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2008 IEEE International Workshop on Microprocessor Test and Verification
| 2008 IEEE International Workshop on Microprocessor Test and Verification |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
| Descrizione fisica | 1 online resource (110 pages) |
| Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing Integrated circuits - Verification |
| ISBN | 1-5090-7784-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996213969703316 |
| [Place of publication not identified], : IEEE, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2008 IEEE International Workshop on Microprocessor Test and Verification
| 2008 IEEE International Workshop on Microprocessor Test and Verification |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
| Descrizione fisica | 1 online resource (110 pages) |
| Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing Integrated circuits - Verification |
| ISBN | 1-5090-7784-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145431403321 |
| [Place of publication not identified], : IEEE, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2018 19th International Workshop on Microprocessor and SOC Test and Verification : 9-10 December 2018, Austin, Texas, USA / / IEEE Computer Society
| 2018 19th International Workshop on Microprocessor and SOC Test and Verification : 9-10 December 2018, Austin, Texas, USA / / IEEE Computer Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (87 pages) |
| Disciplina | 004 |
| Soggetto topico |
Microprocessors - Testing
Microprocessors - Security measures Systems on a chip - Testing |
| ISBN | 1-5386-9250-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910330360303321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2018 19th International Workshop on Microprocessor and SOC Test and Verification : 9-10 December 2018, Austin, Texas, USA / / IEEE Computer Society
| 2018 19th International Workshop on Microprocessor and SOC Test and Verification : 9-10 December 2018, Austin, Texas, USA / / IEEE Computer Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (87 pages) |
| Disciplina | 004 |
| Soggetto topico |
Microprocessors - Testing
Microprocessors - Security measures Systems on a chip - Testing |
| ISBN | 1-5386-9250-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575464303316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers
| 2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (11 pages) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Random access memory Systems on a chip - Testing |
| ISBN | 1-5386-6400-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280697003316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers
| 2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (11 pages) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Random access memory Systems on a chip - Testing |
| ISBN | 1-5386-6400-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280921803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004
| 5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 004.16 |
| Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202252903316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910450916503321 |
Kelly Joe, Ph. D.
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| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910777033903321 |
|
Kelly Joe, Ph. D.
|
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| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910807375803321 |
|
Kelly Joe, Ph. D.
|
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| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
