnets; 1.2.2. Insertion devices; 1.2.2.1. Wigglers; 1.2.2.2. Undulators; 1.3. Emittance and brilliance of a source; 1.4. X-ray diffraction with synchrotron radiation; 1.4.1. Angle-dispersive diffraction; 1.4.2. Energy dispersive diffraction; 1.5. X-ray absorption spectroscopy using synchrotron radiation; 1.5.1. X-ray absorption spectroscopy
1.5.2. Energy-scanned X-ray absorption spectroscopy1.5.3. Energy dispersive X-ray absorption spectroscopy; 1.6. SAMBA: the X-ray absorption spectroscopy beam line of SOLEIL for 4-40 keV; 1.7. The DIFFABS beam line; 1.7.1. Description of the beam line; 1.7.2. Examples of use of the DIFFABS beam line; 1.8. CRISTAL beam line; 1.8.1. Beam line optics; 1.8.2. Diffractometers; 1.8.3. Sample environments; 1.9. The SOLEIL ODE line for dispersive EXAFS; 1.9.1. Optics of the ODE line; 1.9.2. Magnetic circular dichroism 1.9.3. X-ray absorption spectroscopy under extreme pressure and/or temperature conditions1.10. Conclusion; 1.11. Bibliography; Chapter 2. Nanoparticle Characterization using Central X-ray Diffraction; 2.1. Introduction; 2.2. Definition of scattered intensity; 2.3. Invariance principle; 2.3.1. General case; 2.3.2. Isotropic systems; 2.3.3. Multi-level systems; 2.4. Behavior for large q: the Porod regime; 2.5. Particle-based systems; 2.5.1. Definition of form factor; 2.5.2. Introduction to the structure factor; 2.5.3. Intensity behavior at small q: the Guinier regime; 2.5.4. Volume measurements 2.5.5. Some well-known form factors2.5.6. Polyhedral particles; 2.5.6.1. Form factor of a polyhedron; 2.5.6.2. Comparison between different polyhedra with cylindrical and spherical forms; 2.6. An absolute scale for measuring particle numbers; 2.7. Conclusion; 2.8. Bibliography; Chapter 3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds; 3.1. Introduction; 3.1.1. Introduction to carbon nanotubes; 3.1.2. Uses of X-ray scattering for studies of carbon nanotubes; 3.2. Single-walled carbon nanotubes; 3.2.1. Calculation of a powder diffraction diagram 3.2.1.1. Individual nanotubes3.2.1.2. Bundle structure; 3.2.1.3. Inclusion of a distribution of nanotube diameters; 3.2.1.4. Effects of nanotube length; 3.2.2. Analysis of experimental scattering diagrams; 3.3. Multi-walled carbon nanotubes; 3.3.1. Calculation of powder diffraction diagrams for a powder of individual multi-walled nanotubes; 3.3.2. Analysis of an experimental diffraction diagram; 3.4. Hybrid nanotubes; 3.4.1. Peapods; 3.4.2. Ion insertion into nanotubes; 3.5. Textured powder samples; 3.5.1. Quantification of nanotube orientation 3.5.2. Separation of diffraction components in hybrid nanotubes |
| Record Nr. | UNINA-9911019362903321 |
| Hoboken, N.J., : ISTE/Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-rays in nanoscience : spectroscopy, spectromicroscopy, and scattering techniques / / edited by Jinghua Guo
| X-rays in nanoscience : spectroscopy, spectromicroscopy, and scattering techniques / / edited by Jinghua Guo |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH |
| Descrizione fisica | 1 online resource (278 p.) |
| Disciplina | 620.5 |
| Altri autori (Persone) | GuoJinghua |
| Soggetto topico |
Nanostructured materials
X-ray microanalysis |
| ISBN |
1-283-30240-3
9786613302403 3-527-63229-8 3-527-63228-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques; Contents; Preface; List of Contributors; 1 Introduction; 2 High-Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and Their Spin Dynamics; 2.1 Introduction; 2.2 X-Ray Optics and Soft X-Ray Microscopy; 2.3 Magnetic Soft X-Ray Microscopy; 2.4 Static Nanoscale Magnetic Structures; 2.5 Spin Dynamics in Nanoscale Magnetic Structures; 2.6 Future Perspectives for Magnetic Soft X-Ray Microscopy; Acknowledgments; References
3 Advances in Magnetization Dynamics Using Scanning Transmission X-Ray Microscopy3.1 Introduction; 3.2 Magnetism in Confined Structures; 3.2.1 Magnetic Thin Film Structures of Ideally Soft Materials; 3.2.2 Spin Dynamics of the Magnetic Vortex State; 3.3 Experimental Setup; 3.3.1 Zone Plate; 3.3.2 Radiation Damage and Choice of Detectors; 3.3.3 Time-Resolved Magnetic Imaging; 3.3.3.1 Contrast Mechanism for Magnetic Imaging; 3.3.3.2 Sample and Stripline Configuration for In-Plane Field Excitation; 3.3.3.3 Excitation Types; 3.3.3.4 Experimental Setup and Data Acquisition 3.4 Magnetic Characterization of Ferromagnetic Structures3.4.1 Spin-Reorientation Transition in Ferromagnetic Multilayers on Nanospheres; 3.4.2 Magnetic Characterization of Magnetic Vortex Structures; 3.4.2.1 In-Plane Magnetization of a Vortex Structure; 3.4.2.2 Out-of-Plane Magnetization of a Vortex Structure; 3.5 Magnetization Dynamics in Ferromagnetic Vortex Structures; 3.5.1 Differential Imaging of Magnetic Vortex Structures; 3.5.2 Gyrotropic Mode; 3.5.2.1 Resonant Behavior under Pulsed Excitation; 3.5.2.2 Resonant Sine Excitation; 3.5.3 Nonlinear Response of Magnetic Vortex Structures 3.5.3.1 Vortex Core Reversal by Burst Excitation3.5.3.2 Vortex Core Reversal - Mechanism; 3.5.3.3 Final Remarks; 3.6 Conclusion and Outlook; Acknowledgments; References; 4 Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials; 4.1 Introduction; 4.2 Photoelectron Spectroscopy; 4.3 Scanning Photoelectron Microscopy; 4.3.1 The Focusing Optics; 4.3.2 The Electron Energy Analyzer; 4.3.3 The Sample Scanning Mechanism; 4.4 The Application of Scanning Photoelectron Microscopy; 4.4.1 Oxidation States in Scanning-Probe-Induced Si3N4 to SiOx Conversion 4.4.2 Well-Aligned Carbon Nanotubes4.4.3 GaN Nanowires; 4.4.4 Well-Aligned ZnO Nanorods; 4.4.5 Diameter Dependence of the Electronic Structure of ZnO Nanorods Determined by Scanning Photoelectron Microscopy; 4.4.6 Comparison of the Electronic Structures of Zn1-xCoxO and Zn1-xMgxO Nanorods; 4.5 Conclusion; Acknowledgments; References; 5 Coherent X-Ray Diffraction Microscopy; 5.1 Introduction; 5.1.1 A Brief History of the Phase Problem; 5.1.2 Scattering of X-Rays by Homogeneous Media; 5.1.2.1 The First Born Approximation; 5.1.3 The First Rytov Approximation 5.1.4 Comparison of CXDM with other X-Ray Microscopes |
| Record Nr. | UNINA-9910133643903321 |
| Weinheim, : Wiley-VCH | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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