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Biblioteca

MARC Lista (tabellare)
Advanced techniques for assessment surface topography [e-book] : development of a basis for 3D surface texture standards "surfstand" / edited by Liam Blunt and Xiangqian Jiang
Advanced techniques for assessment surface topography [e-book] : development of a basis for 3D surface texture standards "surfstand" / edited by Liam Blunt and Xiangqian Jiang
Pubbl/distr/stampa London ; Sterling, VA : Kogan Page Science, 2003
Descrizione fisica vi, 355 p. : ill. ; 30 cm
Disciplina 620.44
Altri autori (Persone) Blunt, Liam
Jiang, Xiangqian
Soggetto topico Surfaces (Technology) - Measurement
Three-dimensional display systems
Soggetto genere / forma Electronic books.
ISBN 9781903996119
1903996112
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Characterisation 1. The surface: its measurement and standardisation; 2. Numerical parameters for characterisation of topography; 3. Development of feature extraction for surface texture; 4. Advanced Gaussian filters; 5. Multi scalar filtration methodologies -- Instrumentation 6. Methods for calibaration of 3D surface metrology instruments; 7. Calibration of atomic force microscopes -- Case studies 8. A comparison of 2D roughness parameters with 3D roughness parameters; 9. Applications of the numerical parameters and filtration; 10. Functionality and characterisation of textured sheet steel products; 11. Characterisation of automotive engine bore performance; 12. Expert systems for hosting surface data; 13. Future developments in surface metrology
Record Nr. UNISALENTO-991003242919707536
London ; Sterling, VA : Kogan Page Science, 2003
Risorse elettroniche
Lo trovi qui: Univ. del Salento
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Characterisation of areal surface texture / / Richard Leach, editor
Characterisation of areal surface texture / / Richard Leach, editor
Edizione [1st ed. 2013.]
Pubbl/distr/stampa Berlin ; ; New York, : Springer, c2013
Descrizione fisica 1 online resource (353 p.)
Disciplina 620.44
620/.44
Altri autori (Persone) LeachRichard K
Soggetto topico Surfaces (Technology) - Measurement
Surface roughness - Measurement
ISBN 3-642-36458-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction to surface topography -- The areal field parameters -- The areal feature parameters -- Areal filtering methods -- Areal form removal -- Areal fractal methods -- Choosing the appropriate parameter -- Characterization of individual areal features -- Multi-scale signature of surface topography -- Correlation of areal surface texture parameters to solar cell efficiency -- Characterisation of cylinder liner honing textures for production control -- Characterization of the mechanical bond strength for copper on glass plating applications -- Inspection of laser structured cams and conrods -- Road surfaces.
Record Nr. UNINA-9910739466203321
Berlin ; ; New York, : Springer, c2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Handbook of surface and nanometrology / / David J. Whitehouse
Handbook of surface and nanometrology / / David J. Whitehouse
Autore Whitehouse D. J (David J.)
Edizione [2nd ed.]
Pubbl/distr/stampa Boca Raton : , : CRC Press, , 2011
Descrizione fisica 1 online resource (982 p.)
Disciplina 620/.440287
Altri autori (Persone) WhitehouseD. J (David J.).
Soggetto topico Surfaces (Technology) - Measurement
Nanostructured materials
Metrology
Soggetto genere / forma Electronic books.
ISBN 0-429-14069-X
1-4200-8202-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover
Record Nr. UNINA-9910464434903321
Whitehouse D. J (David J.)  
Boca Raton : , : CRC Press, , 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Handbook of surface and nanometrology / / David J. Whitehouse
Handbook of surface and nanometrology / / David J. Whitehouse
Autore Whitehouse D. J (David J.)
Edizione [2nd ed.]
Pubbl/distr/stampa Boca Raton : , : CRC Press, , 2011
Descrizione fisica 1 online resource (982 p.)
Disciplina 620/.440287
Altri autori (Persone) WhitehouseD. J (David J.).
Soggetto topico Surfaces (Technology) - Measurement
Nanostructured materials
Metrology
ISBN 0-429-14069-X
1-4200-8202-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover
Record Nr. UNINA-9910788729203321
Whitehouse D. J (David J.)  
Boca Raton : , : CRC Press, , 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Manufacturing surface technology : surface integrity & functional performance / / Brian Griffiths
Manufacturing surface technology : surface integrity & functional performance / / Brian Griffiths
Autore Griffiths Brian <1945->
Pubbl/distr/stampa New York, NY, : Taylor & Francis, 2001
Descrizione fisica 1 online resource (253 p.)
Disciplina 620.110287
620.44
Collana Manufacturing engineering modular series
Soggetto topico Surfaces (Technology)
Surfaces (Technology) - Measurement
ISBN 1-281-03551-3
9786611035518
0-08-051101-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Manufacturing Surface Technology: Surface Integrity & Functional Performance; Copyright Page; Contents; Introduction to Surface Integrity; List of Symbols; Chapter 1. Setting the Scene; 1.1 The surface as a system; 1.2 Motivating forces; 1.3 The manufactured surface; 1.4 Surface aspects in context; 1.5 Problems of scale; 1.6 Surface integrity; 1.7 Machining conditions; 1.8 Further information; 1.9 Details of further publications; Chapter 2. The Manufacturing Process Unit Event; 2.1 Introduction; 2.2 The unit event and typical manufacturing processes
2.3 Unit events and surface topography2.4 Unit events and the sub-surface; 2.5 The unit event classification of manufacturing processes; Chapter 3. Surface Finish Measuring Methods; 3.1 Introduction; 3.2 Typical profilometer instruments; 3.3 The skid; 3.4 The stylus; 3.5 The traverse unit; 3.6 Filters; 3.7 3D profilometry; 3.8 Microscopy techniques; 3.9 A comparison of the techniques; Chapter 4. Surface Finish Characterization; 4.1 Introduction; 4.2 2D roughness parameters; 4.3 3D parameters; 4.4 Variability of roughness parameters; 4.5 Manufacturing processes and surface parameters
4.6 Parameters and functional performanceChapter 5. Sub-surface Altered Material Layers; 5.1 Introduction; 5.2 The sub-surface features; 5.3 Altered material zones and the unit event; 5.4 AMZs and processes; 5.5 The influence of AMZs on functional performance; Chapter 6. Standards and Codes of Practice; 6.1 Introduction; 6.2 Standards defining 2D and 3D surface parameters; 6.3 Standards related to 2D parameter evaluation; 6.4 Standards related to unit events, imperfections and defects; 6.5 Surface integrity technical publications
6.6 A comparison of the various standards and codes of practiceAppendix: Typical Surface Integrity Questions; Background and Rationale of the Series; Index
Record Nr. UNINA-9911006612303321
Griffiths Brian <1945->  
New York, NY, : Taylor & Francis, 2001
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Manufacturing surface technology [e-book] : surface integrity & functional performance / Brian Griffiths
Manufacturing surface technology [e-book] : surface integrity & functional performance / Brian Griffiths
Autore Griffiths, Brian
Pubbl/distr/stampa London : Penton, 2001
Descrizione fisica 120 p. : ill. ; 24 cm
Disciplina 620.110287
Soggetto topico Surfaces (Technology)
Surfaces (Technology) - Measurement
Soggetto genere / forma Electronic books.
ISBN 9781857180299
1857180291
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Setting the scene; The manufacturing process unit event; Surface finish measuring methods; Surface finish characterization; Sub-surface altered material layers; Standards and codes of practice; Appendix: Typical surface integrity questions
Record Nr. UNISALENTO-991003242639707536
Griffiths, Brian  
London : Penton, 2001
Risorse elettroniche
Lo trovi qui: Univ. del Salento
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Surface engineering measurement standards for inorganic materials [[electronic resource] /] / Stanley J. Dapkunas
Surface engineering measurement standards for inorganic materials [[electronic resource] /] / Stanley J. Dapkunas
Autore Dapkunas Stanley J
Pubbl/distr/stampa [Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2005]
Descrizione fisica 1 online resource (viii, 252 pages) : illustrations
Collana NIST recommended practice guide
NIST special publication
Soggetto topico Surfaces (Technology) - Measurement
Coating processes
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910699291903321
Dapkunas Stanley J  
[Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2005]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Surfaces and their measurement [[electronic resource] /] / David Whitehouse
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
Autore Whitehouse D. J (David J.)
Pubbl/distr/stampa London, : HPS, 2002
Descrizione fisica 1 online resource (425 p.)
Disciplina 620.110287
620.44
Soggetto topico Surfaces (Technology) - Measurement
Civil engineering
Soggetto genere / forma Electronic books.
ISBN 1-281-07307-5
9786611073077
0-08-051823-0
1-4175-2668-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum
4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration
8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation)
10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions
Chapter 12. Cylindricity, sphericity
Record Nr. UNINA-9910458247303321
Whitehouse D. J (David J.)  
London, : HPS, 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
Autore Whitehouse D. J (David J.)
Pubbl/distr/stampa London, : HPS, 2002
Descrizione fisica 1 online resource (425 p.)
Disciplina 620.110287
620.44
Soggetto topico Surfaces (Technology) - Measurement
Civil engineering
ISBN 1-281-07307-5
9786611073077
0-08-051823-0
1-4175-2668-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum
4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration
8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation)
10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions
Chapter 12. Cylindricity, sphericity
Record Nr. UNINA-9910784635403321
Whitehouse D. J (David J.)  
London, : HPS, 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Surfaces and their measurement [e-book] / David Whitehouse
Surfaces and their measurement [e-book] / David Whitehouse
Autore Whitehouse, David J.
Pubbl/distr/stampa London : HPS, 2002
Descrizione fisica xi, 395 p. : ill. ; 25 cm
Disciplina 620.44
Soggetto topico Surfaces (Technology) - Measurement
Soggetto genere / forma Electronic books.
ISBN 9781903996010
1903996015
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. What is surface metrology? 2. Measurement of surfaces. 3. Profile parameter characterisation. 4. Surfaces in manufacture. 5. Function and surface texture. 6. Surface finish instrumentation. 7. Stylus instruments. 8. Optical methods. 9. Scanning microscopes. 10. Errors of form. 11. Roundness and related subjects. 12. Cylindricity, sphericity etc. 13. Instrument design for minimum error. 14. Calibration of instruments. 15. Sampling, numerical analysis, display. Glossary.
Record Nr. UNISALENTO-991003242779707536
Whitehouse, David J.  
London : HPS, 2002
Risorse elettroniche
Lo trovi qui: Univ. del Salento
Opac: Controlla la disponibilità qui