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High-resolution electron microscopy [[electronic resource] /] / John C.H. Spence
| High-resolution electron microscopy [[electronic resource] /] / John C.H. Spence |
| Autore | Spence John C. H |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | New York, : Oxford University Press, 2009 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
502.825
535.3325 |
| Collana | Monographs on the physics and chemistry of materials |
| Soggetto topico |
Transmission electron microscopes
Electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-19-170866-6
1-281-97574-5 9786611975746 0-19-156461-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1 Preliminaries; 2 Electron Optics; 3 Wave Optics; 4 Coherence and Fourier Optics; 5 High-Resolution Images of Crystals and their Defects; 6 HREM in Biology, Organic Crystals, and Radiation Damage; 7 Image Processing and Super-Resolution Schemes; 8 STEM and Z-contrast; 9 Electron Sources and Detectors; 10 Measurement of Electron-Optical Parameters; 11 Instabilities and the Microscope Environment; 12 Experimental Methods; 13 Associated Techniques; Appendices; Index |
| Record Nr. | UNINA-9910454476403321 |
Spence John C. H
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| New York, : Oxford University Press, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution electron microscopy [[electronic resource] /] / John C.H. Spence
| High-resolution electron microscopy [[electronic resource] /] / John C.H. Spence |
| Autore | Spence John C. H |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | New York, : Oxford University Press, 2009 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
502.825
535.3325 |
| Collana | Monographs on the physics and chemistry of materials |
| Soggetto topico |
Transmission electron microscopes
Electron microscopy |
| ISBN |
0-19-170866-6
1-281-97574-5 9786611975746 0-19-156461-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1 Preliminaries; 2 Electron Optics; 3 Wave Optics; 4 Coherence and Fourier Optics; 5 High-Resolution Images of Crystals and their Defects; 6 HREM in Biology, Organic Crystals, and Radiation Damage; 7 Image Processing and Super-Resolution Schemes; 8 STEM and Z-contrast; 9 Electron Sources and Detectors; 10 Measurement of Electron-Optical Parameters; 11 Instabilities and the Microscope Environment; 12 Experimental Methods; 13 Associated Techniques; Appendices; Index |
| Record Nr. | UNINA-9910782805503321 |
|
Spence John C. H
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||
| New York, : Oxford University Press, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The operation of the transmission electron microscope / Dawn Chescoe and Peter J. Goodhew
| The operation of the transmission electron microscope / Dawn Chescoe and Peter J. Goodhew |
| Autore | Chescoe, Dawn |
| Pubbl/distr/stampa | Oxford, OX ; New York : Oxford University Press |
| Descrizione fisica | iv, 51 p. : ill. ; 24 cm |
| Disciplina | 502/.8/25 |
| Altri autori (Persone) | Goodhew, Peter J. |
| Collana |
Microscopy handbooks ; 02
Oxford science publications |
| Soggetto topico | Transmission electron microscopes |
| ISBN | 0198564023 (pbk.) |
| Classificazione |
LC QH212.T7
621.3.3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991003481229707536 |
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Chescoe, Dawn
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| Oxford, OX ; New York : Oxford University Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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The transmission electron microscope / / edited by Maaz Khan
| The transmission electron microscope / / edited by Maaz Khan |
| Pubbl/distr/stampa | Rijeka, Croatia : , : IntechOpen, , [2012] |
| Descrizione fisica | 1 online resource (394 pages) : illustrations |
| Disciplina | 502.825 |
| Soggetto topico | Transmission electron microscopes |
| ISBN | 953-51-6192-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910317604203321 |
| Rijeka, Croatia : , : IntechOpen, , [2012] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials [[electronic resource] /] / by Wendy L. Sarney
| Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials [[electronic resource] /] / by Wendy L. Sarney |
| Autore | Sarney Wendy L |
| Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , [2003] |
| Descrizione fisica | 1 online resource (iv, 17 pages) : color illustrations |
| Collana | ARL-TR |
| Soggetto topico |
Diffraction patterns - Analysis
Semiconductors - Materials - Structure - Analysis Transmission electron microscopes |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910699582803321 |
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Sarney Wendy L
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| Adelphi, MD : , : Army Research Laboratory, , [2003] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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