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Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910139612403321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910822805803321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Boron nitride nanoribbons from exfoliation of boron nitride nanotubes / / Ching-cheh Hung, Janet Hurst, and Diana Santiago
| Boron nitride nanoribbons from exfoliation of boron nitride nanotubes / / Ching-cheh Hung, Janet Hurst, and Diana Santiago |
| Autore | Hung Ching-cheh |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , April 2017 |
| Descrizione fisica | 1 online resource (12 pages) : illustrations |
| Collana | NASA/TM |
| Soggetto topico |
Boron nitrides
Nanostructure (characteristics) Nanotubes Transmission electron microscopy X ray diffraction |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910705800103321 |
Hung Ching-cheh
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , April 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Design of the transmission electron microscope (TEM) sampler scriber template as developed to improve and simplify the sample preparation procedure [[electronic resource] /] / Wendy L. Sarney
| Design of the transmission electron microscope (TEM) sampler scriber template as developed to improve and simplify the sample preparation procedure [[electronic resource] /] / Wendy L. Sarney |
| Autore | Sarney Wendy L |
| Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , [2007] |
| Descrizione fisica | v, 19 pages : digital, PDF file |
| Collana | ARL-TR |
| Soggetto topico |
Electron microscopy
Transmission electron microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Design of the transmission electron microscope |
| Record Nr. | UNINA-9910698185503321 |
|
Sarney Wendy L
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| Adelphi, MD : , : Army Research Laboratory, , [2007] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910458542203321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910784513003321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910822480903321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Liquid cell electron microscopy / / [edited by] Frances M. Ross [[electronic resource]]
| Liquid cell electron microscopy / / [edited by] Frances M. Ross [[electronic resource]] |
| Autore | Ross Frances M. <1964-> |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2017 |
| Descrizione fisica | 1 online resource (xviii, 509 pages) : digital, PDF file(s) |
| Disciplina | 502.8/25 |
| Collana | Advances in microscopy and microanalysis |
| Soggetto topico |
Electron microscopy - Technique
Liquids - Microscopy Transmission electron microscopy |
| ISBN |
1-316-88287-X
1-316-88353-1 1-316-88364-7 1-316-88375-2 1-316-33745-6 1-316-88386-8 1-316-88419-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Past, present and future electron microscopy of liquid specimens / Niels de Jonge and Frances M. Ross -- Encapsulated liquid cells for transmission electron microscopy / Eric Jensen and Kristian Mølhave -- Imaging liquid processes using open cells in the tem, sem, and beyond / Chongmin Wang -- Membrane based environmental cells for sem in liquids / Andrei Kolmakov -- Observations in liquids using an inverted SEM / Chikara Sato and Mitsuo Suga -- Temperature control in liquid cells for TEM / Shen J. Dillon and Xin Chen -- Electron beam effects in liquid cell TEM and STEM / Nicholas M. Schneider -- Resolution in liquid cell experiments / Niels de Jonge, Nigel Browning, James E. Evans, See Wee Chee and Frances M. Ross -- Nanostructure growth, interactions and assembly in the liquid phase / Hong-Gang Liao, Kai-Yang Niu and Haimei Zheng -- Quantifying electrochemical processes using liquid cell TEM / Frances M. Ross -- Application of electrochemical liquid cells for electrical energy storage and conversion studies / Raymond R. Unocic and Karren L. More -- Applications of liquid cell TEM in corrosion science / See Wee Chee and M. Grace Burke -- Nanoscale water imaged by liquid cell TEM / Utkur Mirsaidov and Paul Matsudaira -- Nanoscale deposition and etching of materials using focused electron beams and liquid reactants / Eugenii U. Donev, Matthew Bresin and J. Todd Hastings -- Liquid cell TEM for studying environmental and biological mineral systems / Michael H. Nielsen and James J. De Yoreo -- Liquid STEM for studying biological function in whole cells / Diana B. Peckys and Niels de Jonge -- Visualizing macromolecules in liquid at the nanoscale / Andrew C. Demmert, Madeline J. Dukes, Elliot Pohlmann, Kaya Patel, A. Cameron Varano, Zhi Sheng, Sarah M. McDonald, Michael Spillman, Utkur Mirsaidov, Paul Matsudaira, and Deborah F. Kelly -- Application of liquid cell microscopy to study function of muscle proteins / Haruo Sugi, Shigeru Chaen, Tsuyoshi Akimoto, Masaru Tanokura, Takuya Miyakawa and Hiroki Minoda -- High resolution imaging in the graphene liquid cell / Jungwon Park, Vivekananda P. Adiga, Alex Zettl, and A. Paul Alivisatos -- Analytical electron microscopy during in situ liquid cell studies / Megan E. Holtz, David A. Muller, and Nestor J. Zaluzec -- Spherical and chromatic aberration correction for atomic-resolution liquid cell electron microscopy / Rafal E. Dunin-Borkowski and Lothar Houben -- The potential for imaging dynamic processes in liquids with high temporal resolution / Nigel D. Browning and James E. Evans -- Future prospects for biomolecular, biomimetic and biomaterials research enabled by new liquid cell electron microscopy techniques / Taylor Woehl and Tanya Prozorov. |
| Record Nr. | UNINA-9910150170503321 |
|
Ross Frances M. <1964->
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| Cambridge : , : Cambridge University Press, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Material characterization using electron holography / / Daisuke Shindo, Takeshi Tomita
| Material characterization using electron holography / / Daisuke Shindo, Takeshi Tomita |
| Autore | Shindō D (Daisuke), <1953-> |
| Pubbl/distr/stampa | Weinheim, Germany : , : Wiley-VCH, , [2023] |
| Descrizione fisica | 1 online resource (242 pages) : illustrations |
| Disciplina | 502.825 |
| Soggetto topico |
Electron holography
Materials - Electric properties Transmission electron microscopy |
| ISBN |
9783527829712
3-527-82971-7 3-527-82969-5 9783527829705 3-527-82970-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright -- Contents -- Preface -- List of Specimens -- Part I Introduction -- Chapter 1 Importance of Electromagnetic Field and Its Visualization -- Chapter 2 Maxwell's Equations and Special Relativity -- 2.1 Maxwell's Equations and Electromagnetic Potentials -- 2.2 Maxwell's Equations Formulated Using Special Relativity -- References -- Chapter 3 Basis of Transmission Electron Microscopy -- Part II Principles and Practice -- Chapter 4 Principles of Electron Holography -- 4.1 Types of Electron Holography -- 4.2 Outline of Electron Holography -- 4.3 Comparison of Phase Shifts Due to Scalar and Vector Potentials -- 4.3.1 Phase Shift Due to Scalar Potential -- 4.3.2 Phase Shift Due to Vector Potential -- 4.3.3 Effect of Thickness Change on Phase Shifts Due to Scalar and Vector Potentials -- 4.3.4 Electric Information -- 4.4 Analysis of Reconstructed Phase Images by Computer Simulation -- References -- Chapter 5 Microscope Constitution and Hologram Formation -- 5.1 Basic Constitution of Transmission Electron Microscope -- 5.1.1 Electron Gun System -- 5.1.2 Illumination System -- 5.1.3 Imaging System -- 5.1.3.1 Focal Length -- 5.1.3.2 Spherical Aberration Coefficient -- 5.1.3.3 Chromatic Aberration Coefficient -- 5.1.3.4 Minimum Step of Defocus -- 5.1.4 Observation System -- 5.1.4.1 Television Camera -- 5.1.4.2 Slow‐Scan Charge‐Coupled Device Camera -- 5.1.5 Operation of Transmission Electron Microscope -- 5.1.5.1 Adjustment of Electron Gun -- 5.1.5.2 Alignment and Astigmatism Correction of Condenser Lenses -- 5.1.5.3 Alignment of Voltage Center and Correction of Objective Lens Astigmatism -- 5.1.5.4 Correction of Intermediate Lens Astigmatism -- 5.1.5.5 Alignment of Projector Lens -- 5.1.5.6 Adjustment of Objective Lens Focus -- 5.2 Biprism System -- 5.3 Coherence Lengths -- 5.4 Formation of Interference Fringes.
5.4.1 Geometrical‐Path Interpretation with Two Virtual Sources -- 5.4.2 Wave‐Optical Treatment -- 5.4.2.1 Wave Function at Wire Plane -- 5.4.2.2 Green's Integral Theorem -- 5.4.2.3 Explicit Form of Green's Function -- 5.4.2.4 Intensity Distribution of Interference Fringes -- 5.4.2.5 Stationary Points and Interference Region -- 5.4.2.6 Spacing of Interference Fringes -- 5.5 Simulation of Interference Fringes -- References -- Chapter 6 Related Techniques and Specialized Instrumentation -- 6.1 Split‐Illumination Electron Holography -- 6.2 Dark‐Field Electron Holographic Interferometry -- 6.3 Lorentz Microscopy -- 6.3.1 Fresnel Mode (Defocusing Mode) -- 6.3.2 Foucault Mode (In‐Focus Mode) -- 6.3.3 Lorentz Microscopy Using Scanning Transmission Electron Microscope -- 6.3.4 Phase Reconstruction Using Transport‐of‐Intensity Equation -- 6.4 Magnetically Shielded Lens and High‐Voltage Electron Microscope -- 6.5 Aberration‐Corrected Lens System -- 6.6 Multifunctional Specimen Holders with Piezodriving Probes -- 6.7 Specimen Preparation Techniques -- 6.8 High‐Resolution and Analytical Electron Microscopy -- 6.8.1 Conventional Microscopy and High‐Resolution Electron Microscopy -- 6.8.2 High‐Angle Annular Dark‐Field Method -- 6.8.3 Analytical Electron Microscopy -- References -- Part III Application -- Chapter 7 Electric Field Analysis -- 7.1 Measurement of Inner Potential -- 7.1.1 Diamond‐Like Carbon -- 7.1.2 SiO2 Particles -- 7.1.3 p-n Junctions and Low‐Dimensional Materials -- 7.2 Electric Field Analysis of Precipitates in Multilayer Ceramic Capacitor -- 7.3 Analysis of Spontaneous Polarization in Oxide Heterojunctions -- 7.4 Evaluation of Electric Charge with Laser Irradiation -- 7.5 Analysis of Conductivity with Microstructure Changes -- 7.6 Detection of Electric Field Variation Around Field Emitter -- References -- Chapter 8 Magnetic Field Analysis. 8.1 Quantitative Analysis of Magnetic Flux Distribution of Nanoparticles -- 8.2 Observation of Magnetization Processes -- 8.2.1 Soft Magnetic Materials -- 8.2.2 Hard Magnetic Materials -- 8.2.3 Magnetic Recording Materials -- 8.2.4 Ferromagnetic Shape‐Memory Materials -- 8.3 Observation of Magnetic Structure Change with Temperature -- 8.4 Analysis of Three‐Dimensional Magnetic Structures -- References -- Part IV Visualization of Collective Motions of Electrons and Their Interpretation -- Chapter 9 Charging Effects and Secondary Electron Distribution of Biological Specimens -- 9.1 Visualization of Stationary Electron Orbits -- 9.1.1 Stationary Electron Orbits Observed Around Microfibrils -- 9.1.2 Simulation of Electron Orbits Around Microfibril -- 9.1.3 Interpretation of Reconstructed Amplitude Image -- 9.1.4 Simulation of Visibility of Interference Fringes for Electron Motion -- 9.1.5 Change in Electron Orbits Due to Insertion of Electrode -- 9.2 Visualization of Accumulative and Collective Motions of Electrons -- References -- Chapter 10 Collective Motions of Electrons Around Various Charged Insulators -- 10.1 Accumulation of Electrons on Cleaved Surfaces of BaTiO3 -- 10.2 Dependency of Electron Distribution on Surface Condition of Epoxy Resin and Kidney -- 10.3 Electron Distribution Between Epoxy Resin and Kidney -- 10.4 Control of Electron Distribution Around Cellulose Nanofibers by Applying External Electric Field -- References -- Chapter 11 Extension of Analysis of Collective Motions of Electrons -- 11.1 Electron Spin Polarization -- 11.2 Accumulation of Electrons on Bulk Insulator Surface -- References -- Chapter 12 Theoretical Consideration on Visualizing Collective Motions of Electrons -- 12.1 De Broglie's Matter Wave and Wave Function -- 12.2 Disturbance‐Free Observation -- 12.3 Electron Interference and General Relativity. 12.3.1 Einstein's Field Equations Based on General Relativity -- 12.3.2 Infeld and Schild's Approximate Solution to Einstein's Field Equations -- 12.4 Spinning Linear Wave Model -- 12.5 Electron Interference Formulated with Spinning Linear Wave -- 12.5.1 Interpretation of Diffraction Intensity -- 12.5.2 Interpretation of Interference Fringes -- 12.5.3 Simulation of Interference Fringes -- 12.6 Interpretation of Wave-Particle Dualism -- References -- A Physical Constants, Conversion Factors, and Electron Wavelength -- Index -- EULA. |
| Record Nr. | UNINA-9910831182803321 |
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Shindō D (Daisuke), <1953->
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| Weinheim, Germany : , : Wiley-VCH, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Sample preparation procedure for TEM imaging of semiconductor materials [[electronic resource] /] / by Wendy L. Sarney
| Sample preparation procedure for TEM imaging of semiconductor materials [[electronic resource] /] / by Wendy L. Sarney |
| Autore | Sarney Wendy L |
| Pubbl/distr/stampa | Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2004] |
| Descrizione fisica | 1 online resource (iv, 10 pages) : illustrations |
| Collana | ARL-TR |
| Soggetto topico |
Semiconductors - Sampling - United States
Transmission electron microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Sample preparation procedure for Transmission Electron Microscopy imaging of semiconductor materials |
| Record Nr. | UNINA-9910699726803321 |
|
Sarney Wendy L
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| Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2004] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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