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Fuzzy logic : emerging technologies and applications
| Fuzzy logic : emerging technologies and applications |
| Autore | Dadios Elmer P |
| Pubbl/distr/stampa | IntechOpen, 2012 |
| Descrizione fisica | 1 online resource (350 pages) |
| Disciplina | 511.3 |
| Soggetto topico | TECHNOLOGY & ENGINEERING / Engineering (General) |
| Soggetto non controllato | Email: consumer/user guides |
| ISBN | 953-51-5626-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Fuzzy logic |
| Record Nr. | UNINA-9910138407803321 |
Dadios Elmer P
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| IntechOpen, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Modern Assembly Language Programming With the ARM Processor
| Modern Assembly Language Programming With the ARM Processor |
| Autore | Pyeatt Ph.D Larry D |
| Pubbl/distr/stampa | Cambridge, MA, USA, : Newnes, 2024 |
| Descrizione fisica | 1 online resource (792 p.) |
| Soggetto topico |
COMPUTERS / Programming Languages / General
COMPUTERS / Microprocessors TECHNOLOGY & ENGINEERING / Engineering (General) TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |
| ISBN | 9780443141157 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9911006559903321 |
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Pyeatt Ph.D Larry D
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| Cambridge, MA, USA, : Newnes, 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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SAE International's dictionary of testing, verification, and validation / / by Jon M. Quigley, PMP, CTFL
| SAE International's dictionary of testing, verification, and validation / / by Jon M. Quigley, PMP, CTFL |
| Autore | Quigley Jon M. |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Warrendale, Pennsylvania : , : SAE International, , 2023 |
| Descrizione fisica | 1 online resource (1 PDF (viii, 453 pages)) : illustrations ; ; cm |
| Soggetto topico |
Quality assurance
Engineering Technology - Testing TECHNOLOGY & ENGINEERING / Quality Control TECHNOLOGY & ENGINEERING / Engineering (General) Industrial quality control Engineering: general |
| ISBN |
9781523158041
1523158042 9781468605914 1468605917 9781468605921 1468605925 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover -- Title Page -- Copyright Page -- Contents -- Preface -- A -- Accelerated Testing -- Acceleration Factor -- Acceptance Criteria -- Acceptance Testing -- Accessibility Testing -- Accuracy -- Active Design of Experiments (ADoE) -- Actor-Observer Bias -- Actual Result -- Ad Hoc Review -- Ad Hoc Testing -- Adaptability -- Adaptation -- Advanced Driver Assistance System (ADAS) -- Agile -- Agile Testing -- Aging Tests -- Alpha Testing -- Anomaly -- Altitude Test -- Amp Meter -- Analyzability -- Anechoic Chamber -- API Testing -- Application Binary Interface -- Architectures -- Artifacts -- Artificial Intelligence (AI) -- Attack Vectors -- Audit -- Augmented Reality -- Authority Bias -- Automated Testing -- Automated Testware -- Automotive Safety Integrity Level -- Autosar -- Availability -- B -- B10 -- Back-to-Back Testing -- Basis Path Testing -- Basis Set -- Behavior -- Belief Bias -- Belief Revision -- Benchmark Test -- Berkson's Paradox -- Beta Testing -- Bias -- Big Bang Testing -- Binary Portability Testing -- Black-Box Testing -- Blocked Test Case -- Bottom-Up Testing -- Boundary Condition -- Boundary Testing -- Boundary Testing-Three Point -- Boundary Testing-Two Point -- Boundary Value -- Boundary Value Analysis -- Boundary Value Coverage -- Brake Rotor and Drum Modal Frequencies Verification -- Branch Coverage -- Branch Testing -- Bug -- Bulk Current Injection (BCI) -- Burndown Chart -- Business Process-Based Testing -- C -- Calibration -- Caliper -- Capability Maturity Model for Software -- Capture/Replay Tool -- Cauchy Distribution -- Cause-Effect Analysis -- Cause-Effect Diagram -- Central Tendency -- Change Management (Product) -- Changeability -- Checklist-Based Review -- Chemical Exposure -- Classification Tree -- Classification Tree Method -- Client Server Applications -- Closed-Loop Testing -- Cloud-Based Testing.
Clustering Illusion -- CMMI (Capability Maturity Model Integration) -- Capability Levels -- Maturity Level -- Code Complete -- Code Coverage -- Code Inspection -- Code Review -- Code Walkthrough -- Combinatorial Explosion -- Combinatorial Testing -- Combined Environmental Testing -- Commercial Off the Shelf (COTS) -- Communication Testing -- Comparison Testing -- Compatibility -- Compatibility Testing -- Compile -- Compiler -- Complexity -- Compliance Testing -- Component Integration Testing -- Component Specification -- Component Testing -- Compound Condition Testing -- Computational Fluid Dynamics (CFD) -- Computer-Aided Software Testing -- Computer Simulation -- Concurrency Testing -- Condition -- Condition Coverage -- Condition Determination Testing -- Condition Testing -- Conditioning -- Confidence Interval -- Configuration Accounting -- Configuration Audit -- Configuration Control -- Configuration Identification -- Configuration Item -- Configuration Management -- Configuration Management Plan -- Confirmation Bias -- Confirmation Testing -- Conformance Testing -- Confounding -- Confusion Matrix -- Conjunctive Fallacy -- Context-Driven Testing -- Continuing Conformance Testing -- Contractual Testing -- Contradiction Testing -- Control Flow Testing -- Control Plan -- Corner Cases -- Corrective Actions -- Corrosion Testing -- Co-Simulation -- Cost-Benefit Analysis -- Cost of Quality -- Costs of Detection -- Costs of External Failure -- Costs of Internal Failure -- Costs of Prevention -- Courtesy Bias -- Coverage Tool -- Cross-Continuity Test -- Curse of Knowledge -- Customer Evaluation -- Cyclomatic Complexity -- D -- Daily Build -- Data-Driven Testing -- Data Flow -- Data Flow Testing -- Debugger -- Debugging Tools -- Decision Condition Testing -- Decision Coverage -- Decision Table -- Decision Testing -- Deembrittlement Verification Test. Defect -- Defect Arrival Rate -- Defect Closing Rate -- Defect Containment -- Defect Density -- Defect Detection Percentage -- Defect Management -- Defect Masking -- Defect Taxonomy -- Dependency Testing -- Dependent Failures -- Design-Based Testing -- Design of Experiments (DoE) -- Destructive Testing -- Development Models -- Deviations -- Device under Test -- DFMEA -- Digital Model -- Digital Twin -- Documentation Testing -- Domain Testing -- Driver-in-Loop Simulator -- Drop Test -- Dunning-Kruger Effect -- DVP& -- R (Design Verification Plan and Report) -- Dynamic Analysis Tool -- Dynamic Testing -- Dynamometer Testing -- E -- Edges -- Efficiency Testing -- Electromagnetic Compatibility (EMC) -- Electromagnetic Immunity -- Electrostatic Discharge (ESD) -- Elementary Comparison Testing (ECT) -- Elephant Foot Testing -- Embedded Software -- Embedded Systems -- Emulation -- Emulator -- End-of-Line Test -- End-to-End Testing -- Endurance Testing -- Environmental Simulation Tools -- Environmental Testing -- Equivalence Partition Coverage -- Equivalence Partitioning -- Error Guessing -- Error Seeding -- Executable Statement -- Exercised -- Exhaustive Testing -- Exit Criteria -- Expectation Bias -- Expected Result -- Experienced-Based Testing -- Exploratory Testing -- Extensibility -- F -- F-Number -- Facilitator -- Failure -- Failure Mechanism -- Failure Mode -- Failure Mode Effects Analysis -- Fatigue Failure -- Fault Injection Testing -- Fault Insertion -- Fault Report -- Fault Seeding -- Fault Severity -- Feature-Driven Development -- Feature Interaction Testing -- Feature Tuning/Calibration -- Fiberboard Testing -- Fleet Testing -- Focusing Effect -- Framing Effect -- Frozen Test Basis -- Function Coverage -- Function Generator -- Function Point -- Functional Decomposition -- Functional Fixedness -- Functional Requirement -- Functional Safety. Functional Specification -- Functional Testing -- Fungus -- Fuzzing Inputs -- G -- Gauge Repeatability and Reproducibility -- Gaussian Distribution -- Genetic Algorithm -- Golden Unit -- Gorilla Testing -- Gray-Box Testing -- Ground Truth Data -- GUI -- H -- Hacker -- Hacking -- Halo Effect -- Halstead Number -- HALT -- Hardness Testing O-Rings -- Hardware-Based Fault Injection Testing -- Hardware Platform -- Hardware-Software Integration Testing -- HASS -- High-Order Tests -- Hijacking -- HIL Testing -- Hindsight Bias -- Histogram -- Homologation Testing -- Horns Effect -- Horsepower Testing -- Hostile Attribution Bias -- Hot Hand Fallacy -- Humidity -- Hybrid Fault Injection Testing -- Hyper D -- I -- ICE -- Illusion of Control -- Illusion of Validity -- Illusory Correlation -- Impact Analysis -- Impact Bias -- Incident Logging -- Incident Management Life Cycle -- Incident Report -- In-Circuit Emulator -- Incremental Integration Testing -- Incremental Testing -- Independent Test and Verification -- Independent Test Group (ITG) -- Infant Mortality -- Information Bias -- Infrared Testing -- Ingroup Bias -- Insensitivity to Sample Size -- Inspection -- Installation Testing -- Instrumentation -- Integration Coverage -- Integration Testing -- Intermittent -- Invalid Partitions -- IRR -- Irrelevant Failures -- Iterative Development -- K -- Key Control Characteristics -- Key Product Characteristics -- KLOC -- L -- Labcar -- Law of the Instrument -- Level of Effort -- Life Cycle Model (Product) -- Load Dump -- Load Testing -- Localization Testing -- Loop Testing -- M -- Machine Learning -- Maintainability -- Mean -- Mean Time between Failure -- Mean Time to Failure -- Measurement -- Measurement System Analysis (MSA) -- Mechanical Shock -- Mechanical Vibration -- Median -- Microcontroller -- Mileage Accumulation -- Milestone -- Mode. Model-Based Development -- Model-Based Testing -- Modeling Tool -- Moderator -- Module Testing -- Monkey Testing -- Monte Carlo Simulation -- Mutation Testing -- N -- Negative Testing -- Negativity Bias -- Neglect of Probability -- Network Testing -- Neural Networks -- Nonfunctional Testing -- Normal Distribution -- Normalcy Bias -- O -- OBD Testing -- Object-Oriented Applications -- Ontology-Based Simulation -- Open-Loop Testing -- Operating System -- Operational Acceptance Testing -- Operational Environment -- Optimism Bias -- Oracles -- Oscilloscope -- Ostrich Effect -- Outcome Bias -- Outgassing -- Overconfidence Effect -- Overstress -- P -- Pairwise Testing -- Parameter -- Pareidolia -- Pareto Chart -- Parkinson's Law of Triviality -- Pass/Fail Criteria -- Path Coverage -- Path Testing -- P-Diagram -- Pen Tester -- Penetration Testing -- Perception Testing -- Performance Testing -- Pessimism Bias -- PFMEA -- Planning Fallacy -- Planning Poker -- Population -- Portability Testing -- Positive Testing -- Postcondition -- Pragmatic Testing -- Precondition -- Probability -- Probe Effect -- Process Metric -- Processor Load Testing -- Product Metric -- Product Quality Predictions -- Product Requirements Analysis -- Project Deafness -- Project Management -- Prototype -- PUGH Matrix -- Q -- Quality Assurance -- Quality Assurance Plan -- Quality Audit -- Quality Circle -- Quality Control -- Quality Management -- R -- Ramp Testing -- Range -- Range Testing (Vehicle) -- Range Testing (Wireless) -- Rayleigh Distribution -- Reactance -- Reactive Devaluation -- Real-Time Simulation -- Recovery Testing -- Regression -- Regression Testing -- Regressive Bias -- Release Candidate -- Release Notes -- Reliability -- Reliability and Confidence -- Reliability Growth Model -- Repeatable/Repeatability -- Reproducibility -- Requirements -- Requirements-Based Testing. Re-Simulation Testing. |
| Record Nr. | UNINA-9911007158903321 |
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Quigley Jon M.
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| Warrendale, Pennsylvania : , : SAE International, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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