2008 IEEE International Vacuum Electronics Conference : Monterey, CA, 22-24 April 2008 |
Pubbl/distr/stampa | [Place of publication not identified], : Piscataway NJ, 2008 |
Soggetto topico |
Vacuum microelectronics
Microwave tubes Electronic apparatus and appliances Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN | 1-5090-7373-6 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996202448303316 |
[Place of publication not identified], : Piscataway NJ, 2008 | ||
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Lo trovi qui: Univ. di Salerno | ||
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2008 IEEE International Vacuum Electronics Conference : Monterey, CA, 22-24 April 2008 |
Pubbl/distr/stampa | [Place of publication not identified], : Piscataway NJ, 2008 |
Soggetto topico |
Vacuum microelectronics
Microwave tubes Electronic apparatus and appliances Semiconductors Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN |
9781509073733
1509073736 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145708403321 |
[Place of publication not identified], : Piscataway NJ, 2008 | ||
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Lo trovi qui: Univ. Federico II | ||
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2012 IEEE Thirteenth International Vacuum Electronics Conference |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2012 |
Soggetto topico |
Vacuum microelectronics
Microwave tubes Vacuum technology Electronic apparatus and appliances |
ISBN |
9781467301893
1467301892 9781467301879 1467301876 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910130730003321 |
[Place of publication not identified], : IEEE, 2012 | ||
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Lo trovi qui: Univ. Federico II | ||
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2014 Tenth International Vacuum Electron Sources Conference, IVESC and Second International Conference on Emission Electronics, ICEE : IVESC-ICEE-ICCTPEA-BDO-2014 : Russia, Saint-Petersburg, June 30-July 4, 2014 : proceedings / / edited by: N. V. Egorov |
Pubbl/distr/stampa | IEEE |
Altri autori (Persone) | EgorovN. V (Nikolay V.) |
Soggetto topico |
Electrons - Emission
Vacuum microelectronics Vacuum technology Particle accelerators |
ISBN | 1-4799-5772-0 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti |
2014 Tenth International Vacuum Electron Sources Conference
2014 Tenth International Vacuum Electron Sources Conference (IVESC) Vacuum Electron Sources Conference |
Record Nr. | UNISA-996279334803316 |
IEEE | ||
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Lo trovi qui: Univ. di Salerno | ||
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2014 Tenth International Vacuum Electron Sources Conference, IVESC and Second International Conference on Emission Electronics, ICEE : IVESC-ICEE-ICCTPEA-BDO-2014 : Russia, Saint-Petersburg, June 30-July 4, 2014 : proceedings / / edited by: N. V. Egorov |
Pubbl/distr/stampa | IEEE |
Altri autori (Persone) | EgorovN. V (Nikolay V.) |
Soggetto topico |
Electrons - Emission
Vacuum microelectronics Vacuum technology Particle accelerators |
ISBN |
9781479957729
1479957720 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti |
2014 Tenth International Vacuum Electron Sources Conference
2014 Tenth International Vacuum Electron Sources Conference (IVESC) Vacuum Electron Sources Conference |
Record Nr. | UNINA-9910141897403321 |
IEEE | ||
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Lo trovi qui: Univ. Federico II | ||
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Eighth IEEE International Vacuum Electronics Conference : IEEE IVEC 2007 : May 15-17, 2007, Kitakyushu International Conference Center, Kitakyushu, Japan |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
Disciplina | 621.381 |
Soggetto topico |
Vacuum microelectronics
Microwave tubes Vacuum technology Electronic apparatus and appliances Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
ISBN | 1-5090-8210-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996201768903316 |
[Place of publication not identified], : IEEE, 2007 | ||
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Lo trovi qui: Univ. di Salerno | ||
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Eighth IEEE International Vacuum Electronics Conference : IEEE IVEC 2007 : May 15-17, 2007, Kitakyushu International Conference Center, Kitakyushu, Japan |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
Disciplina | 621.381 |
Soggetto topico |
Vacuum microelectronics
Microwave tubes Vacuum technology Electronic apparatus and appliances Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
ISBN |
9781509082100
1509082107 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910143042903321 |
[Place of publication not identified], : IEEE, 2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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Electron beams and microwave vacuum electronics [[electronic resource] /] / Shulim E. Tsimring |
Autore | Tsimring Shulim E. <1924-> |
Edizione | [11th ed.] |
Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
Descrizione fisica | 1 online resource (599 p.) |
Disciplina |
621.3815/12
621.381512 |
Collana | Wiley series in microwave and optical engineering |
Soggetto topico |
Vacuum microelectronics
Electron beams |
Soggetto genere / forma | Electronic books. |
ISBN |
1-280-65449-X
9786610654499 0-470-05376-3 0-470-05375-5 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Electron Beams and Microwave Vacuum Electronics; Contents; PREFACE; Introduction; I.1 Outline of the Book; I.2 List of Symbols; I.3 Electromagnetic Fields and Potentials; I.4 Principle of Least Action. Lagrangian. Generalized Momentum. Lagrangian Equations; I.5 Hamiltonian. Hamiltonian Equations; I.6 Liouville Theorem; I.6.1 Liouville Theorem for Interaction Particles; I.6.2 Liouville Theorem for Noninteraction Identical Particles; I.6.3 Liouville Theorem for a Phase Space of Lesser Dimensions; I.7 Emittance. Brightness; I.7.1 Emittance in a Zero Magnetic Field; I.7.2 Brightness
I.7.3 Maximum Langmuir Brightness for Thermionic EmittersPART I ELECTRON BEAMS; 1 Motion of Electrons in External Electric and Magnetic Static Fields; 1.1 Introduction; 1.2 Energy of a Charged Particle; 1.3 Potential-Velocity Relation (Static Fields); 1.4 Electrons in a Linear Electric Field e(0)E = kx; 1.4.1 Nonrelativistic Approximation; 1.4.2 Relativistic Oscillator; 1.5 Motion of Electrons in Homogeneous Static Fields; 1.5.1 Electric Field; 1.5.2 Magnetic Field; 1.5.3 Parallel Electric and Magnetic Fields; 1.5.4 Perpendicular Fields E and B 1.5.5 Arbitrary Orientation of Fields E and B. Nonrelativistic Approximation1.6 Motion of Electrons in Weakly Inhomogeneous Static Fields; 1.6.1 Small Variations in Electromagnetic Fields Acting on Moving Charged Particles; 1.6.2 Adiabatic Invariants; 1.6.3 Motion of the Guiding Center; 1.7 Motion of Electrons in Fields with Axial and Plane Symmetry. Busch's Theorem; 1.7.1 Systems with Axial Symmetry. Busch's Theorem; 1.7.2 Formation of Helical Trajectories at a Jump in a Magnetic Field; 1.7.3 Systems with Plane Symmetry; 2 Electron Lenses; 2.1 Introduction 2.2 Maupertuis's Principle. Electron-Optical Refractive Index. Differential Equations of Trajectories2.2.1 Maupertuis's Principle. Differential Equations of Trajectories; 2.2.2 General Properties of Charged-Particle Trajectories in Electromagnetic Fields; 2.3 Differential Equations of Trajectories in Axially Symmetric Fields; 2.4 Differential Equations of Paraxial Trajectories in Axially Symmetric Fields Without a Space Charge; 2.5 Formation of Images by Paraxial Trajectories; 2.5.1 Linearization of Trajectory Equations; 2.5.2 Rotation of an Image. Stigmatic Imaging. Image Similarity 2.5.3 Magnifications2.6 Electrostatic Axially Symmetric Lenses; 2.6.1 Classification of Electrostatic Lenses; 2.6.2 Immersion and Unipotential Lenses; 2.6.3 Cardinal Elements of a Lens with Limited Field Extent; 2.6.4 Focal Length of Thin Unipotential and Immersion Lenses; 2.6.5 Aperture Lenses; 2.6.6 Applications of Cathode Lenses; 2.7 Magnetic Axially Symmetric Lenses; 2.7.1 Equations of Paraxial Trajectories. Classification of Magnetic Lenses; 2.7.2 Short Magnetic Lenses; 2.7.3 Strong Magnetic Lenses; 2.7.4 Long Magnetic Lenses; 2.8 Aberrations of Axially Symmetric Lenses 2.8.1 Geometric Aberrations |
Record Nr. | UNINA-9910143686703321 |
Tsimring Shulim E. <1924->
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Hoboken, N.J., : Wiley-Interscience, c2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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Electron beams and microwave vacuum electronics [[electronic resource] /] / Shulim E. Tsimring |
Autore | Tsimring Shulim E. <1924-> |
Edizione | [11th ed.] |
Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
Descrizione fisica | 1 online resource (599 p.) |
Disciplina |
621.3815/12
621.381512 |
Collana | Wiley series in microwave and optical engineering |
Soggetto topico |
Vacuum microelectronics
Electron beams |
ISBN |
1-280-65449-X
9786610654499 0-470-05376-3 0-470-05375-5 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Electron Beams and Microwave Vacuum Electronics; Contents; PREFACE; Introduction; I.1 Outline of the Book; I.2 List of Symbols; I.3 Electromagnetic Fields and Potentials; I.4 Principle of Least Action. Lagrangian. Generalized Momentum. Lagrangian Equations; I.5 Hamiltonian. Hamiltonian Equations; I.6 Liouville Theorem; I.6.1 Liouville Theorem for Interaction Particles; I.6.2 Liouville Theorem for Noninteraction Identical Particles; I.6.3 Liouville Theorem for a Phase Space of Lesser Dimensions; I.7 Emittance. Brightness; I.7.1 Emittance in a Zero Magnetic Field; I.7.2 Brightness
I.7.3 Maximum Langmuir Brightness for Thermionic EmittersPART I ELECTRON BEAMS; 1 Motion of Electrons in External Electric and Magnetic Static Fields; 1.1 Introduction; 1.2 Energy of a Charged Particle; 1.3 Potential-Velocity Relation (Static Fields); 1.4 Electrons in a Linear Electric Field e(0)E = kx; 1.4.1 Nonrelativistic Approximation; 1.4.2 Relativistic Oscillator; 1.5 Motion of Electrons in Homogeneous Static Fields; 1.5.1 Electric Field; 1.5.2 Magnetic Field; 1.5.3 Parallel Electric and Magnetic Fields; 1.5.4 Perpendicular Fields E and B 1.5.5 Arbitrary Orientation of Fields E and B. Nonrelativistic Approximation1.6 Motion of Electrons in Weakly Inhomogeneous Static Fields; 1.6.1 Small Variations in Electromagnetic Fields Acting on Moving Charged Particles; 1.6.2 Adiabatic Invariants; 1.6.3 Motion of the Guiding Center; 1.7 Motion of Electrons in Fields with Axial and Plane Symmetry. Busch's Theorem; 1.7.1 Systems with Axial Symmetry. Busch's Theorem; 1.7.2 Formation of Helical Trajectories at a Jump in a Magnetic Field; 1.7.3 Systems with Plane Symmetry; 2 Electron Lenses; 2.1 Introduction 2.2 Maupertuis's Principle. Electron-Optical Refractive Index. Differential Equations of Trajectories2.2.1 Maupertuis's Principle. Differential Equations of Trajectories; 2.2.2 General Properties of Charged-Particle Trajectories in Electromagnetic Fields; 2.3 Differential Equations of Trajectories in Axially Symmetric Fields; 2.4 Differential Equations of Paraxial Trajectories in Axially Symmetric Fields Without a Space Charge; 2.5 Formation of Images by Paraxial Trajectories; 2.5.1 Linearization of Trajectory Equations; 2.5.2 Rotation of an Image. Stigmatic Imaging. Image Similarity 2.5.3 Magnifications2.6 Electrostatic Axially Symmetric Lenses; 2.6.1 Classification of Electrostatic Lenses; 2.6.2 Immersion and Unipotential Lenses; 2.6.3 Cardinal Elements of a Lens with Limited Field Extent; 2.6.4 Focal Length of Thin Unipotential and Immersion Lenses; 2.6.5 Aperture Lenses; 2.6.6 Applications of Cathode Lenses; 2.7 Magnetic Axially Symmetric Lenses; 2.7.1 Equations of Paraxial Trajectories. Classification of Magnetic Lenses; 2.7.2 Short Magnetic Lenses; 2.7.3 Strong Magnetic Lenses; 2.7.4 Long Magnetic Lenses; 2.8 Aberrations of Axially Symmetric Lenses 2.8.1 Geometric Aberrations |
Record Nr. | UNINA-9910829846103321 |
Tsimring Shulim E. <1924->
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||
Hoboken, N.J., : Wiley-Interscience, c2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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Electron beams and microwave vacuum electronics / / Shulim E. Tsimring |
Autore | Tsimring Shulim E. <1924-> |
Edizione | [11th ed.] |
Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
Descrizione fisica | 1 online resource (599 p.) |
Disciplina | 621.3815/12 |
Collana | Wiley series in microwave and optical engineering |
Soggetto topico |
Vacuum microelectronics
Electron beams |
ISBN |
1-280-65449-X
9786610654499 0-470-05376-3 0-470-05375-5 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Electron Beams and Microwave Vacuum Electronics; Contents; PREFACE; Introduction; I.1 Outline of the Book; I.2 List of Symbols; I.3 Electromagnetic Fields and Potentials; I.4 Principle of Least Action. Lagrangian. Generalized Momentum. Lagrangian Equations; I.5 Hamiltonian. Hamiltonian Equations; I.6 Liouville Theorem; I.6.1 Liouville Theorem for Interaction Particles; I.6.2 Liouville Theorem for Noninteraction Identical Particles; I.6.3 Liouville Theorem for a Phase Space of Lesser Dimensions; I.7 Emittance. Brightness; I.7.1 Emittance in a Zero Magnetic Field; I.7.2 Brightness
I.7.3 Maximum Langmuir Brightness for Thermionic EmittersPART I ELECTRON BEAMS; 1 Motion of Electrons in External Electric and Magnetic Static Fields; 1.1 Introduction; 1.2 Energy of a Charged Particle; 1.3 Potential-Velocity Relation (Static Fields); 1.4 Electrons in a Linear Electric Field e(0)E = kx; 1.4.1 Nonrelativistic Approximation; 1.4.2 Relativistic Oscillator; 1.5 Motion of Electrons in Homogeneous Static Fields; 1.5.1 Electric Field; 1.5.2 Magnetic Field; 1.5.3 Parallel Electric and Magnetic Fields; 1.5.4 Perpendicular Fields E and B 1.5.5 Arbitrary Orientation of Fields E and B. Nonrelativistic Approximation1.6 Motion of Electrons in Weakly Inhomogeneous Static Fields; 1.6.1 Small Variations in Electromagnetic Fields Acting on Moving Charged Particles; 1.6.2 Adiabatic Invariants; 1.6.3 Motion of the Guiding Center; 1.7 Motion of Electrons in Fields with Axial and Plane Symmetry. Busch's Theorem; 1.7.1 Systems with Axial Symmetry. Busch's Theorem; 1.7.2 Formation of Helical Trajectories at a Jump in a Magnetic Field; 1.7.3 Systems with Plane Symmetry; 2 Electron Lenses; 2.1 Introduction 2.2 Maupertuis's Principle. Electron-Optical Refractive Index. Differential Equations of Trajectories2.2.1 Maupertuis's Principle. Differential Equations of Trajectories; 2.2.2 General Properties of Charged-Particle Trajectories in Electromagnetic Fields; 2.3 Differential Equations of Trajectories in Axially Symmetric Fields; 2.4 Differential Equations of Paraxial Trajectories in Axially Symmetric Fields Without a Space Charge; 2.5 Formation of Images by Paraxial Trajectories; 2.5.1 Linearization of Trajectory Equations; 2.5.2 Rotation of an Image. Stigmatic Imaging. Image Similarity 2.5.3 Magnifications2.6 Electrostatic Axially Symmetric Lenses; 2.6.1 Classification of Electrostatic Lenses; 2.6.2 Immersion and Unipotential Lenses; 2.6.3 Cardinal Elements of a Lens with Limited Field Extent; 2.6.4 Focal Length of Thin Unipotential and Immersion Lenses; 2.6.5 Aperture Lenses; 2.6.6 Applications of Cathode Lenses; 2.7 Magnetic Axially Symmetric Lenses; 2.7.1 Equations of Paraxial Trajectories. Classification of Magnetic Lenses; 2.7.2 Short Magnetic Lenses; 2.7.3 Strong Magnetic Lenses; 2.7.4 Long Magnetic Lenses; 2.8 Aberrations of Axially Symmetric Lenses 2.8.1 Geometric Aberrations |
Record Nr. | UNINA-9910876833703321 |
Tsimring Shulim E. <1924->
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||
Hoboken, N.J., : Wiley-Interscience, c2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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