Analysis and design of inductors for protecting power transistors against current surges in inverter bridge circuits / / by Francis Gourash
| Analysis and design of inductors for protecting power transistors against current surges in inverter bridge circuits / / by Francis Gourash |
| Autore | Gourash Francis |
| Pubbl/distr/stampa | Washington, D.C. : , : National Aeronautics and Space Administration, , January 1969 |
| Descrizione fisica | 1 online resource (ii, 43 pages) : illustrations |
| Collana | NASA/TN |
| Soggetto topico |
Circuits
Transistors - Protection - Equipment and supplies - Design and construction Transients (Electricity) - Prevention - Equipment and supplies - Design and construction Electric inductors - Design and construction Transistor circuits Bridge circuits Static relays |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910716067103321 |
Gourash Francis
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| Washington, D.C. : , : National Aeronautics and Space Administration, , January 1969 | ||
| Lo trovi qui: Univ. Federico II | ||
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Elementary circuit properties of transistors / Campbell L. Searle...[et al.]
| Elementary circuit properties of transistors / Campbell L. Searle...[et al.] |
| Autore | Searle, Campbell L. |
| Pubbl/distr/stampa | New York : John Wiley & Sons, 1964 |
| Descrizione fisica | xxi, 306 p. ; 22 cm. |
| Collana | Semiconductor electronics education committee books ; 3 |
| Soggetto topico | Transistor circuits |
| Classificazione |
621.3.2
621.38151 TK7872.T73 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000914989707536 |
Searle, Campbell L.
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| New York : John Wiley & Sons, 1964 | ||
| Lo trovi qui: Univ. del Salento | ||
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IEEE Std 1722.1-2013/Cor 1-2018 (Corrigendum to IEEE Std 1722.1-2013) : IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1, Technical and Editorial Corrections / / Institute of Electrical and Electronics Engineers
| IEEE Std 1722.1-2013/Cor 1-2018 (Corrigendum to IEEE Std 1722.1-2013) : IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1, Technical and Editorial Corrections / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2019 |
| Descrizione fisica | 1 online resource (69 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Static relays
Transistor circuits |
| ISBN | 1-5044-5497-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1722.1-2013/Cor 1-2018 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722
IEEE Std 1722.1-2013/Cor 1-2018 |
| Record Nr. | UNINA-9910313050803321 |
| New York, New York : , : IEEE, , 2019 | ||
| Lo trovi qui: Univ. Federico II | ||
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IEEE Std 1722.1-2013/Cor 1-2018 (Corrigendum to IEEE Std 1722.1-2013) : IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1, Technical and Editorial Corrections / / Institute of Electrical and Electronics Engineers
| IEEE Std 1722.1-2013/Cor 1-2018 (Corrigendum to IEEE Std 1722.1-2013) : IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1, Technical and Editorial Corrections / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2019 |
| Descrizione fisica | 1 online resource (69 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Static relays
Transistor circuits |
| ISBN | 1-5044-5497-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
1722.1-2013/Cor 1-2018 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722
IEEE Std 1722.1-2013/Cor 1-2018 |
| Record Nr. | UNISA-996577943403316 |
| New York, New York : , : IEEE, , 2019 | ||
| Lo trovi qui: Univ. di Salerno | ||
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ISO/IEC/IEEE 8802-1CB:2019(E) : IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB, Frame replication and elimination for reliability / / Institute of Electrical and Electronics Engineers
| ISO/IEC/IEEE 8802-1CB:2019(E) : IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB, Frame replication and elimination for reliability / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2019 |
| Descrizione fisica | 1 online resource (106 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Static relays
Transistor circuits |
| ISBN | 1-5044-5590-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
8802-1CB-2019 - IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB
ISO/IEC/IEEE 8802-1CB |
| Record Nr. | UNINA-9910313050303321 |
| New York, New York : , : IEEE, , 2019 | ||
| Lo trovi qui: Univ. Federico II | ||
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ISO/IEC/IEEE 8802-1CB:2019(E) : IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB, Frame replication and elimination for reliability / / Institute of Electrical and Electronics Engineers
| ISO/IEC/IEEE 8802-1CB:2019(E) : IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB, Frame replication and elimination for reliability / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 2019 |
| Descrizione fisica | 1 online resource (106 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Static relays
Transistor circuits |
| ISBN | 1-5044-5590-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
8802-1CB-2019 - IEEE/ISO/IEC International Standard-Information technology - Telecommunications and information exchange between systems - Local and metropolitan area networks - Specific requirements - Part 1CB
ISO/IEC/IEEE 8802-1CB |
| Record Nr. | UNISA-996577941203316 |
| New York, New York : , : IEEE, , 2019 | ||
| Lo trovi qui: Univ. di Salerno | ||
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Multistage transistor circuits / Richard D. Thornton...[et al.]
| Multistage transistor circuits / Richard D. Thornton...[et al.] |
| Autore | Thornton, Richard D. |
| Pubbl/distr/stampa | New York : John Wiley & Sons, 1965 |
| Descrizione fisica | xiii, 286 p. : ill. ; 22 cm. |
| Collana | Semiconductor electronics education committee books ; 5 |
| Soggetto topico | Transistor circuits |
| Classificazione |
621.3.1
621.3.2 621.381528 TK7872.T73 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001099869707536 |
Thornton, Richard D.
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| New York : John Wiley & Sons, 1965 | ||
| Lo trovi qui: Univ. del Salento | ||
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Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa
| Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa |
| Autore | Kompa Gunter |
| Pubbl/distr/stampa | Boston, Massachusetts, : Artech House, [2020] |
| Descrizione fisica | 1 online resource (609 pages) |
| Disciplina | 621.3813 |
| Collana | Artech House microwave library |
| Soggetto topico |
Microwave devices
Transistor circuits Parameter estimation |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-63081-745-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910480044603321 |
Kompa Gunter
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| Boston, Massachusetts, : Artech House, [2020] | ||
| Lo trovi qui: Univ. Federico II | ||
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Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa
| Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa |
| Autore | Kompa Gunter |
| Pubbl/distr/stampa | Boston, Massachusetts, : Artech House, [2020] |
| Descrizione fisica | 1 online resource (609 pages) |
| Disciplina | 621.3813 |
| Collana | Artech House microwave library |
| Soggetto topico |
Microwave devices
Transistor circuits Parameter estimation |
| ISBN | 1-63081-745-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910793815203321 |
Kompa Gunter
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| Boston, Massachusetts, : Artech House, [2020] | ||
| Lo trovi qui: Univ. Federico II | ||
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Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa
| Parameter Extraction and Complex Nonlinear Transistor Models / / .Günter Kompa |
| Autore | Kompa Gunter |
| Pubbl/distr/stampa | Boston, Massachusetts, : Artech House, [2020] |
| Descrizione fisica | 1 online resource (609 pages) |
| Disciplina | 621.3813 |
| Collana | Artech House microwave library |
| Soggetto topico |
Microwave devices
Transistor circuits Parameter estimation |
| ISBN | 1-63081-745-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910818521103321 |
Kompa Gunter
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| Boston, Massachusetts, : Artech House, [2020] | ||
| Lo trovi qui: Univ. Federico II | ||
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