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Bio-inspired materials research for improved sensitivity low-cost uncooled infrared (IR) detector focal-plane arrays [[electronic resource] /] / Wendy L. Sarney ... [and others]
| Bio-inspired materials research for improved sensitivity low-cost uncooled infrared (IR) detector focal-plane arrays [[electronic resource] /] / Wendy L. Sarney ... [and others] |
| Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , [2010] |
| Descrizione fisica | 1 online resource (vi, 14 pages) : illustrations |
| Altri autori (Persone) | SarneyWendy L |
| Collana | ARL-TR |
| Soggetto topico |
Biomedical materials - Research
Binders (Materials) - Research Thin films - Optical properties |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Bio-inspired materials research for improved sensitivity low-cost uncooled infrared |
| Record Nr. | UNINA-9910697177903321 |
| Adelphi, MD : , : Army Research Laboratory, , [2010] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin
| A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin |
| Autore | McCrackin F. L (Frank L.) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1964 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | McCrackinF. L (Frank L.) |
| Collana | NBS technical note |
| Soggetto topico |
FORTRAN (Computer program language)
Thin films - Optical properties |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711247303321 |
McCrackin F. L (Frank L.)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1964 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of infrared spectroscopy of ultrathin films [[electronic resource] /] / Valeri P. Tolstoy, Irina V. Chernyshova, Valeri A. Skryshevsky
| Handbook of infrared spectroscopy of ultrathin films [[electronic resource] /] / Valeri P. Tolstoy, Irina V. Chernyshova, Valeri A. Skryshevsky |
| Autore | Tolstoy Valeri P |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2003 |
| Descrizione fisica | 1 online resource (738 p.) |
| Disciplina |
530.4175
621.38152 |
| Altri autori (Persone) |
ChernyshovaIrina V
SkryshevskyValeri A |
| Soggetto topico |
Thin films - Optical properties
Infrared spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-36702-4
9786610367023 0-470-35236-1 0-471-46183-0 0-471-23432-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
HANDBOOK OF INFRARED SPECTROSCOPY OF ULTRATHIN FILMS; CONTENTS; Preface; Acronyms and Symbols; Introduction; 1 Absorption and Reflection of Infrared Radiation by Ultrathin Films; 1.1. Macroscopic Theory of Propagation of Electromagnetic Waves in Infinite Medium; 1.2. Modeling Optical Properties of a Material; 1.3. Classical Dispersion Models of Absorption; 1.4. Propagation of IR Radiation through Planar Interface between Two Isotropic Media; 1.4.1. Transparent Media; 1.4.2. General Case; 1.5. Reflection of Radiation at Planar Interface Covered by Single Layer
1.6. Transmission of Layer Located at Interface between Two Isotropic Semi-infinite Media1.7. System of Plane-Parallel Layers: Matrix Method; 1.8. Energy Absorption in Layered Media; 1.8.1. External Reflection: Transparent Substrates; 1.8.2. External Reflection: Metallic Substrates; 1.8.3. ATR; 1.9. Effective Medium Theory; 1.10. Diffuse Reflection and Transmission; Appendix; References; 2 Optimum Conditions for Recording Infrared Spectra of Ultrathin Films; 2.1. IR Transmission Spectra Obtained in Polarized Radiation; 2.2. IRRAS Spectra of Layers on Metallic Surfaces ("Metallic" IRRAS) 2.3. IRRAS of Layers on Semiconductors and Dielectrics2.3.1. Transparent and Weakly Absorbing Substrates ("Transparent" IRRAS); 2.3.2. Absorbing Substrates; 2.3.3. Buried Metal Layer Substrates (BML-IRRAS); 2.4. ATR Spectra; 2.5. IR Spectra of Layers Located at Interface; 2.5.1. Transmission; 2.5.2. Metallic IRRAS; 2.5.3. Transparent IRRAS; 2.5.4. ATR; 2.6. Choosing Appropriate IR Spectroscopic Method for Layer on Flat Surface; 2.7. Coatings on Powders, Fibers, and Matte Surfaces; 2.7.1. Transmission; 2.7.2. Diffuse Transmittance and Diffuse Reflectance; 2.7.3. ATR 2.7.4. Comparison of IR Spectroscopic Methods for Studying Ultrathin Films on PowdersReferences; 3 Interpretation of IR Spectra of Ultrathin Films; 3.1. Dependence of Transmission, ATR, and IRRAS Spectra of Ultrathin Films on Polarization (Berreman Effect); 3.2. Theory of Berreman Effect; 3.2.1. Surface Modes; 3.2.2. Modes in Ultrathin Films; 3.2.3. Identification of Berreman Effect in IR Spectra of Ultrathin Films; 3.3. Optical Effect: Film Thickness, Angle of Incidence, and Immersion; 3.3.1. Effect in "Metallic" IRRAS; 3.3.2. Effect in "Transparent" IRRAS; 3.3.3. Effect in ATR Spectra 3.3.4. Effect in Transmission Spectra3.4. Optical Effect: Band Shapes in IRRAS as Function of Optical Properties of Substrate; 3.5. Optical Property Gradients at Substrate-Layer Interface: Effect on Band Intensities in IRRAS; 3.6. Dipole-Dipole Coupling; 3.7. Specific Features in Potential-Difference IR Spectra of Electrode-Electrolyte Interfaces; 3.7.1. Absorption Due to Bulk Electrolyte; 3.7.2. (Re)organization of Electrolyte in DL; 3.7.3. Donation/Backdonation of Electrons; 3.7.4. Stark Effect; 3.7.5. Bipolar Bands; 3.7.6. Effect of Coadsorption; 3.7.7. Electronic Absorption 3.7.8. Optical Effects |
| Record Nr. | UNINA-9910143190303321 |
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Tolstoy Valeri P
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| Hoboken, N.J., : Wiley-Interscience, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of infrared spectroscopy of ultrathin films [[electronic resource] /] / Valeri P. Tolstoy, Irina V. Chernyshova, Valeri A. Skryshevsky
| Handbook of infrared spectroscopy of ultrathin films [[electronic resource] /] / Valeri P. Tolstoy, Irina V. Chernyshova, Valeri A. Skryshevsky |
| Autore | Tolstoy Valeri P |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2003 |
| Descrizione fisica | 1 online resource (738 p.) |
| Disciplina |
530.4175
621.38152 |
| Altri autori (Persone) |
ChernyshovaIrina V
SkryshevskyValeri A |
| Soggetto topico |
Thin films - Optical properties
Infrared spectroscopy |
| ISBN |
1-280-36702-4
9786610367023 0-470-35236-1 0-471-46183-0 0-471-23432-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
HANDBOOK OF INFRARED SPECTROSCOPY OF ULTRATHIN FILMS; CONTENTS; Preface; Acronyms and Symbols; Introduction; 1 Absorption and Reflection of Infrared Radiation by Ultrathin Films; 1.1. Macroscopic Theory of Propagation of Electromagnetic Waves in Infinite Medium; 1.2. Modeling Optical Properties of a Material; 1.3. Classical Dispersion Models of Absorption; 1.4. Propagation of IR Radiation through Planar Interface between Two Isotropic Media; 1.4.1. Transparent Media; 1.4.2. General Case; 1.5. Reflection of Radiation at Planar Interface Covered by Single Layer
1.6. Transmission of Layer Located at Interface between Two Isotropic Semi-infinite Media1.7. System of Plane-Parallel Layers: Matrix Method; 1.8. Energy Absorption in Layered Media; 1.8.1. External Reflection: Transparent Substrates; 1.8.2. External Reflection: Metallic Substrates; 1.8.3. ATR; 1.9. Effective Medium Theory; 1.10. Diffuse Reflection and Transmission; Appendix; References; 2 Optimum Conditions for Recording Infrared Spectra of Ultrathin Films; 2.1. IR Transmission Spectra Obtained in Polarized Radiation; 2.2. IRRAS Spectra of Layers on Metallic Surfaces ("Metallic" IRRAS) 2.3. IRRAS of Layers on Semiconductors and Dielectrics2.3.1. Transparent and Weakly Absorbing Substrates ("Transparent" IRRAS); 2.3.2. Absorbing Substrates; 2.3.3. Buried Metal Layer Substrates (BML-IRRAS); 2.4. ATR Spectra; 2.5. IR Spectra of Layers Located at Interface; 2.5.1. Transmission; 2.5.2. Metallic IRRAS; 2.5.3. Transparent IRRAS; 2.5.4. ATR; 2.6. Choosing Appropriate IR Spectroscopic Method for Layer on Flat Surface; 2.7. Coatings on Powders, Fibers, and Matte Surfaces; 2.7.1. Transmission; 2.7.2. Diffuse Transmittance and Diffuse Reflectance; 2.7.3. ATR 2.7.4. Comparison of IR Spectroscopic Methods for Studying Ultrathin Films on PowdersReferences; 3 Interpretation of IR Spectra of Ultrathin Films; 3.1. Dependence of Transmission, ATR, and IRRAS Spectra of Ultrathin Films on Polarization (Berreman Effect); 3.2. Theory of Berreman Effect; 3.2.1. Surface Modes; 3.2.2. Modes in Ultrathin Films; 3.2.3. Identification of Berreman Effect in IR Spectra of Ultrathin Films; 3.3. Optical Effect: Film Thickness, Angle of Incidence, and Immersion; 3.3.1. Effect in "Metallic" IRRAS; 3.3.2. Effect in "Transparent" IRRAS; 3.3.3. Effect in ATR Spectra 3.3.4. Effect in Transmission Spectra3.4. Optical Effect: Band Shapes in IRRAS as Function of Optical Properties of Substrate; 3.5. Optical Property Gradients at Substrate-Layer Interface: Effect on Band Intensities in IRRAS; 3.6. Dipole-Dipole Coupling; 3.7. Specific Features in Potential-Difference IR Spectra of Electrode-Electrolyte Interfaces; 3.7.1. Absorption Due to Bulk Electrolyte; 3.7.2. (Re)organization of Electrolyte in DL; 3.7.3. Donation/Backdonation of Electrons; 3.7.4. Stark Effect; 3.7.5. Bipolar Bands; 3.7.6. Effect of Coadsorption; 3.7.7. Electronic Absorption 3.7.8. Optical Effects |
| Record Nr. | UNINA-9910829913703321 |
|
Tolstoy Valeri P
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| Hoboken, N.J., : Wiley-Interscience, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Optical properties of Zn(O,S) thin films deposited by RF sputtering atomic layer deposition, and chemcial bath deposition [[electronic resource] ] : preprint / / Jian Li ... [and others]
| Optical properties of Zn(O,S) thin films deposited by RF sputtering atomic layer deposition, and chemcial bath deposition [[electronic resource] ] : preprint / / Jian Li ... [and others] |
| Pubbl/distr/stampa | [Golden, CO] : , : National Renewable Energy Laboratory, , [2012] |
| Descrizione fisica | 1 online resource (4 pages) : color illustrations |
| Altri autori (Persone) | LiJian |
| Collana | Conference paper NREL/CP |
| Soggetto topico |
Thin films - Optical properties
Photoluminescence |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Optical properties of Zn |
| Record Nr. | UNINA-9910701935703321 |
| [Golden, CO] : , : National Renewable Energy Laboratory, , [2012] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten
| A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten |
| Autore | Quinten Michael |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2013 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 530.42750287 |
| Soggetto topico |
Thin films - Optical properties
Thin films - Measurement Optical measurements |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-299-47599-X
3-527-66437-8 3-527-66434-3 3-527-66435-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
A Practical Guide to Optical Metrology for Thin Films; Contents; Preface; 1 Introduction; 2 Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.5.1 Transmission Gratings; 2.5.1.1 Lamellar Transmission Gratings; 2.5.1.2 Holographic Transmission Gratings; 2.5.2 Reflection Gratings; 2.5.2.1 Lamellar Reflection Gratings; 2.5.2.2 Blazed Gratings; 2.5.2.3 Holographic Gratings; 2.6 Scattering
2.7 Dielectric Function and Refractive Index2.7.1 Models for the Dielectric Function; 2.7.2 Kramers-Kronig Analysis of Dielectric Functions; 2.7.3 Empiric Formulas for the Refractive Index; 2.7.4 EMA Models; 3 Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.1.1 Coherent Superposition of Reflected Light; 3.1.2 Influence of Absorption on the Layer; 3.1.3 Partial Incoherence due to Thick Substrates; 3.1.4 Partial Incoherence due to Roughness; 3.1.5 Coherent Superposition of Transmitted Light 3.2 Propagating Wave Model for a Layer Stack3.2.1 Coherent Reflectance and Transmittance of a Layer Stack; 3.2.2 Consideration of Incoherent Substrates; 3.2.3 Consideration of Surface Roughness; 3.2.4 r-t-ø Model for a Layer Stack; 4 The Optical Measurement; 4.1 Spectral Reflectance and Transmittance Measurement; 4.2 Ellipsometric Measurement; 4.3 Other Optical Methods; 4.3.1 Prism Coupling; 4.3.2 Chromatic Thickness Determination; 4.4 Components for the Optical Measurement; 4.4.1 Light Sources; 4.4.1.1 Halogen Lamps; 4.4.1.2 White Light LED; 4.4.1.3 Superluminescence Diodes 4.4.1.4 Xenon High-Pressure Arc Lamps4.4.1.5 Deuterium Lamps; 4.4.2 Optical Components; 4.4.2.1 Lenses and Mirrors; 4.4.2.2 Polarizers and Analyzers; 4.4.2.3 Optical Retarders; 4.4.3 Optical Fibers; 4.4.4 Miniaturized Spectrometers; 4.4.4.1 Gratings; 4.4.4.2 Detectors; 4.4.4.3 System Properties; 5 Thin-Film Thickness Determination; 5.1 Fast Fourier Transform; 5.1.1 Single Layer; 5.1.2 Layer Stack; 5.1.3 Accuracy, Resolution, Repeatability, and Reproducibility; 5.2 Regression Analysis with χ2-Test; 5.2.1 Method of Thickness Determination 5.2.2 Accuracy, Resolution, Repeatability, and Reproducibility6 The Color of Thin Films; 7 Applications; 7.1 High-Reflection and Antireflection Coatings; 7.1.1 HR Coatings on Metallic Mirrors; 7.1.2 AR Coatings on Glass; 7.1.3 AR Coatings on Solar Wafers; 7.2 Thin Single- and Double-Layer Coatings; 7.2.1 SiO2 on Silicon Wafers; 7.2.2 Si3N4 Hardcoat; 7.2.3 Double-Layer System; 7.2.4 Porous Silicon on Silicon; 7.3 Photoresists and Photolithographic Structuring; 7.4 Thickness of Wafers and Transparent Plastic Films; 7.4.1 Thickness of Semiconductor, Glass, and Sapphire Wafers 7.4.2 Thickness of Transparent Plastic Films |
| Record Nr. | UNINA-9910141393003321 |
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Quinten Michael
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| Weinheim, : Wiley-VCH, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten
| A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten |
| Autore | Quinten Michael |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2013 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 530.42750287 |
| Soggetto topico |
Thin films - Optical properties
Thin films - Measurement Optical measurements |
| ISBN |
1-299-47599-X
3-527-66437-8 3-527-66434-3 3-527-66435-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
A Practical Guide to Optical Metrology for Thin Films; Contents; Preface; 1 Introduction; 2 Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.5.1 Transmission Gratings; 2.5.1.1 Lamellar Transmission Gratings; 2.5.1.2 Holographic Transmission Gratings; 2.5.2 Reflection Gratings; 2.5.2.1 Lamellar Reflection Gratings; 2.5.2.2 Blazed Gratings; 2.5.2.3 Holographic Gratings; 2.6 Scattering
2.7 Dielectric Function and Refractive Index2.7.1 Models for the Dielectric Function; 2.7.2 Kramers-Kronig Analysis of Dielectric Functions; 2.7.3 Empiric Formulas for the Refractive Index; 2.7.4 EMA Models; 3 Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.1.1 Coherent Superposition of Reflected Light; 3.1.2 Influence of Absorption on the Layer; 3.1.3 Partial Incoherence due to Thick Substrates; 3.1.4 Partial Incoherence due to Roughness; 3.1.5 Coherent Superposition of Transmitted Light 3.2 Propagating Wave Model for a Layer Stack3.2.1 Coherent Reflectance and Transmittance of a Layer Stack; 3.2.2 Consideration of Incoherent Substrates; 3.2.3 Consideration of Surface Roughness; 3.2.4 r-t-ø Model for a Layer Stack; 4 The Optical Measurement; 4.1 Spectral Reflectance and Transmittance Measurement; 4.2 Ellipsometric Measurement; 4.3 Other Optical Methods; 4.3.1 Prism Coupling; 4.3.2 Chromatic Thickness Determination; 4.4 Components for the Optical Measurement; 4.4.1 Light Sources; 4.4.1.1 Halogen Lamps; 4.4.1.2 White Light LED; 4.4.1.3 Superluminescence Diodes 4.4.1.4 Xenon High-Pressure Arc Lamps4.4.1.5 Deuterium Lamps; 4.4.2 Optical Components; 4.4.2.1 Lenses and Mirrors; 4.4.2.2 Polarizers and Analyzers; 4.4.2.3 Optical Retarders; 4.4.3 Optical Fibers; 4.4.4 Miniaturized Spectrometers; 4.4.4.1 Gratings; 4.4.4.2 Detectors; 4.4.4.3 System Properties; 5 Thin-Film Thickness Determination; 5.1 Fast Fourier Transform; 5.1.1 Single Layer; 5.1.2 Layer Stack; 5.1.3 Accuracy, Resolution, Repeatability, and Reproducibility; 5.2 Regression Analysis with χ2-Test; 5.2.1 Method of Thickness Determination 5.2.2 Accuracy, Resolution, Repeatability, and Reproducibility6 The Color of Thin Films; 7 Applications; 7.1 High-Reflection and Antireflection Coatings; 7.1.1 HR Coatings on Metallic Mirrors; 7.1.2 AR Coatings on Glass; 7.1.3 AR Coatings on Solar Wafers; 7.2 Thin Single- and Double-Layer Coatings; 7.2.1 SiO2 on Silicon Wafers; 7.2.2 Si3N4 Hardcoat; 7.2.3 Double-Layer System; 7.2.4 Porous Silicon on Silicon; 7.3 Photoresists and Photolithographic Structuring; 7.4 Thickness of Wafers and Transparent Plastic Films; 7.4.1 Thickness of Semiconductor, Glass, and Sapphire Wafers 7.4.2 Thickness of Transparent Plastic Films |
| Record Nr. | UNINA-9910830321103321 |
|
Quinten Michael
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| Weinheim, : Wiley-VCH, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Waveguide spectroscopy of thin films [e-book] / Alexander V. Khomchenko
| Waveguide spectroscopy of thin films [e-book] / Alexander V. Khomchenko |
| Autore | Khomchenko, Alexander V. |
| Pubbl/distr/stampa | Amsterdam : Elsevier, 2005 |
| Descrizione fisica | xv, 220 p. : ill. ; 24 cm |
| Disciplina | 530.4175 |
| Collana | Thin films and nanostructures ; v. 33 |
| Soggetto topico |
Thin films - Spectra
Thin films - Optical properties Couches minces - Spectre Couches minces - Propriétés optiques |
| Soggetto genere / forma | Electronic books. |
| ISBN |
9780120885152
0120885158 |
| Formato | Risorse elettroniche  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Foreword -- -- Acknowledgements -- -- Contents -- -- Introduction -- -- 1. Interaction of light with matter -- -- 2. Spectroscopy of optical guided modes -- -- 3. New applications of the m-line technique for thin-film structure studying -- -- 4. Spatial Fourier spectroscopy of guided modes: measuring the thin-film parameters -- -- 5. Characterizations of thin films by prism coupling of leaky modes -- -- 6. Measurements of absorption spectra of thin films -- -- 7. Applications of waveguide spectroscopy techniques in sensor systems -- -- 8. Optical nonlinearity in thin films at low-intensity light -- -- 9. Optical nonlinearity in multilayer structures -- -- Bibliography -- -- Index |
| Record Nr. | UNISALENTO-991003233999707536 |
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Khomchenko, Alexander V.
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| Amsterdam : Elsevier, 2005 | ||
| Risorse elettroniche | ||
| Lo trovi qui: Univ. del Salento | ||
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