Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories [[electronic resource] ] : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council
| An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories [[electronic resource] ] : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council |
| Pubbl/distr/stampa | Washington, D.C., : National Academy Press, c1999 |
| Descrizione fisica | 1 online resource (245 p.) |
| Disciplina | 389/.60973 |
| Soggetto topico | Weights and measures - Standards |
| Soggetto genere / forma | Electronic books. |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""TECHNICAL MERIT""; ""APPROPRIATENESS OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""DNA Measurements and Standards for Forensic Laboratories""; ""Cybernetic Building Systems""; ""RESOURCES""; ""Chapter 2 Electronics and Electrical Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""
""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Radio-Frequency Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources"" ""Electromagnetic Technology Division""""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work"" ""Impact of Programs""""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Automated Production Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Intelligent Systems Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Manufacturing Systems Integration Division"" ""Division Mission""""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission"" ""Technical Merit and Appropriateness of Work"" |
| Record Nr. | UNINA-9910451468403321 |
| Washington, D.C., : National Academy Press, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories [[electronic resource] ] : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council
| An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories [[electronic resource] ] : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council |
| Pubbl/distr/stampa | Washington, D.C., : National Academy Press, c1999 |
| Descrizione fisica | 1 online resource (245 p.) |
| Disciplina | 389/.60973 |
| Soggetto topico | Weights and measures - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""TECHNICAL MERIT""; ""APPROPRIATENESS OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""DNA Measurements and Standards for Forensic Laboratories""; ""Cybernetic Building Systems""; ""RESOURCES""; ""Chapter 2 Electronics and Electrical Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""
""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Radio-Frequency Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources"" ""Electromagnetic Technology Division""""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work"" ""Impact of Programs""""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Automated Production Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Intelligent Systems Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Manufacturing Systems Integration Division"" ""Division Mission""""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission"" ""Technical Merit and Appropriateness of Work"" |
| Record Nr. | UNINA-9910777449703321 |
| Washington, D.C., : National Academy Press, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council
| An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Washington, D.C., : National Academy Press, c1999 |
| Descrizione fisica | 1 online resource (245 p.) |
| Disciplina | 389/.60973 |
| Soggetto topico | Weights and measures - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""TECHNICAL MERIT""; ""APPROPRIATENESS OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""DNA Measurements and Standards for Forensic Laboratories""; ""Cybernetic Building Systems""; ""RESOURCES""; ""Chapter 2 Electronics and Electrical Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""
""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Radio-Frequency Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources"" ""Electromagnetic Technology Division""""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work"" ""Impact of Programs""""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Automated Production Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Intelligent Systems Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Manufacturing Systems Integration Division"" ""Division Mission""""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission"" ""Technical Merit and Appropriateness of Work"" |
| Record Nr. | UNINA-9911108111503321 |
| Washington, D.C., : National Academy Press, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council
| An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories : fisal year 1999 / / Board on Assessment of NIST Programs, Commission on Physical Sciences, Mathematics, and Applications, National Research Council |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Washington, D.C., : National Academy Press, c1999 |
| Descrizione fisica | 1 online resource (245 p.) |
| Disciplina | 389/.60973 |
| Soggetto topico | Weights and measures - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""TECHNICAL MERIT""; ""APPROPRIATENESS OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""DNA Measurements and Standards for Forensic Laboratories""; ""Cybernetic Building Systems""; ""RESOURCES""; ""Chapter 2 Electronics and Electrical Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""
""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Radio-Frequency Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources"" ""Electromagnetic Technology Division""""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work"" ""Impact of Programs""""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Automated Production Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Intelligent Systems Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Manufacturing Systems Integration Division"" ""Division Mission""""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission"" ""Technical Merit and Appropriateness of Work"" |
| Record Nr. | UNINA-9911141481103321 |
| Washington, D.C., : National Academy Press, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Std 268-1976 (Supersedes ASTM E380-1974 IEEE Std 268-1973 IEEE Std 322-1971) : IEEE/ASTM Standard Metric Practice / / IEEE
| IEEE Std 268-1976 (Supersedes ASTM E380-1974 IEEE Std 268-1973 IEEE Std 322-1971) : IEEE/ASTM Standard Metric Practice / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1976 |
| Descrizione fisica | 1 online resource (48 pages) |
| Disciplina | 389 |
| Collana | IEEE Std |
| Soggetto topico |
Metric system
Weights and measures - Standards |
| ISBN | 1-5044-0240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 268-1976 |
| Record Nr. | UNINA-9910136315603321 |
| Piscataway, NJ : , : IEEE, , 1976 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Std 268-1976 (Supersedes ASTM E380-1974 IEEE Std 268-1973 IEEE Std 322-1971) : IEEE/ASTM Standard Metric Practice / / IEEE
| IEEE Std 268-1976 (Supersedes ASTM E380-1974 IEEE Std 268-1973 IEEE Std 322-1971) : IEEE/ASTM Standard Metric Practice / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1976 |
| Descrizione fisica | 1 online resource (48 pages) |
| Disciplina | 389 |
| Collana | IEEE Std |
| Soggetto topico |
Metric system
Weights and measures - Standards |
| ISBN | 1-5044-0240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 268-1976 |
| Record Nr. | UNISA-996280693903316 |
| Piscataway, NJ : , : IEEE, , 1976 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE Std 268-1982 (Supersedes IEEE Std 268-1979) : IEEE Standard Metric Practice / / IEEE
| IEEE Std 268-1982 (Supersedes IEEE Std 268-1979) : IEEE Standard Metric Practice / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1982 |
| Descrizione fisica | 1 online resource (50 pages) |
| Disciplina | 389 |
| Collana | IEEE Std |
| Soggetto topico |
Metric system
Weights and measures - Standards |
| ISBN | 1-5044-0242-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 268-1982 |
| Record Nr. | UNINA-9910136315303321 |
| Piscataway, NJ : , : IEEE, , 1982 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE Std 268-1982 (Supersedes IEEE Std 268-1979) : IEEE Standard Metric Practice / / IEEE
| IEEE Std 268-1982 (Supersedes IEEE Std 268-1979) : IEEE Standard Metric Practice / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1982 |
| Descrizione fisica | 1 online resource (50 pages) |
| Disciplina | 389 |
| Collana | IEEE Std |
| Soggetto topico |
Metric system
Weights and measures - Standards |
| ISBN | 1-5044-0242-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | IEEE Std 268-1982 |
| Record Nr. | UNISA-996280694203316 |
| Piscataway, NJ : , : IEEE, , 1982 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
