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Concerns about a variance approach to the X-ray diffractometric estimation of microfibril angle in wood [[electronic resource] /] / Steve P. Verrill ... [and others]
| Concerns about a variance approach to the X-ray diffractometric estimation of microfibril angle in wood [[electronic resource] /] / Steve P. Verrill ... [and others] |
| Pubbl/distr/stampa | [Madison, Wis.] : , : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, , [2010] |
| Descrizione fisica | 1 online resource (78 pages) : illustrations |
| Altri autori (Persone) | VerrillS. P |
| Collana | Research paper FPL-RP |
| Soggetto topico |
Microfibrils
Wood - Anatomy X-ray diffractometer |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910699969103321 |
| [Madison, Wis.] : , : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, , [2010] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder
| Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder |
| Autore | Jenkins Ron <1932-> |
| Pubbl/distr/stampa | New York, : Wiley, c1996 |
| Descrizione fisica | 1 online resource (428 p.) |
| Disciplina | 548/.83 |
| Altri autori (Persone) | SnyderR. L <1941-> (Robert L.) |
| Collana | Chemical analysis |
| Soggetto topico |
X-rays - Diffraction - Technique
X-ray diffractometer Powders - Optical properties - Measurement |
| ISBN |
1-283-59303-3
9786613905482 1-118-52091-2 1-118-52099-8 1-118-52092-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety Considerations
ReferencesCHAPTER 2. THE CRYSTALLINE STATE; 2.1. Introduction to the Crystalline State; 2.2. Crystallographic Symmetry; 2.2.1. Point Groups and Crystal Systems; 2.2.2. The Unit Cell and Bravais Lattices; 2.2.3. Reduced Cells; 2.2.4. Space Groups; 2.3. Space Group Notation; 2.3.1. The Triclinic or Anorthic Crystal System; 2.3.2. The Monoclinic Crystal System; 2.3.3. The Orthorhombic Crystal System; 2.3.4. The Tetragonal Crystal System; 2.3.5. The Hexagonal and Trigonal Crystal Systems; 2.3.6. The Cubic Crystal System; 2.3.7. Equivalent Positions; 2.3.8. Special Positions and Site Multiplicity 2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor 3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability 4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors 5.3.3. The Scintillation Detector |
| Record Nr. | UNINA-9910139078003321 |
Jenkins Ron <1932->
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| New York, : Wiley, c1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Separation and identification of the silt-sized heavy-mineral fraction in sediments / / by Judith A. Commeau, Lawrence J. Poppe, and Robert F. Commeau
| Separation and identification of the silt-sized heavy-mineral fraction in sediments / / by Judith A. Commeau, Lawrence J. Poppe, and Robert F. Commeau |
| Autore | Commeau Judith A. |
| Pubbl/distr/stampa | [Reston, Virginia] : , : U.S. Department of the Interior, U.S. Geological Survey, , 1992 |
| Descrizione fisica | 1 online resource (iii, 13 pages) : illustrations, map |
| Collana | U.S. Geological Survey circular |
| Soggetto topico |
Heavy minerals - Analysis
Image processing Sediments (Geology) - Analysis X-ray diffractometer |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910712077803321 |
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Commeau Judith A.
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| [Reston, Virginia] : , : U.S. Department of the Interior, U.S. Geological Survey, , 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
| Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe |
| Autore | Fultz, Brent |
| Edizione | [2. ed.] |
| Pubbl/distr/stampa | Berlin ; New York : Springer, c2002 |
| Descrizione fisica | xxi, 748 p. : ill. ; 24 cm |
| Disciplina | 620.1/1299 |
| Altri autori (Persone) | Howe, James M. |
| Soggetto topico |
Materials - Microscopy
Transmission electron microscopy X-ray diffractometer |
| ISBN | 3540437649 (alk. paper) |
| Classificazione |
LC TA417.23
53.7.18 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001789629707536 |
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Fultz, Brent
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| Berlin ; New York : Springer, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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